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  • BS EN 61747-1:2000

    Current The latest, up-to-date edition.

    Liquid crystal and solid-state display devices Generic specification

    Available format(s):  Hardcopy, PDF

    Language(s):  English

    Published date:  31-10-2003

    Publisher:  British Standards Institution

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    Table of Contents - (Show below) - (Hide below)

    1 Scope
    2 Normative references
    3 Terminology
      3.1 Physical concepts
      3.2 General terms
      3.3 Terms related to ratings and characteristics
    4 Technical aspects
      4.1 Order of precedence
      4.2 Terminology, units and symbols
      4.3 Preferred values of temperature, humidity and
           pressure
      4.4 Marking
           4.4.1 Device identification
           4.4.2 Device traceability
           4.4.3 Packing
      4.5 Categories of assessed quality
      4.6 Screening
      4.7 Handling
    5 Quality assessment procedures
      5.1 Eligibility for qualification approval
           5.1.1 Primary stage of manufacture
      5.2 Commercially confidential information
      5.3 Formation of inspection lots
      5.4 Structurally similar devices
      5.5 Granting of qualification approval
      5.6 Quality conformance inspection
           5.6.1 Division into groups and subgroups
           5.6.2 Inspection requirements
           5.6.3 Supplementary procedure for reduced
                 inspection
           5.6.4 Sampling requirements for small lots
           5.6.5 Certified records of released lots
                 (CRRL)
           5.6.6 Delivery of devices subjected to
                 destructive or non-destructive tests
           5.6.7 Delayed deliveries
           5.6.8 Supplementary procedure for deliveries
      5.7 Statistical sampling procedures
           5.7.1 AQL sampling plans
           5.7.2 LTPD sampling plans
      5.8 Endurance tests
      5.9 Endurance tests where the failure rate is
           specified
           5.9.1 General
           5.9.2 Selection of samples
           5.9.3 Failure
           5.9.4 Endurance test time and sample size
           5.9.5 Procedure to be used if the number of
                 observed failures exceeds the
                 acceptance number
      5.10 Accelerated test procedures
      5.11 Capability approval
    6 Test and measurement procedures
      6.1 Standard atmospheric conditions for electrical
           and optical measurements
      6.2 Physical examination
           6.2.1 Visual examination
           6.2.2 Dimensions
           6.2.3 Permanence of marking
      6.3 Electrical and optical measurements
           6.3.1 General conditions and precautions
      6.4 Environmental tests
    Annex A (informative) Cross references index
    Annex B (informative) Example of outline drawings of liquid
                          crystal display cells
    Annex C (normative) Orientation of LCD modules
    Annex D (normative) Lot tolerance percentage defective
                        (LTPD) sampling plans
    Tables

    Abstract - (Show below) - (Hide below)

    Generic specification defining general procedures for quality assessment for IECQ use and general rules for measuring methods of electrical and optical characteristics, climatic and mechanical tests and endurance tests.

    General Product Information - (Show below) - (Hide below)

    Committee EPL/100
    Development Note Renumbers and supersedes BS IEC 61747-1. 2000 version incorporates amendment 10788 to BS IEC 61747-1. Also numbered as IEC 61747-1. Supersedes 01/201646 DC & 93/203880 DC. (01/2006)
    Document Type Standard
    Publisher British Standards Institution
    Status Current
    Supersedes

    Standards Referencing This Book - (Show below) - (Hide below)

    IEC 61747-3-1:2015 Liquid crystal display devices - Part 3-1: Liquid crystal display (LCD) cells - Blank detail specification
    IEC 60068-1:2013 Environmental testing - Part 1: General and guidance
    IEC 60191-1:2007 Mechanical standardization of semiconductor devices - Part 1: General rules for the preparation of outline drawings of discrete devices
    EN 61747-3-1 : 2006 LIQUID CRYSTAL DISPLAY DEVICES - PART 3-1: LIQUID CRYSTAL DISPLAY (LCD) CELLS - BLANK DETAIL SPECIFICATION
    EN 60068-2-1:2007 Environmental testing - Part 2-1: Tests - Test A: Cold
    ISO 2859:1974 Sampling procedures and tables for inspection by attributes
    ISO 1101:2017 Geometrical product specifications (GPS) — Geometrical tolerancing — Tolerances of form, orientation, location and run-out
    EN 60068-1:2014 Environmental testing - Part 1: General and guidance
    IEC 61747-2-1:2013 Liquid crystal display devices - Part 2-1: Passive matrix monochrome LCD modules - Blank detail specification
    EN 60749-1:2003 Semiconductor devices - Mechanical and climatic test methods - Part 1: General
    EN 61747-4:2012 Liquid crystal display devices - Part 4: Liquid crystal display modules and cells - Essential ratings and characteristics
    IEC 60747-10:1991 Semiconductor devices - Part 10: Generic specification for discrete devices and integrated circuits
    EN 61747-2-1:2013 Liquid crystal display devices - Part 2-1: Passive matrix monochrome LCD modules - Blank detail specification
    IEC 60747-5:1992 Semiconductor devices - Discrete devices and integrated circuits -Part 5: Optoelectronic devices
    IEC 60027-1:1992 Letters symbols to be used in electrical technology - Part 1: General
    IEC 60191-2:2012 DB Mechanical standardization of semiconductor devices - Part 2: Dimensions
    IEC 61747-5:1998 Liquid crystal and solid-state display devices - Part 5: Environmental, endurance and mechanical test methods
    IEC 60410:1973 Sampling plans and procedures for inspection by attributes
    HD 323.1 : 200S2 BASIC ENVIRONMENTAL TESTING PROCEDURES - GENERAL AND GUIDANCE
    ISO 8601:2004 Data elements and interchange formats Information interchange Representation of dates and times
    IEC 60617-1:1985 Graphical symbols for diagrams. Part 1: General information, general index. Cross-reference tables
    IEC 60747-1:2006+AMD1:2010 CSV Semiconductor devices - Part 1: General
    IEC 60749:1996+AMD1:2000+AMD2:2001 CSV Semiconductor devices - Mechanical and climatic test methods
    IEC 60748-1:2002 Semiconductor devices - Integrated circuits - Part 1: General
    IEC 60068-2-1:2007 Environmental testing - Part 2-1: Tests - Test A: Cold
    IEC 61747-4:2012 Liquid crystal display devices - Part 4: Liquid crystal display modules and cells - Essential ratings and characteristics
    HD 245.1 : 200S3 LETTER SYMBOLS TO BE USED IN ELECTRICAL TECHNOLOGY - GENERAL
    EN 28601 : 1992 DATA ELEMENTS AND INTERCHANGE FORMATS - INFORMATION INTERCHANGE - REPRESENTATION OF DATES AND TIMES
    EN 61747-5:1998 Liquid crystal and solid-state display devices - Part 5: Environmental, endurance and mechanical test methods
    IEC 60191-3:1999 Mechanical standardization of semiconductor devices - Part 3: General rules for the preparation of outline drawings of integrated circuits
    HD 323.2.1 : 200S2 BASIC ENVIRONMENTAL TESTING PROCEDURES - TESTS - TEST A: COLD
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