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  • EN 61837-2:2011/A1:2014

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    Superseded A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
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    SURFACE MOUNTED PIEZOELECTRIC DEVICES FOR FREQUENCY CONTROL AND SELECTION - STANDARD OUTLINES AND TERMINAL LEAD CONNECTIONS - PART 2: CERAMIC ENCLOSURES (IEC 61837-2:2011/A1:2014)

    Available format(s): 

    Superseded date:  12-02-2022

    Language(s): 

    Published date:  30-05-2014

    Publisher:  European Committee for Standards - Electrical

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    Table of Contents - (Show below) - (Hide below)

    FOREWORD
    1 Scope
    2 Normative references
    3 Configuration of enclosures
    4 Designation of types
    5 Ceramic enclosure dimensions
    6 Lead connections
    7 Designation of ceramic enclosures
    Bibliography
    Annex ZA (normative) - Normative references to
             international publications with their
             corresponding European publications

    Abstract - (Show below) - (Hide below)

    Specifies the outlines and terminal lead connections as they apply to surface-mounted devices (SMD) for frequency control and selection in ceramic enclosures, and is based on IEC 61240.

    General Product Information - (Show below) - (Hide below)

    Committee SR 49
    Development Note To be read in conjunction with EN 61240. (07/2011)
    Document Type Standard
    Publisher European Committee for Standards - Electrical
    Status Superseded
    Superseded By
    Supersedes

    Standards Referenced By This Book - (Show below) - (Hide below)

    EN 60444-8:2017 Measurement of quartz crystal unit parameters - Part 8 : Test fixture for surface mounted quartz crystal units
    BS EN 60444-8:2017 Measurement of quartz crystal unit parameters Test fixture for surface mounted quartz crystal units

    Standards Referencing This Book - (Show below) - (Hide below)

    EN 60862-1:2015 Surface acoustic wave (SAW) filters of assessed quality - Part 1: Generic specification
    IEC 60191-6:2009 Mechanical standardization of semiconductor devices - Part 6: General rules for the preparation of outline drawings of surface mounted semiconductor device packages
    EN 61019-1 : 2005 Surface acoustic wave (SAW) resonators - Part 1: Generic specification
    EN 60368-2-2:1999 Piezoelectric filters - Part 2: Guide to the use of piezoelectric filters - Section 2: Piezoelectric ceramic filters
    EN ISO 1101:2017 Geometrical product specifications (GPS) - Geometrical tolerancing - Tolerances of form, orientation, location and run-out (ISO 1101:2017)
    IEC 60122-3:2010 Quartz crystal units of assessed quality - Part 3: Standard outlines and lead connections
    EN 61240:2017 Piezoelectric devices - Preparation of outline drawings of surface-mounted devices (SMD) for frequency control and selection - General rules
    ISO 1101:2017 Geometrical product specifications (GPS) — Geometrical tolerancing — Tolerances of form, orientation, location and run-out
    IEC 61019-1:2004 Surface acoustic wave (SAW) resonators - Part 1: Generic specification
    IEC 60368-1:2000+AMD1:2004 CSV Piezoelectric filters of assessed quality - Part 1: Genericspecification
    EN 60368-3:2010 Piezoelectric filters of assessed quality - Part 3: Standard outlines and lead connections
    IEC 60862-1:2015 Surface acoustic wave (SAW) filters of assessed quality - Part 1: Generic specification
    IEC 60368-3:2010 Piezoelectric filters of assessed quality - Part 3: Standard outlines and lead connections
    IEC 61240:2016 Piezoelectric devices - Preparation of outline drawings of surface-mounted devices (SMD) for frequency control and selection - General rules
    IEC 61019-2:2005 Surface acoustic wave (SAW) resonators - Part 2: Guide to the use
    IEC 60122-2:1983 Quartz crystal units for frequency control and selection - Part 2: Guide to the use of quartz crystal units for frequency control and selection
    IEC 60862-2:2012 Surface acoustic wave (SAW) filters of assessed quality - Part 2: Guidelines for the use
    IEC 60862-3:2003 Surface acoustic wave (SAW) filters of assessed quality - Part 3: Standard outlines
    EN 60679-3:2013 Quartz crystal controlled oscillators of assessed quality - Part 3: Standard outlines and lead connections
    IEC 60368-2-2:1996 Piezoelectric filters - Part 2: Guide to the use of piezoelectricfilters - Section 2: Piezoelectric ceramic filters
    EN 60862-3:2003 Surface acoustic wave (SAW) filters of assessed quality - Part 3: Standard outlines
    EN 60862-2:2012 Surface acoustic wave (SAW) filters of assessed quality - Part 2: Guidelines for the use
    IEC 60679-3:2012 Quartz crystal controlled oscillators of assessed quality - Part 3: Standard outlines and lead connections
    IEC 60679-2:1981 Quartz crystal controlled oscillators - Part 2: Guide to the use of quartz crystal controlled oscillators
    EN 60191-6:2009 Mechanical standardization of semiconductor devices - Part 6: General rules for the preparation of outline drawings of surface mounted semiconductor device packages
    IEC 60368-2-1:1988 Piezoelectric filters - Part 2-1: Guide to the use of piezoelectric filters - Quartz crystal filters
    EN 60368-1:2000/A1:2004 PIEZOELECTRIC FILTERS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION
    IEC 60679-1:2017 Piezoelectric, dielectric and electrostatic oscillators of assessed quality - Part 1: Generic specification
    EN 60122-3:2010 Quartz crystal units of assessed quality - Part 3: Standard outlines and lead connections
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