BS CECC68000(1990) : AMD 9184
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
View Superseded by
HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS: GENERIC SPECIFICATION: QUARTZ CRYSTAL UNITS
15-12-1996
23-11-2012
Foreword
Preface
Section 1 - Scope
Section 2 - General
2.1 Order of precedence
2.2 Related documents
2.3 Units, symbols and terminology
2.4 Preferred ratings and characteristics
2.5 Marking
Section 3 - Quality assessment procedures
3.1 Primary stage of manufacture
3.2 Structurally similar components
3.3 Subcontracting
3.4 Manufacturer's approval
3.5 Approval procedures
3.6 Procedures for capability approval
3.7 Procedures for qualification approval
3.8 Test procedures
3.9 Screeing requirements
3.10 Rework and repair work
3.11 Certified test records
3.12 Delayed delivery
3.13 Release for delivery
3.14 Unchecked parameters
Section 4 - Test and measurement procedures
4.1 General
4.2 Alternative methods
4.3 Precision of measurement
4.4 Standard conditions for testing
4.5 Visual inspection
4.6 Dimensioning and gauging procedures
4.7 Electrical test procedures
4.7.1 Frequency and resonance resistance
4.7.2 Drive level dependency
4.7.3 Frequency and resonance resistance as a function
of temperature
4.7.4 Unwanted responses
4.7.5 Shunt capacitance
4.7.6 Load resonance frequency and resistance
4.7.7 Frequency pulling range
4.7.8 Motional parameters
4.7.9 Insulation resistance
4.8 Mechanical and environmental test procedures
4.8.1 Robustness of terminations
4.8.2 Sealing tests
4.8.3 Soldering (Solderability and resistance to solder
heat)
4.8.4 Rapid change of temperature, two-fluid-bath method
4.8.5 Rapid change of temperature with prescribed time
of transition
4.8.6 Bump
4.8.7 Vibration
4.8.8 Shock
4.8.9 Free fall
4.8.10 Acceleration, steady state
4.8.11 Dry heat
4.8.12 Damp heat, cyclic
4.8.13 Cold
4.8.14 Climatic sequence
4.8.15 Damp heat steady state
4.8.16 Immersion in cleaning solvents
4.9 Endurance test procedure
4.9.1 Ageing
4.9.2 Extended ageing
4.9.3 Shelf life
Annex A. Drive level dependency
Describes methods of test and general requirements for quartz crystal units of assessed quality using either capability approval or qualification approval procedures.AMD 9184 RENUMBERS THIS STANDARD
| Committee |
ECL/11
|
| DevelopmentNote |
Superseded and renumbered by BS EN 168000 (07/2004)
|
| DocumentType |
Standard
|
| PublisherName |
British Standards Institution
|
| Status |
Superseded
|
| SupersededBy | |
| Supersedes |
| Standards | Relationship |
| CECC 68000 : 1989 AMD 2 1993 | Identical |
| BS EN 168100:1995 | Harmonized system of quality assessment for electronic components. Sectional specification: quartz crystal units (capability approval) |
| BS EN 168101:1997 | Harmonized system of quality assessment for electronic components. Blank detail specification: quartz crystal units (capability approval) |
| IEC 60068-1:2013 | Environmental testing - Part 1: General and guidance |
| IEC 60068-2-27:2008 | Environmental testing - Part 2-27: Tests - Test Ea and guidance: Shock |
| IEC 60068-2-20:2008 | Environmental testing - Part 2-20: Tests - Test T: Test methods for solderability and resistance to soldering heat of devices with leads |
| IEC 60122-3:2010 | Quartz crystal units of assessed quality - Part 3: Standard outlines and lead connections |
| IEC 60068-2-21:2006 | Environmental testing - Part 2-21: Tests - Test U: Robustness of terminations and integral mounting devices |
| IEC 60444-2:1980 | Measurement of quartz crystal unit parameters by zero phase technique in a pi-network. Part 2: Phase offset method for measurement of motional capacitance of quartz crystal units |
| IEC 60068-2-11:1981 | Basic environmental testing procedures - Part 2-11: Tests - Test Ka: Salt mist |
| IEC 60027-1:1992 | Letters symbols to be used in electrical technology - Part 1: General |
| IEC 60410:1973 | Sampling plans and procedures for inspection by attributes |
| IEC 60068-2-3:1969 | Basic environmental testing procedures - Part 2-3: Tests - Test Ca: Damp heat, steady state |
| IEC 60068-2-17:1994 | Basic environmental testing procedures - Part 2-17: Tests - Test Q: Sealing |
| IEC 60068-2-2:2007 | Environmental testing - Part 2-2: Tests - Test B: Dry heat |
| IEC 60027-2:2005 | Letter symbols to be used in electrical technology - Part 2: Telecommunications and electronics |
| IEC 60068-2-29:1987 | Environmental testing. Part 2: Tests. Test Eb and guidance: Bump |
| IEC 60302:1969 | Standard definitions and methods of measurement for piezoelectric vibrators operating over the frequency range up to 30 MHz |
| IEC 60068-2-1:2007 | Environmental testing - Part 2-1: Tests - Test A: Cold |
| IEC 60068-2-14:2009 | Environmental testing - Part 2-14: Tests - Test N: Change of temperature |
| IEC 60068-2-30:2005 | Environmental testing - Part 2-30: Tests - Test Db: Damp heat, cyclic (12 h + 12 h cycle) |
Access your standards online with a subscription
Features
-
Simple online access to standards, technical information and regulations.
-
Critical updates of standards and customisable alerts and notifications.
-
Multi-user online standards collection: secure, flexible and cost effective.