BS EN 60749-11:2002
Current
The latest, up-to-date edition.
Semiconductor devices. Mechanical and climatic test methods Rapid change of temperature. Two-fluid-bath method
Hardcopy , PDF
English
24-10-2003
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Foreword
INTRODUCTION
1 Scope
2 Normative references
3 Terms and definitions
4 Test apparatus
5 Procedure
6 Summary
Annex ZA (normative) Normative references to international
publications with their corresponding European
publications
Describes the rapid change of temperature test method and the two-fluid-bath method. It is applicable to all semiconductor devices.
| Committee |
EPL/47
|
| DevelopmentNote |
Supersedes 00/203570 DC (10/2002) Supersedes BS EN 60749. (09/2005)
|
| DocumentType |
Standard
|
| Pages |
12
|
| PublisherName |
British Standards Institution
|
| Status |
Current
|
| Supersedes |
Defines the rapid change of temperature test method and the two-fluid-bath method. This test method may also be used, employing fewer cycles, to test the effect of immersion in heated liquids that are used for the purpose of cleaning devices. This test is applicable to all semiconductor devices. It is considered destructive unless otherwise detailed in the relevant specification. The contents of the corrigenda of January 2003 and August 2003 have been included in this copy.
| Standards | Relationship |
| IEC 60749-11:2002 | Identical |
| UNE-EN 60749-11:2003 | Identical |
| DIN EN 60749-11:2003-04 | Identical |
| I.S. EN 60749-11:2002 | Identical |
| NF EN 60749-11 : 2002 | Identical |
| NBN EN 60749-11 : 2003 | Identical |
| EN 60749-11:2002 | Identical |
| IEC 60749-3:2017 | Semiconductor devices - Mechanical and climatic test methods - Part 3: External visual examination |
| EN 60749-3:2017 | Semiconductor devices - Mechanical and climatic test methods - Part 3: External visual examination |
| IEC 60068-2-14:2009 | Environmental testing - Part 2-14: Tests - Test N: Change of temperature |
| EN 60068-2-14:2009 | Environmental testing - Part 2-14: Tests - Test N: Change of temperature |
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