BS EN 62132-4:2006

1 Scope
2 Normative references
3 Terms and definitions
4 General
  4.1 Measurement basics
  4.2 Single pin direct power injection
  4.3 Multiple pin direct power injection into
      pins of differential mode systems
5 Test conditions
6 Test equipment
  6.1 General
  6.2 RF power source
  6.3 RF power meter and directional coupler
7 Test set-up
  7.1 General
  7.2 Power injection set-up
  7.3 Test circuit board
  7.4 Characteristics of the power injection set-up
  7.5 Decoupling networks
8 Test procedure
  8.1 General
  8.2 Specific test procedure
9 Test report
Annex A (informative) Example of a specification of
                       immunity levels e.g. for
                       automotive applications
Annex B (informative) Hints for the best installation
                       of a test set-up with respect
                       to RF
Annex C (informative) Constant peak test level explanation
Annex ZA (normative) Normative references to international
                       publications with their corresponding
                       European publications
Bibliography

Specifies a method to measure the immunity of integrated circuits (IC) in the presence of conducted RF disturbances, e.g. resulting from radiated RF disturbances.

Describes a method to measure the immunity of integrated circuits (IC) in the presence of conducted RF disturbances, e.g. resulting from radiated RF disturbances. This method guarantees a high degree of repeatability and correlation of immunity measurements. This standard establishes a common base for the evaluation of semiconductor devices used in equipment functioning in an environment subject to unwanted radio frequency electromagnetic waves.