BS EN 62215-3:2013
Current
The latest, up-to-date edition.
Integrated circuits. Measurement of impulse immunity Non-synchronous transient injection method
Hardcopy , PDF
English
31-10-2013
1 Scope
2 Normative references
3 Terms and definitions
4 General
5 Coupling networks
6 IC configuration and evaluation
7 Test conditions
8 Test equipment
9 Test set up
10 Test procedure
11 Test report
Annex A (informative) - Test board recommendations
Annex B (informative) - Selection hints for coupling
and decoupling network values
Annex C (informative) - Industrial and consumer
applications
Annex D (informative) - Vehicle applications
Annex ZA (normative) - Normative references to
international publications with their corresponding
European publications
Defines a method for measuring the immunity of an integrated circuit (IC) to standardized conducted electrical transient disturbances.
Committee |
EPL/47
|
DevelopmentNote |
Supersedes 10/30209944 DC. (10/2013)
|
DocumentType |
Standard
|
Pages |
36
|
PublisherName |
British Standards Institution
|
Status |
Current
|
Supersedes |
IEC 62215-3:2013 specifies a method for measuring the immunity of an integrated circuit (IC) to standardized conducted electrical transient disturbances. The disturbances, not necessarily synchronized to the operation of the device under test (DUT), are applied to the IC pins via coupling networks. This method enables understanding and classification of interaction between conducted transient disturbances and performance degradation induced in ICs regardless of transients within or beyond the specified operating voltage range.
Standards | Relationship |
EN 62215-3:2013 | Identical |
IEC 62215-3:2013 | Identical |
EN 62132-4:2006 | Integrated circuits - Measurement of electromagnetic immunity 150 kHz to 1 GHz - Part 4: Direct RF power injection method |
IEC 62132-4:2006 | Integrated circuits - Measurement of electromagnetic immunity 150 kHz to 1 GHz - Part 4: Direct RF power injection method |
ISO 7637-2:2011 | Road vehicles Electrical disturbances from conduction and coupling Part 2: Electrical transient conduction along supply lines only |
IEC 61000-4-4:2012 RLV | Electromagnetic compatibility (EMC) - Part 4-4: Testing and measurement techniques - Electrical fast transient/burst immunity test |
EN 61000-4-4:2012 | ELECTROMAGNETIC COMPATIBILITY (EMC) - PART 4-4: TESTING AND MEASUREMENT TECHNIQUES - ELECTRICAL FAST TRANSIENT/BURST IMMUNITY TEST (IEC 61000-4-4:2012) |
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