BS IEC 60747-8:2000
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
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Discrete semiconductor devices and integrated circuits Field-effect transistors - Additional ratings and characteristics and amds in the measuring methods for power switching field effect transistors.
Hardcopy , PDF
09-07-2021
English
15-06-2001
Important note : Users cannot be edited or removed once added to your Multi user PDF.| Committee |
EPL/47
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| DevelopmentNote |
Supersedes BS 6493-1.8(1985) (05/2001) Supersedes 92/34150 DC. (06/2005) Supersedes 07/30161967 DC. (06/2011)
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| DocumentType |
Standard
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| Pages |
72
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| PublisherName |
British Standards Institution
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| Status |
Superseded
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| SupersededBy | |
| Supersedes |
Gives standards for the following categories of field-effect transistors : -Type A: junction-gate type; -Type B: insulated-gate depletion type; -Type C: insulated-gate enhancement type.
| Standards | Relationship |
| IEC 60747-8:2000 | Identical |
| IEC 60747-8:2010 | Identical |
| IEC 60747-7:2010 | Semiconductor devices - Discrete devices - Part 7: Bipolar transistors |
| IEC 60747-1:2006+AMD1:2010 CSV | Semiconductor devices - Part 1: General |
| IEC 60749-34:2010 | Semiconductor devices - Mechanical and climatic test methods - Part 34: Power cycling |
| IEC 60747-2:2016 | Semiconductor devices - Part 2: Discrete devices - Rectifier diodes |
| IEC 60749-23:2004+AMD1:2011 CSV | Semiconductor devices - Mechanical and climatic test methods - Part 23: High temperature operating life |
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