BS IEC 60748-11:2000
Current
The latest, up-to-date edition.
Semiconductor devices. Integrated circuits Sectional specification for semiconductor integrated circuits excluding hybrid circuits
Hardcopy , PDF
English
31-07-2011
Committees responsible
National foreword
1 Scope
2 General
3 Subcontracting
4 Primary stage of manufacture
5 Quality assessment procedures
6 Structural similarity procedures
7 Groups and sub-groups
8 Screening
9 Sampling requirements
10 Terminal identification
11 Additional information
12 Test and measurement procedures
Appendix A - Guidance and format for drafting blank
detail specifications
Quality assessment procedures, inspection requirements, screening sequences, sampling requirements, test and measurement procedures for encapsulated, including multichip circuits.
Committee |
EPL/47
|
DevelopmentNote |
Renumbers and supersedes BS QC790100(1991). 2000 version incorporates amendment 10586 to BS QC790100(1991). (04/2000) Supersedes 97/230052 DC. (09/2007) Together with BS IEC 60747-10, it supersedes BS 9450(1998). (08/2011)
|
DocumentType |
Standard
|
Pages |
30
|
PublisherName |
British Standards Institution
|
Status |
Current
|
Supersedes |
This sectional specification applies to encapsulated semiconductor integrated circuits, including multi-chip integrated circuits, but excluding hybrid circuits.
Standards | Relationship |
IEC 60748-11:1990 | Identical |
IEC 60747-10:1991 | Semiconductor devices - Part 10: Generic specification for discrete devices and integrated circuits |
IEC 60191-2:2012 DB | Mechanical standardization of semiconductor devices - Part 2: Dimensions |
IEC 60068-2-17:1994 | Basic environmental testing procedures - Part 2-17: Tests - Test Q: Sealing |
IEC 60747-1:2006+AMD1:2010 CSV | Semiconductor devices - Part 1: General |
IEC 60617-13:1993 | Graphical symbols for diagrams - Part 13: Analogue elements |
IEC 60749:1996+AMD1:2000+AMD2:2001 CSV | Semiconductor devices - Mechanical and climatic test methods |
IEC 60748-1:2002 | Semiconductor devices - Integrated circuits - Part 1: General |
IEC 60748-2:1997 | Semiconductor devices - Integrated circuits - Part 2: Digital integrated circuits |
IEC 60191-4:2013 | Mechanical standardization of semiconductor devices - Part 4: Coding system and classification into forms of package outlines for semiconductor device packages |
IEC 60748-3:1986 | Semiconductor devices - Integrated circuits - Part 3: Analogue integrated circuits |
IEC 60748-4:1997 | Semiconductor devices - Integrated circuits - Part 4: Interface integrated circuits |
IEC 60617-12:1997 | Graphical symbols for diagrams - Part 12: Binary logic elements |
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