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  • BS IEC 60748-11:2000

    Current The latest, up-to-date edition.

    Semiconductor devices. Integrated circuits Sectional specification for semiconductor integrated circuits excluding hybrid circuits

    Available format(s):  Hardcopy, PDF

    Language(s):  English

    Published date:  31-07-2011

    Publisher:  British Standards Institution

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    Table of Contents - (Show below) - (Hide below)

    Committees responsible
    National foreword
    1 Scope
    2 General
    3 Subcontracting
    4 Primary stage of manufacture
    5 Quality assessment procedures
    6 Structural similarity procedures
    7 Groups and sub-groups
    8 Screening
    9 Sampling requirements
    10 Terminal identification
    11 Additional information
    12 Test and measurement procedures
    Appendix A - Guidance and format for drafting blank
                 detail specifications

    Abstract - (Show below) - (Hide below)

    Quality assessment procedures, inspection requirements, screening sequences, sampling requirements, test and measurement procedures for encapsulated, including multichip circuits.

    Scope - (Show below) - (Hide below)

    This sectional specification applies to encapsulated semiconductor integrated circuits, including multi-chip integrated circuits, but excluding hybrid circuits.

    General Product Information - (Show below) - (Hide below)

    Committee EPL/47
    Development Note Renumbers and supersedes BS QC790100(1991). 2000 version incorporates amendment 10586 to BS QC790100(1991). (04/2000) Supersedes 97/230052 DC. (09/2007) Together with BS IEC 60747-10, it supersedes BS 9450(1998). (08/2011)
    Document Type Standard
    Publisher British Standards Institution
    Status Current
    Supersedes

    Standards Referencing This Book - (Show below) - (Hide below)

    IEC 60747-10:1991 Semiconductor devices - Part 10: Generic specification for discrete devices and integrated circuits
    IEC 60191-2:2012 DB Mechanical standardization of semiconductor devices - Part 2: Dimensions
    IEC 60068-2-17:1994 Basic environmental testing procedures - Part 2-17: Tests - Test Q: Sealing
    IEC 60747-1:2006+AMD1:2010 CSV Semiconductor devices - Part 1: General
    IEC 60617-13:1993 Graphical symbols for diagrams - Part 13: Analogue elements
    IEC 60749:1996+AMD1:2000+AMD2:2001 CSV Semiconductor devices - Mechanical and climatic test methods
    IEC 60748-1:2002 Semiconductor devices - Integrated circuits - Part 1: General
    IEC 60748-2:1997 Semiconductor devices - Integrated circuits - Part 2: Digital integrated circuits
    IEC 60191-4:2013 Mechanical standardization of semiconductor devices - Part 4: Coding system and classification into forms of package outlines for semiconductor device packages
    IEC 60748-3:1986 Semiconductor devices - Integrated circuits - Part 3: Analogue integrated circuits
    IEC 60748-4:1997 Semiconductor devices - Integrated circuits - Part 4: Interface integrated circuits
    IEC 60617-12:1997 Graphical symbols for diagrams - Part 12: Binary logic elements
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