BS IEC 61671:2012
Current
The latest, up-to-date edition.
IEEE standard for automatic test markup language (ATML) for exchanging automatic test equipment and test information via XML
Hardcopy , PDF
English
31-08-2012
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1. Overview
2. Normative references
3. Definitions, acronyms, and abbreviations
4. Automatic test system (ATS) architecture
5. Automatic test markup language (ATML)
6. The ATML framework
7. ATML specification techniques
8. The ATML framework subdomains
9. ATML XML schema names and locations
10. ATML XML schema extensibility
11. Conformance
Annex A (normative) - XML schema style guidelines
Annex B (normative) - ATML common element schemas
Annex C (normative) - ATML internal model schemas
Annex D (normative) - ATML runtime services
Annex E (informative) - Pins, ports, connectors, and wire
lists in ATML
Annex F (informative) - ATML capabilities
Annex G (informative) - IEEE download Web site material
associated with this document
Annex H (informative) - ATS architectures
Annex I (informative) - Architecture examples
Annex J (informative) - UML models
Annex K (informative) - Glossary
Annex L (informative) - Bibliography
Annex M (informative) - IEEE List of Participants
Describes a standard exchange medium for sharing information between components of ATSs.
| Committee |
EPL/501
|
| DocumentType |
Standard
|
| Pages |
394
|
| PublisherName |
British Standards Institution
|
| Status |
Current
|
ATML defines a standard exchange medium for sharing information between components of ATSs. This information includes test data, resource data, diagnostic data, and historic data. The exchange medium is defined using XML. This standard specifies the framework for the family of ATML standards.
| Standards | Relationship |
| IEC 61671:2012 | Identical |
| IEEE 1641.1-2013 | IEEE Guide for the Use of IEEE Std 1641, IEEE Standard for Signal and Test Definition |
| IEEE 1671.4-2014 | IEEE Standard for Automatic Test Markup Language (ATML) Test Configuration |
| IEEE 1671.3-2007 | IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via XML (eXtensible Markup Language): Exchanging UUT (Unit Under Test) Description Information |
| IEEE 1057-2007 REDLINE | IEEE Standard for Digitizing Waveform Recorders |
| IEEE 1155 : 1992 | VMEBUS EXTENSIONS FOR INSTRUMENTATION: VXIBUS |
| TIA 232 : F1997(R2012) | INTERFACE BETWEEN DATA TERMINAL EQUIPMENT AND DATA CIRCUIT-TERMINATING EQUIPMENT EMPLOYING SERIAL BINARY DATA INTERCHANGE |
| IEEE 1671.5-2015 | IEEE Standard for Automatic Test Markup Language (ATML) Test Adapter Description |
| IEC 60488-2:2004 | Standard digital interface for programmable instrumentation - Part 2: Codes, formats, protocols and common commands |
| IEEE 802.3-2012 | IEEE Standard for Ethernet |
| IEEE 1671.6-2015 | IEEE Standard for Automatic Test Markup Language (ATML) Test Station Description |
| IEEE 260.1 : 2004 | LETTER SYMBOLS FOR UNITS OF MEASUREMENT (SI UNITS, CUSTOMARY INCH-POUND UNITS, AND CERTAIN OTHER UNITS) |
| IEEE 1445-1998 | IEEE Standard for Digital Test Interchange Format (DTIF) |
| EIA 682 : 1996 | EDIF VERSION 400 ELECTRONIC DESIGN INTERCHANGE FORMAT |
| IEEE 488.2 : 1992 | STANDARD CODES, FORMATS, PROTOCOLS, AND COMMON COMMANDS FOR USE WITH IEEE 488.1-1987, IEEE STANDARD DIGITAL INTERFACE FOR PROGRAMMABLE INSTRUMENTATION |
| IEEE 1505.1-2008 | IEEE Standard for the Common Test Interface Pin Map Configuration for High-Density, Single-Tier Electronics Test Requirements Utilizing IEEE Std 1505 |
| IEEE 1671.2-2012 | IEEE Standard for Automatic Test Markup Language (ATML) Instrument Description |
| ISO 8601:2004 | Data elements and interchange formats Information interchange Representation of dates and times |
| ISO 8879:1986 | Information processing Text and office systems Standard Generalized Markup Language (SGML) |
| IEEE 1636-2009 | IEEE Standard for Software Interface for Maintenance Information Collection and Analysis (SIMICA) |
| ISO/IEC 9899:2011 | Information technology Programming languages C |
| IEEE 1636.1-2013 | IEEE Standard for Software Interface for Maintenance Information Collection and Analysis (SIMICA): Exchanging Test Results and Session Information via the eXtensible Markup Language (XML) |
| IEEE 754-2008 REDLINE | IEEE Standard for Floating-Point Arithmetic |
| IEEE 1671.1-2009 | IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML: Exchanging Test Descriptions |
| IEEE 1149.1-2013 REDLINE | IEEE Standard for Test Access Port and Boundary-Scan Architecture |
| IEEE/Open Group 1003.1, 2013 Edition | IEEE Standard for Information Technology—Portable Operating System Interface (POSIX(TM)) Base Specifications, Issue 7 |
| MIL-STD-1309 Revision D:1992 | DEFINITIONS OF TERMS FOR TEST, MEASUREMENT AND DIAGNOSTIC EQUIPMENT |
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