CEI EN 60122-1 : 2004
Current
Current
The latest, up-to-date edition.
QUARTZ CRYSTAL UNITS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION
Amended by
Available format(s)
Hardcopy , PDF
Language(s)
English
Published date
01-02-2004
Publisher
€99.23
Excluding VAT
FOREWORD
1 General
2 Terminology and general requirements
3 Quality assessment procedures
4 Test and measurement procedures
Bibliography
Annex ZA (normative) - Normative references to
international Publications with their
corresponding European publications
This Standard replaces EN 168000:1993 and its Amendment A2:1998.
| Committee |
CT 309
|
| DevelopmentNote |
Classificazione CEI 309-1001. (07/2015)
|
| DocumentType |
Standard
|
| Pages |
70
|
| PublisherName |
Comitato Elettrotecnico Italiano
|
| Status |
Current
|
| Standards | Relationship |
| IEC 60122-1:2002 | Identical |
| EN 60122-1:2002 | Identical |
| EN 60122-1:2002/A1:2018 | Identical |
| HD 323.2.20 : 200S3 | BASIC ENVIRONMENTAL TESTING PROCEDURES - TESTS - TEST T - SOLDERING |
| EN 60444-4:1997 | Measurement of quartz crystal unit parameters by zero phase technique in a pi-network - Part 4: Method for the measurement of the load resonance frequency fL, load resonance resistance RL and the calculation of other derived values of quartz crystal units, up to 30 MHz |
| IEC 60068-1:2013 | Environmental testing - Part 1: General and guidance |
| IEC 60068-2-58:2015+AMD1:2017 CSV | Environmental testing - Part 2-58: Tests - Test Td: Test methods for solderability, resistance to dissolution of metallization and to soldering heat of surface mounting devices (SMD) |
| IEC 60068-2-27:2008 | Environmental testing - Part 2-27: Tests - Test Ea and guidance: Shock |
| IEC 60068-2-20:2008 | Environmental testing - Part 2-20: Tests - Test T: Test methods for solderability and resistance to soldering heat of devices with leads |
| IEC 60122-3:2010 | Quartz crystal units of assessed quality - Part 3: Standard outlines and lead connections |
| EN 60068-2-1:2007 | Environmental testing - Part 2-1: Tests - Test A: Cold |
| IECQ 001002-3:2005 | IEC QUALITY ASSESSMENT SYSTEM FOR ELECTRONIC COMPONENTS (IECQ) - RULES OF PROCEDURE - PART 3: APPROVAL PROCEDURES |
| EN 60068-2-2:2007 | Environmental testing - Part 2-2: Tests - Test B: Dry heat |
| IEC 60068-2-21:2006 | Environmental testing - Part 2-21: Tests - Test U: Robustness of terminations and integral mounting devices |
| IEC 60068-2-13:1983 | Basic environmental testing procedures - Part 2-13: Tests - Test M: Low air pressure |
| EN 60068-1:2014 | Environmental testing - Part 1: General and guidance |
| EN 60444-2:1997 | Measurement of quartz crystal unit parameters by zero phase technique in a pi-network - Part 2: Phase offset method for measurement of motional capacitance of quartz crystal units |
| IEC 60444-5:1995 | Measurement of quartz crystal units parameters - Part 5: Methods for the determination of equivalent electrical parameters using automatic network analyzer techniques and error correction |
| IEC 60444-2:1980 | Measurement of quartz crystal unit parameters by zero phase technique in a pi-network. Part 2: Phase offset method for measurement of motional capacitance of quartz crystal units |
| IEC 61178-3:1993 | Quartz crystal units - A specification in the IEC Quality Assessment System for Electronic Components (IECQ) - Part 3: Sectional specification - Qualification approval |
| IECQ 001002-2:1998 | IEC QUALITY ASSESSMENT SYSTEM FOR ELECTRONIC COMPONENTS (IECQ) - RULES OF PROCEDURE - PART 2: DOCUMENTATION |
| IEC 60444-6:2013 | Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level dependence (DLD) |
| IEC 60068-2-64:2008 | Environmental testing - Part 2-64: Tests - Test Fh: Vibration, broadband random and guidance |
| EN 60444-1:1997/A1:1999 | MEASUREMENT OF QUARTZ CRYSTAL UNIT PARAMETERS BY ZERO PHASE TECHNIQUE IN A PI-NETWORK - PART 1: BASIC METHOD FOR THE MEASUREMENT OF RESONANCE FREQUENCY AND RESONANCE RESISTANCE OF QUARTZ CRYSTAL UNITS BY ZERO PHASE TECHNIQUE IN A PI-NETWORK |
| IEC TR 60444-4:1988 | Measurement of quartz crystal unit parameters by zero phase technique in a pi-network. Part 4: Method for the measurement of the load resonance frequency fL, load resonance resistance RL and the calculation of other derived values of quartz crystal units, up to 30 MHz |
| IEC 60410:1973 | Sampling plans and procedures for inspection by attributes |
| EN 60068-2-27:2009 | Environmental testing - Part 2-27: Tests - Test Ea and guidance: Shock |
| EN 60444-6:2013 | Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level dependence (DLD) |
| IEC 60068-2-3:1969 | Basic environmental testing procedures - Part 2-3: Tests - Test Ca: Damp heat, steady state |
| IEC GUIDE 102:1996 | Electronic components - Specification structures for quality assessment (Qualification approval and capability approval) |
| IEC 60068-2-17:1994 | Basic environmental testing procedures - Part 2-17: Tests - Test Q: Sealing |
| EN 60068-2-21:2006 | Environmental testing - Part 2-21: Tests - Test U: Robustness of terminations and integral mounting devices |
| IEC 60068-2-2:2007 | Environmental testing - Part 2-2: Tests - Test B: Dry heat |
| IECQ 001002-1:1998 | IEC QUALITY ASSESSMENT SYSTEM FOR ELECTRONIC COMPONENTS (IECQ) - RULES OF PROCEDURE - PART 1: ADMINISTRATION |
| EN 60068-2-29:1993 | Environmental testing - Part 2: Tests - Test Eb and guidance: Bump |
| IEC 60050-561:2014 | International Electrotechnical Vocabulary (IEV) - Part 561: Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection |
| IEC 60068-2-29:1987 | Environmental testing. Part 2: Tests. Test Eb and guidance: Bump |
| IEC 61178-2:1993 | Quartz crystal units - A specification in the IEC Quality Assessment System for Electronic Components (IECQ) - Part 2: Sectional specification - Capability approval |
| EN 60444-5:1997 | Measurement of quartz crystal unit parameters - Part 5: Methods for the determination of equivalent electrical parameters using automatic network analyzer techniques and error correction |
| IEC 60068-2-1:2007 | Environmental testing - Part 2-1: Tests - Test A: Cold |
| EN 60068-2-30:2005 | Environmental testing - Part 2-30: Tests - Test Db: Damp heat, cyclic (12 h + 12 h cycle) |
| EN 60068-2-32:1993 | Basic environmental testing procedures - Part 2: Tests - Test Ed: Free fall |
| IEC 60068-2-14:2009 | Environmental testing - Part 2-14: Tests - Test N: Change of temperature |
| EN 60068-2-45:1992/A1:1993 | Environmental testing - Part 2: Tests - Test Xa and guidance: Immersion in cleaning solvents |
| EN 60122-3:2010 | Quartz crystal units of assessed quality - Part 3: Standard outlines and lead connections |
| IEC 60068-2-30:2005 | Environmental testing - Part 2-30: Tests - Test Db: Damp heat, cyclic (12 h + 12 h cycle) |
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