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EN 60749-27:2006/A1:2012
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The latest, up-to-date edition.
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SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 27: ELECTROSTATIC DISCHARGE (ESD) SENSITIVITY TESTING - MACHINE MODEL (MM)
09-11-2012
FOREWORD
1 Scope
2 Normative references
3 Terms and definitions
4 Equipment
5 MM current waveform requirements
6 Device specific evaluation considerations
7 Classification procedure
8 Failure criteria
9 Classification criteria
10 Summary
Annex ZA (normative) - Normative references to international
publications with their corresponding European
publications
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