EN 61967-6:2002/A1:2008
Current
The latest, up-to-date edition.
INTEGRATED CIRCUITS - MEASUREMENT OF ELECTROMAGNETIC EMISSIONS, 150 KHZ TO 1 GHZ - PART 6: MEASUREMENT OF CONDUCTED EMISSIONS - MAGNETIC PROBE METHOD
14-05-2008
FOREWORD
1 Scope
2 Normative references
3 Definitions
4 General
4.1 Measurement philosophy
4.2 Measurement principle
5 Test conditions
5.1 General
5.2 Frequency range
6 Test equipment
6.1 General
6.2 Magnetic probe
6.3 Probe spacing fixture and placement
7 Test set-up
7.1 General
7.2 Probe calibration
7.3 Modifications to standardized IC test board
7.3.1 Layer arrangement
7.3.2 Layer thickness
7.3.3 Decoupling capacitors
7.3.4 I/O pin loading
8 Test procedure
8.1 General
8.2 Test technique
9 Test report
9.1 General
9.2 Documentation
Annex A (normative) Probe calibration procedure -
Microstrip line method
Annex B (informative) Measurement principle and
calibration factor
Annex C (informative) Spatial resolution of magnetic
probe
Annex D (informative) Angle pattern of probe placement
Annex E (informative) Advanced magnetic probe
Annex ZA (normative) Normative references to international
publications with their corresponding European
publications
Bibliography
Gives a method for evaluating RF currents on the pins of an integrated circuit (IC) by means on non-contact current measurement using a miniature magnetic probe.
| Committee |
SR 47A
|
| DevelopmentNote |
To be read in conjunction with EN 61967-1 (05/2003)
|
| DocumentType |
Standard
|
| PublisherName |
European Committee for Standards - Electrical
|
| Status |
Current
|
| Supersedes |
| Standards | Relationship |
| BS EN 61967-6 : 2002 | Identical |
| NF EN 61967-6 : 2003 AMD 1 2008 | Identical |
| IEC 61967-6:2002+AMD1:2008 CSV | Identical |
| I.S. EN 61967-6:2003 | Identical |
| UNE-EN 61967-6:2002/A1:2008 | Identical |
| NBN EN 61967-6 : 2002 AMD 1 2008 | Identical |
| DIN EN 61967-6:2008-10 | Identical |
| PN EN 61967-6 : 2003 AMD 1 2008 | Identical |
| CEI EN 61967-6 : 2009 | Identical |
| NEN EN IEC 61967-6 : 2002 C1 2010 | Identical |
| PNE-EN 61967-6:2002/prA1 | Identical |
| EN IEC 62969-1:2018 | Semiconductor devices - Semiconductor interface for automotive vehicles - Part 1: General requirements of power interface for automotive vehicle sensors |
| IEC 61967-1:2002 | Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 1: General conditions and definitions |
| EN 61967-1:2002 | Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 1: General conditions and definitions |
| EN 61967-4 : 2002 COR 2017 | INTEGRATED CIRCUITS - MEASUREMENT OF ELECTROMAGNETIC EMISSIONS, 150 KHZ TO 1 GHZ - PART 4: MEASUREMENT OF CONDUCTED EMISSIONS - 1 OHM/150 OHM DIRECT COUPLING METHOD (IEC 61967-4:2002/COR1:2017) |
| IEC 61967-4:2002+AMD1:2006 CSV | Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 4: Measurement of conducted emissions - 1 Ω/150 Ω direct coupling method |
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