EN 62433-2:2017
Current
The latest, up-to-date edition.
EMC IC modelling - Part 2: Models of integrated circuits for EMI behavioural simulation - Conducted emissions modelling (ICEM-CE)
12-05-2017
FOREWORD
1 Scope
2 Normative references
3 Terms, definitions, abbreviations and conventions
4 Philosophy
5 ICEM-CE basic components
6 IC macro-models
7 CEML format
8 Requirements for parameter extraction
Annex A (normative) - Preliminary definitions for
XML representation
Annex B (normative) - CEML valid keywords and usage
Annex C (informative) - Example of ICEM-CE
macro-model in CEML format
Annex D (informative) - Conversions between parameter
types
Annex E (informative) - Model parameter generation
Annex F (informative) - Decoupling capacitors optimization
Annex G (informative) - Conducted emission prediction
Annex H (informative) - Conducted emission prediction
at PCB level
Bibliography
Annex ZA (normative) - Normative references to
international publications with their
corresponding European publications
IEC 62433-2:2008(E) specifies macro-models for ICs to simulate conducted electromagnetic emissions on a printed circuit board. The model is commonly called Integrated Circuit Emission Model - Conducted Emission (ICEM-CE). The ICEM-CE model can also be used for modelling an IC-die, a functional block and an Intellectual Property block (IP). The ICEM-CE model can be used to model both digital and analogue ICs. Basically, conducted emissions have two origins: - conducted emmissions through power supply terminals and ground reference structure; - conducted emmisions through input/output (I/O) terminals. The ICEM-CE model addresses those two types of origins in a single approach. This standard defines structures and components of the macro-model for EMI simulation taking into account the IC's internal activities. This standard gives general data, which can be implemented in different formats or languages such as IBIS, IMIC, SPICE, VHDL-AMS and Verilog. SPICE is however chosen as default simulation environment to cover all the conducted emissions. This standard also specifies requirements for information that shall be incorporated in each ICEM-CE model or component part of the model for model circulation, but description syntax is not within the scope of this standard.
Committee |
CLC/TC 47X
|
DocumentType |
Standard
|
PublisherName |
European Committee for Standards - Electrical
|
Status |
Current
|
Standards | Relationship |
CEI EN 62433-2 : 2011 | Identical |
VDE 0847-33-2 : 2017 | Identical |
BS EN 62433-2:2017 | Identical |
NEN EN IEC 62433-2 : 2017 | Identical |
SN EN 62433-2 : 2017 | Identical |
IEC 62433-2:2017 | Identical |
UNE-EN 62433-2:2017 | Identical |
NF EN 62433-2 : 2017 | Identical |
I.S. EN 62433-2:2017 | Identical |
PN EN 62433-2 : 2017 | Identical |
DIN EN 62433-2 : 2010 | Identical |
NBN EN 62433-2 : 2010 | Identical |
DIN EN 62433-2 : 2017 | Identical |
PNE-FprEN 62433-2 | Identical |
EN 62433-4:2016 | EMC IC modelling - Part 4: Models of integrated circuits for RF immunity behavioural simulation - Conducted immunity modelling (ICIM-CI) |
CEI EN 62433-4 : 1ED 2017 | EMC IC MODELLING - PART 4: MODELS OF INTEGRATED CIRCUITS FOR RF IMMUNITY BEHAVIOURAL SIMULATION - CONDUCTED IMMUNITY MODELLING (ICIM-CI) |
BS EN 62433-4:2016 | EMC IC modelling Models of integrated circuits for RF immunity behavioural simulation. Conducted immunity modelling (ICIM-CI) |
IEC 61967-4:2002+AMD1:2006 CSV | Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 4: Measurement of conducted emissions - 1 Ω/150 Ω direct coupling method |
ISO 8879:1986 | Information processing Text and office systems Standard Generalized Markup Language (SGML) |
CISPR 17:2011 | Methods of measurement of the suppression characteristics of passive EMC filtering devices |
IEC TS 62433-1:2011 | EMC IC modelling - Part 1: General modelling framework |
EN 55017 : 2011 | METHODS OF MEASUREMENT OF THE SUPPRESSION CHARACTERISTICS OF PASSIVE EMC FILTERING DEVICES (CISPR 17:2011) |
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