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I.S. EN 60146-2:2003

Current

Current

The latest, up-to-date edition.

SEMICONDUCTOR CONVERTERS - PART 2: SELF-COMMUTATED SEMICONDUCTOR CONVERTERS INCLUDING DIRECT D.C. CONVERTERS

Available format(s)

Hardcopy , PDF

Language(s)

English

Published date

01-01-2003

For Harmonized Standards, check the EU site to confirm that the Standard is cited in the Official Journal.

Only cited Standards give presumption of conformance to New Approach Directives/Regulations.


Dates of withdrawal of national standards are available from NSAI.

€82.00
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Foreword
1 Scope
2 Normative References
3 Definitions
   3.1 Functions of converters
   3.2 Types of converters
   3.3 Converter circuit components
   3.4 Important properties of converters and
        electronic valve devices
   3.5 Disturbances and electromagnetic compatibility
   3.6 Characteristics related to input and output
   3.7 Definitions of rated values
   3.8 Definitions related to cooling
   3.9 Definitions related to temperature
   3.10 Definitions related to tests
4 Additional Subscripts and Letter Symbols
5 Service Conditions
   5.1 Code of identification for cooling methods
   5.2 Environmental conditions
        5.2.1 Ambient air circulation
        5.2.2 Normal service conditions
        5.2.3 Unusual environmental service
               conditions and design considerations
   5.3 Electrical service conditions
        5.3.1 Electrical environment specification
        5.3.2 Unknown site conditions
   5.4 Character of the load
   5.5 Immunity requirements
        5.5.1 AC supply
        5.5.2 DC supply
        5.5.3 Load conditions, load unbalance
        5.5.4 Electrical unusual service conditions
               and performance requirements
6 Rated Values and Additional Characteristics
   6.1 General
   6.2 Rated values to be specified by the supplier
        6.2.1 Rated input values
        6.2.2 Rated output values
   6.3 Additional characteristics
   6.4 Marking
7 Tests
   7.1 General
        7.1.1 Classification of tests
        7.1.2 Performance of tests
   7.2 Test schedule for converter equipment and
        converter assemblies
   7.3 Test specifications
        7.3.1 Visual inspection
        7.3.2 Checking of auxiliary devices
        7.3.3 Insulation test
        7.3.4 Checking of the protective devices
        7.3.5 Light load and functional test
        7.3.6 Rated output test
        7.3.7 Overcurrent test
        7.3.8 Temperature-rise test
        7.3.9 Power loss determination
        7.3.10 Measurement of total harmonic
               distortion (THD) or total harmonic
               factor (THF)
        7.3.11 Measurement of power factor
        7.3.12 Measurement of output voltage
        7.3.13 Confirmation of output voltage
               adjustable range
        7.3.14 Output voltage unbalance test
        7.3.15 Confirmation of output frequency
               adjustable range
        7.3.16 Output frequency tolerances band test
        7.3.17 Checking of the automatic control
        7.3.18 Short-circuit test
        7.3.19 Measurement of audible noise
        7.3.20 Immunity test
        7.3.21 Emission test
        7.3.22 Measurement of ripple voltage and
               current
        7.3.23 Additional tests
   7.4 Tolerances
Annex A (informative) Example for testing high power
                      converters
   A.1 Introduction
   A.2 Basic concepts
   A.3 Test procedures
        A.3.1 Rated output test
        A.3.2 Overcurrent test
        A.3.3 Temperature-rise test
               A.3.3.1 GTO and diode
               A.3.3.2 Snubber circuits
               A.3.3.3 DC capacitors
        A.3.4 Power loss determination

Covers all kinds of semiconductor converters of the self-commutated type as well as power converters containing at least a part of a self-commutated type, e.g. indirect d.c. converters, a.c. converters and direct d.c. converters.

DevelopmentNote
For CENELEC adoptions of IEC publications, please check www.iec.ch to be sure that you have any corrigenda that may apply. (01/2017)
DocumentType
Standard
Pages
106
PublisherName
National Standards Authority of Ireland
Status
Current

Standards Relationship
DIN EN 60146-2 : 2001 Identical
NF EN 60146-2 : 2002 Identical
IEC 60146-2:1999 Identical
BS EN 60146-2:2000 Identical
SN EN 60146-2 : 2000 Identical
NBN EN 60146-2 : 2000 Identical
EN 60146-2:2000 Identical

IEC 61000-2-4:2002 Electromagnetic compatibility (EMC) - Part 2-4: Environment - Compatibility levels in industrial plants for low-frequency conducted disturbances
EN 60146-1-1:2010 Semiconductor converters - General requirements and line commutated converters - Part 1-1: Specification of basic requirements
ENV 61000-2-2 : 1993 ELECTROMAGNETIC COMPATIBILITY (EMC) - ENVIRONMENT - COMPATIBILITY LEVELS FOR LOW-FREQUENCY CONDUCTED DISTURBANCES AND SIGNALLING IN PUBLIC LOW-VOLTAGE POWER SUPPLY SYSTEMS
EN 61000-2-4:2002/AC:2014 ELECTROMAGNETIC COMPATIBILITY (EMC) - PART 2-4: ENVIRONMENT - COMPATIBILITY LEVELS IN INDUSTRIAL PLANTS FOR LOW-FREQUENCY CONDUCTED DISTURBANCES
HD 625.1 : 200S1 INSULATION COORDINATION FOR EQUIPMENT WITHIN LOW-VOLTAGE SYSTEMS - PRINCIPLES, REQUIREMENTS AND TESTS
IEC 60050-551:1998 International Electrotechnical Vocabulary (IEV) - Part 551: Power electronics
IEC 60050-101:1998 International Electrotechnical Vocabulary (IEV) - Part 101: Mathematics
IEC 60146-1-1:2009 Semiconductor converters - General requirements and line commutated converters - Part 1-1: Specification of basic requirements
IEC 60747-1:2006+AMD1:2010 CSV Semiconductor devices - Part 1: General
IEC 61000-2-2:2002+AMD1:2017 CSV Electromagnetic compatibility (EMC) - Part 2-2: Environment - Compatibility levels for low-frequency conducted disturbances and signalling in public low-voltage power supply systems
EN 61010-1:2010 Safety requirements for electrical equipment for measurement, control, and laboratory use - Part 1: General requirements
IEC 61010-1:2010+AMD1:2016 CSV Safety requirements for electrical equipment for measurement, control, and laboratory use - Part 1: General requirements
IEC 60664-1:2007 Insulation coordination for equipment within low-voltage systems - Part 1: Principles, requirements and tests

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