IEC 60146-2:1999
Current
The latest, up-to-date edition.
Semiconductor converters - Part 2: Self-commutated semiconductor converters including direct d.c. converters
Hardcopy , PDF
English - French
18-11-1999
Foreword
1 Scope
2 Normative References
3 Definitions
3.1 Functions of converters
3.2 Types of converters
3.3 Converter circuit components
3.4 Important properties of converters and
electronic valve devices
3.5 Disturbances and electromagnetic compatibility
3.6 Characteristics related to input and output
3.7 Definitions of rated values
3.8 Definitions related to cooling
3.9 Definitions related to temperature
3.10 Definitions related to tests
4 Additional Subscripts and Letter Symbols
5 Service Conditions
5.1 Code of identification for cooling methods
5.2 Environmental conditions
5.2.1 Ambient air circulation
5.2.2 Normal service conditions
5.2.3 Unusual environmental service
conditions and design considerations
5.3 Electrical service conditions
5.3.1 Electrical environment specification
5.3.2 Unknown site conditions
5.4 Character of the load
5.5 Immunity requirements
5.5.1 AC supply
5.5.2 DC supply
5.5.3 Load conditions, load unbalance
5.5.4 Electrical unusual service conditions
and performance requirements
6 Rated Values and Additional Characteristics
6.1 General
6.2 Rated values to be specified by the supplier
6.2.1 Rated input values
6.2.2 Rated output values
6.3 Additional characteristics
6.4 Marking
7 Tests
7.1 General
7.1.1 Classification of tests
7.1.2 Performance of tests
7.2 Test schedule for converter equipment and
converter assemblies
7.3 Test specifications
7.3.1 Visual inspection
7.3.2 Checking of auxiliary devices
7.3.3 Insulation test
7.3.4 Checking of the protective devices
7.3.5 Light load and functional test
7.3.6 Rated output test
7.3.7 Overcurrent test
7.3.8 Temperature-rise test
7.3.9 Power loss determination
7.3.10 Measurement of total harmonic
distortion (THD) or total harmonic
factor (THF)
7.3.11 Measurement of power factor
7.3.12 Measurement of output voltage
7.3.13 Confirmation of output voltage
adjustable range
7.3.14 Output voltage unbalance test
7.3.15 Confirmation of output frequency
adjustable range
7.3.16 Output frequency tolerances band test
7.3.17 Checking of the automatic control
7.3.18 Short-circuit test
7.3.19 Measurement of audible noise
7.3.20 Immunity test
7.3.21 Emission test
7.3.22 Measurement of ripple voltage and
current
7.3.23 Additional tests
7.4 Tolerances
Annex A (informative) Example for testing high power
converters
A.1 Introduction
A.2 Basic concepts
A.3 Test procedures
A.3.1 Rated output test
A.3.2 Overcurrent test
A.3.3 Temperature-rise test
A.3.3.1 GTO and diode
A.3.3.2 Snubber circuits
A.3.3.3 DC capacitors
A.3.4 Power loss determination
Figure 1 - Maximum expected overvoltages versus duration of
transient
Figure 2 - Diagram for calculation of voltage unbalance factor
Figure A.1 - Example of a large converter
Figure A.2 - Test circuit of a converter assembly
Figure A.3 - Timing chart for GTO gate pulses
Table 1 - Immunity levels for stiff a.c. voltage connections
Table 2 - DC voltage tolerances
Table 3 - Relative peak-to-peak ripple factor
Table 4 - Test items
Table 5 - Tolerances of losses and efficiency
Applies to all types of semiconductor inverters of the self-commutated type and semiconductor convertors which contain at least one part of a self-commutated type, including direct a.c. convertors and d.c. convertors for all applications.
| Committee |
TC 22
|
| DevelopmentNote |
Supersedes IEC 60146, IEC 60146-3 (03/2001) Also numbered as BS EN 60146-2. (09/2005) Stability Date: 2019. (09/2017)
|
| DocumentType |
Standard
|
| Pages |
91
|
| PublisherName |
International Electrotechnical Committee
|
| Status |
Current
|
| Supersedes |
| Standards | Relationship |
| NF EN 60146-2 : 2002 | Identical |
| NEN EN IEC 60146-2 : 2000 | Identical |
| I.S. EN 60146-2:2003 | Identical |
| PN EN 60146-2 : 2001 | Identical |
| SAC GB/T 3859-4 : 2004 | Identical |
| AS 60146.2-2001 | Identical |
| DIN EN 60146-2:2001-02 | Identical |
| VDE 0558-2:2001-02 | Identical |
| CEI EN 60146-2 : 2001 | Identical |
| EN 60146-2:2000 | Identical |
| UNE-EN 60146-2:2000 | Identical |
| NFC 53 221 : 1980 | Identical |