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I.S. EN 60749-11:2002

Current

Current

The latest, up-to-date edition.

SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 11: RAPID CHANGE OF TEMPERATURE - TWO-FLUID-BATH METHOD

Available format(s)

Hardcopy , PDF

Language(s)

English

Published date

01-01-2002

For Harmonized Standards, check the EU site to confirm that the Standard is cited in the Official Journal.

Only cited Standards give presumption of conformance to New Approach Directives/Regulations.


Dates of withdrawal of national standards are available from NSAI.

FOREWORD
INTRODUCTION
1 Scope
2 Normative references
3 Terms and definitions
4 Test apparatus
5 Procedure
6 Summary
Annex ZA (normative) - Normative references to international
         publications with their corresponding European
         publications

Specifies the rapid change of temperature test method and the two-fluid-bath method. Also applicable to all semiconductor devices.

DevelopmentNote
Supersedes I.S. EN 60749. NSAI reissued 2002 PDF dated 19.02.2015 with IEC Corrigenda incorporated. (06/2017)
DocumentType
Standard
Pages
24
PublisherName
National Standards Authority of Ireland
Status
Current
Supersedes

Standards Relationship
UNE-EN 60749-11:2003 Identical
DIN EN 60749-11:2003-04 Identical
NF EN 60749-11 : 2002 Identical
BS EN 60749-11:2002 Identical
NBN EN 60749-11 : 2003 Identical
EN 60749-11:2002 Identical
IEC 60749-11:2002 Identical

IEC 60749-3:2017 Semiconductor devices - Mechanical and climatic test methods - Part 3: External visual examination
EN 60749-3:2017 Semiconductor devices - Mechanical and climatic test methods - Part 3: External visual examination
IEC 60068-2-14:2009 Environmental testing - Part 2-14: Tests - Test N: Change of temperature
EN 60068-2-14:2009 Environmental testing - Part 2-14: Tests - Test N: Change of temperature

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