IEC 60148:1969
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
View Superseded by
Letter symbols for semiconductor devices and integrated microcircuits
Hardcopy , PDF , PDF 3 Users , PDF 5 Users , PDF 9 Users
01-04-1995
English - French
01-01-1969
Important note : Users cannot be edited or removed once added to your Multi user PDF.148A FIRST SUPPLEMENT 1974 148B SECOND SUPPLEMENT 1979 Provides a uniform system of letter symbols to be used in the semiconductor device and integrated microcircuit fields.
| Committee |
TC 47
|
| DocumentType |
Standard
|
| Pages |
67
|
| PublisherName |
International Electrotechnical Committee
|
| Status |
Superseded
|
| SupersededBy | |
| Supersedes |
| Standards | Relationship |
| DIN 41785-3:1975-02 | Similar to |
| NBN C 83 300 : 1985 | Identical |
| NBN C 86 010 : 1984 | Identical |
| NEN 10148 : 1980 | Identical |
| UNE 21321:1978 | Identical |
| NFC 96 112 : 81 AMD 1 81 | Similar to |
| NFC 96 113 : 1980 | Similar to |
| BS 3363:1980 | Identical |
| BS EN 153000:1998 | Harmonized system of quality assessment for electronic components. Generic specification: discrete pressure contact power semiconductor devices (qualification approval) |
| BS EN 190100:1993 | Harmonized system of quality assessment for electronic components: sectional specification: digital monolithic integrated circuits |
| EN 153000:1998 | Generic specification: Discrete pressure contact power semiconductor devices (Qualification approval) |
| DIN EN 190000:1996-05 | GENERIC SPECIFICATION - MONOLITHIC INTEGRATED CIRCUITS |
| I.S. EN 153000:1998 | DISCRETE PRESSURE CONTACT POWER SEMICONDUCTOR DEVICES (QUALIFICATION APPROVAL) (GENERIC SPECIFICATION) |
| BS CECC 63000:1990 | Harmonized system of quality assessment for electronic components. Generic specification: film and hybrid integrated circuits |
| BS CECC 50000:1987 | Harmonized system of quality assessment for electronic components. Generic specification: discrete semiconductor devices |
| BS CECC 90300:1988 | Harmonized system of quality assessment for electronic components. Sectional specification: interface monolithic integrated circuits |
| BS EN 120000:1996 | Harmonized system of quality assessment for electronic components. General specification: semiconductor optoelectronic and liquid crystal devices |
| CEI EN 61360-1 : 2013 | STANDARD DATA ELEMENT TYPES WITH ASSOCIATED CLASSIFICATION SCHEME FOR ELECTRIC ITEMS - PART 1: DEFINITIONS - PRINCIPLES AND METHODS |
| BS 9450:1975 | Specification for integrated electronic circuits and micro-assemblies of assessed quality (capability approval procedures): generic data and methods of test |
| DEFSTAN 59-62(PT5)/1(1983) : 1983 | MICROCIRCUITS ELECTRONIC (INTEGRATED CIRCUITS) - PART 5: ANALOGUE SWITCH/MULTIPLEXERS |
| DEFSTAN 59-62(PT7)/1(1983) : 1983 | MICROCIRCUITS ELECTRONIC (INTEGRATED CIRCUITS) - PART 7: MEMORIES/MICROPROCESSORS |
| BS CECC90100(1987) : AMD 7845 | HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS: SECTIONAL SPECIFICATION: DIGITAL MONOLITHIC INTEGRATED CIRCUITS |
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