IEC 60444-5:1995
Current
Current
The latest, up-to-date edition.
Measurement of quartz crystal units parameters - Part 5: Methods for the determination of equivalent electrical parameters using automatic network analyzer techniques and error correction
Available format(s)
Hardcopy , PDF , PDF 3 Users , PDF 5 Users , PDF 9 Users
Language(s)
English - French
Published date
07-04-1995
Publisher
Gives methods for determining the best representations of modes in quartz crystal resonators by linear equivalent circuits.
Committee |
TC 49
|
DevelopmentNote |
Also numbered as IEC 60444-5 (11/2005) Stability Date: 2017. (09/2017)
|
DocumentType |
Standard
|
Pages |
100
|
PublisherName |
International Electrotechnical Committee
|
Status |
Current
|
Standards | Relationship |
PN EN 60444-5 : 2001 | Identical |
NEN EN IEC 60444-5 : 1997 | Identical |
BS 7681-5(1995) : 1995 AMD 9661 | Similar to |
I.S. EN 60444-5:1999 | Identical |
SN EN 60444-5 : 1997 | Identical |
EN 60444-5:1997 | Identical |
DIN EN 60444-5:1997-10 | Identical |
NF EN 60444-5 : 2001 | Identical |
UNE-EN 60444-5:1997 | Identical |
IEC 63041-2:2017 | Piezoelectric sensors - Part 2: Chemical and biochemical sensors |
CEI EN 60444-8 : 2004 | MEASUREMENT OF QUARTZ CRYSTAL UNIT PARAMETERS - PART 8: TEST FIXTURE FOR SURFACE MOUNTED QUARTZ CRYSTAL UNITS |
17/30358131 DC : 0 | BS IEC 60122-4 ED.1.0 - QUARTZ CRYSTAL UNITS OF ASSESSED QUALITY - PART 4: CRYSTAL UNITS WITH THERMISTORS |
NF EN 60444-11 : 2011 | MEASUREMENT OF QUARTZ CRYSTAL UNIT PARAMETERS - PART 11: STANDARD METHOD FOR THE DETERMINATION OF THE LOAD RESONANCE FREQUENCY FL AND THE EFFECTIVE LOAD CAPACITANCE CLEFF USING AUTOMATIC NETWORK ANALYZER TECHNIQUES AND ERROR CORRECTION |
I.S. EN 60444-8:2017 | MEASUREMENT OF QUARTZ CRYSTAL UNIT PARAMETERS - PART 8: TEST FIXTURE FOR SURFACE MOUNTED QUARTZ CRYSTAL UNITS |
EN IEC 63041-1:2018 | Piezoelectric sensors - Part 1: Generic specifications |
NF EN 60122-1 : 2003 | QUARTZ CRYSTAL UNITS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION |
EN 60444-8:2017 | Measurement of quartz crystal unit parameters - Part 8 : Test fixture for surface mounted quartz crystal units |
I.S. EN IEC 63041-1:2018 | PIEZOELECTRIC SENSORS - PART 1: GENERIC SPECIFICATIONS |
IEC 60444-8:2016 | Measurement of quartz crystal unit parameters - Part 8 : Test fixture for surface mounted quartz crystal units |
I.S. EN 60444-6:2013 | MEASUREMENT OF QUARTZ CRYSTAL UNIT PARAMETERS - PART 6: MEASUREMENT OF DRIVE LEVEL DEPENDENCE (DLD) (IEC 60444-6:2013 (EQV)) |
EN 60444-6:2013 | Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level dependence (DLD) |
IEC PAS 62277:2001 | Test-fixture of surface mounting quartz crystal units |
BS EN 60444-6:2013 | Measurement of quartz crystal unit parameters Measurement of drive level dependence (DLD) |
I.S. EN IEC 63041-2:2018 | PIEZOELECTRIC SENSORS - PART 2: CHEMICAL AND BIOCHEMICAL SENSORS |
IEC 63041-1:2017 | Piezoelectric sensors - Part 1: Generic specifications |
CEI EN 60122-1 : 2004 | QUARTZ CRYSTAL UNITS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION |
EN 60444-11:2010 | Measurement of quartz crystal unit parameters - Part 11: Standard method for the determination of the load resonance frequency fL and the effective load capacitance CLeff using automatic network analyzer techniques and error correction |
08/30180527 DC : DRAFT JULY 2008 | BS EN 60444-11 - MEASUREMENT OF QUARTZ CRYSTAL UNIT PARAMETERS - PART 11: STANDARD METHOD FOR THE DETERMINATION OF THE LOAD RESONANCE FREQUENCY FL AND THE EFFECTIVE LOAD CAPACITANCE CLEFF USING AUTOMATIC NETWORK ANALYZER TECHNIQUES AND ERROR CORRECTION |
BS EN 60444-11:2010 | Measurement of quartz crystal unit parameters Standard method for the determination of the load resonance frequency ƒL and the effective load capacitance CLeff using automatic network analyzer techniques and error correction |
CEI EN 60444-11 : 2011 | MEASUREMENT OF QUARTZ CRYSTAL UNIT PARAMETERS - PART 11: STANDARD METHOD FOR THE DETERMINATION OF THE LOAD RESONANCE FREQUENCY F[L] AND THE EFFECTIVE LOAD CAPACITANCE C[LEFF] USING AUTOMATIC NETWORK ANALYZER TECHNIQUES AND ERROR CORRECTION |
13/30283831 DC : 0 | BS EN 60444-8:2003+A1 - MEASUREMENT OF QUARTZ CRYSTAL UNIT PARAMETERS - PART 8: TEST FIXTURE FOR SURFACE MOUNTED QUARTZ CRYSTAL UNITS |
BS EN 60122-1 : 2002 | QUARTZ CRYSTAL UNITS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION |
EN IEC 63041-2:2018 | Piezoelectric Sensors - Part 2: Chemical and Biochemical Sensors |
IEC 60444-6:2013 | Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level dependence (DLD) |
BS EN 60444-8:2017 | Measurement of quartz crystal unit parameters Test fixture for surface mounted quartz crystal units |
I.S. EN 60122-1:2002 AMD 1 2018 | QUARTZ CRYSTAL UNITS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION |
CEI EN 60444-6 : 2014 | MEASUREMENT OF QUARTZ CRYSTAL UNIT PARAMETERS - PART 6: MEASUREMENT OF DRIVE LEVEL DEPENDENCE (DLD) |
I.S. EN 60444-11:2010 | MEASUREMENT OF QUARTZ CRYSTAL UNIT PARAMETERS - PART 11: STANDARD METHOD FOR THE DETERMINATION OF THE LOAD RESONANCE FREQUENCY F[L] AND THE EFFECTIVE LOAD CAPACITANCE C[LEFF] USING AUTOMATIC NETWORK ANALYZER TECHNIQUES AND ERROR CORRECTION |
IEC 60444-11:2010 | Measurement of quartz crystal unit parameters - Part 11: Standard method for the determination of the load resonance frequency f<sub>L</sub> and the effective load capacitance C<sub>Leff</sub> using automatic network analyzer techniques and error correction |
EN 60122-1:2002/A1:2018 | QUARTZ CRYSTAL UNITS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION (IEC 60122-1:2002/A1:2017) |
IEC 61080:1991 | Guide to the measurement of equivalent electrical parameters of quartz crystal units |
IEC 60302:1969 | Standard definitions and methods of measurement for piezoelectric vibrators operating over the frequency range up to 30 MHz |
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