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IEC 60512-6-2:2002

Current

Current

The latest, up-to-date edition.

Connectors for electronic equipment - Tests and measurements - Part 6-2: Dynamic stress tests - Test 6b: Bump

Available format(s)

Hardcopy , PDF , PDF 3 Users , PDF 5 Users , PDF 9 Users

Language(s)

English - French, Spanish, Castilian

Published date

21-02-2002

€20.79
Excluding VAT

Foreword
1 General
2 Preparation of the specimen
3 Test method
4 Measurements
5 Details to be specified

Defines a standard test method to assess the ability of components (essentially connectors) to withstand specified severities of bump.

Committee
TC 48/SC 48B
DevelopmentNote
Stability Date: 2017. (10/2012)
DocumentType
Standard
Pages
9
PublisherName
International Electrotechnical Committee
Status
Current

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IEC 60512-2-5:2003 Connectors for electronic equipment - Tests and measurements - Part 2-5: Electrical continuity and contact resistance tests - Test 2e: Contact disturbance
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EN 60068-2-29:1993 Environmental testing - Part 2: Tests - Test Eb and guidance: Bump
IEC 60068-2-29:1987 Environmental testing. Part 2: Tests. Test Eb and guidance: Bump
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