IEC 61178-1:1993
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
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Quartz crystal units - A specification in the IEC Quality Assessment System for Electronic Components (IECQ) - Part 1: Generic specification
Hardcopy , PDF , PDF 3 Users , PDF 5 Users , PDF 9 Users
09-08-2002
English - French
31-03-1993
Important note : Users cannot be edited or removed once added to your Multi user PDF.
FOREWORD
1 General
1.1 Scope
1.2 Normative references
2 Technical
2.1 Order of precedence
2.2 Units, symbols and terminology
2.3 Preferred ratings and characteristics
2.4 Marking
3 Quality assessment procedures
3.1 Primary stage of manufacture
3.2 Structurally similar components
3.3 Subcontracting
3.4 Manufacturer's approval
3.5 Approval procedures
3.6 Procedures for capability approval
3.7 Procedures for qualification approval
3.8 Test procedures
3.9 Screening requirements
3.10 Rework and repair work
3.11 Certified test records
3.12 Delayed delivery
3.13 Release for delivery
3.14 Unchecked parameters
4 Test and measurement procedures
4.1 General
4.2 Alternative test methods
4.3 Precision of measurement
4.4 Standard conditions for testing
4.5 Visual inspection
4.6 Dimensioning and gauging procedures
4.7 Electrical test procedures
4.7.1 Frequency and resonance resistance
4.7.2 Drive level dependency
4.7.3 Frequency and resonance resistance as
a function of temperature
4.7.4 Unwanted responses
4.7.5 Shunt capacitance
4.7.6 Load resonance frequency and resistance
4.7.7 Frequency pulling range (fL1.L2)
4.7.8 Motional parameters
4.7.9 Insulation resistance
4.8 Mechanical and environmental test procedures
4.8.1 Robustness of terminations (destructive)
4.8.2 Sealing tests (non destructive)
4.8.3 Soldering (solderability and resistance to
soldering heat)
4.8.4 Rapid change of temperature, two-fluid bath
method (non destructive)
4.8.5 Rapid change of temperature with prescribed
time of transition (non destructive)
4.8.6 Bump (destructive)
4.8.7 Vibration (destructive)
4.8.8 Shock (destructive)
4.8.9 Free fall (destructive)
4.8.10 Acceleration, steady state (non destructive)
4.8.11 Dry heat (non destructive)
4.8.12 Damp heat, cyclic (destructive)
4.8.13 Cold (non destructive)
4.8.14 Climatic sequence (destructive)
4.8.15 Dampheat, steady state (destructive)
4.9 Endurance test procedure
4.9.1 Ageing (non destructive)
4.9.2 Extended ageing (non destructive)
Specifies the methods of test and general requirements for quartz crystal units of assessed quality using either capability approval or qualification approval procedures according to clause 11 of IECQ 001002.
| DevelopmentNote |
Supersedes IEC 122 PT1 (03/2001)
|
| DocumentType |
Standard
|
| Pages |
61
|
| PublisherName |
International Electrotechnical Committee
|
| Status |
Superseded
|
| SupersededBy |
| Standards | Relationship |
| NEN IEC 61178-1 : 1999 | Identical |
| DIN IEC 61178-1:1995-02 | Identical |
| CEI EN 60368-4 : 2003 | PIEZOELECTRIC FILTERS OF ASSESSED QUALITY - PART 4: SECTIONAL SPECIFICATION - CAPABILITY APPROVAL |
| 05/30132097 DC : DRAFT JUNE 2005 | IEC 60679-1 ED 3 - QUARTZ CRYSTAL CONTROLLED OSCILLATORS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION |
| I.S. HD 60027-2:2003 | LETTER SYMBOLS TO BE USED IN ELECTRICAL TECHNOLOGY - PART 2: TELECOMMUNICATIONS AND ELECTRONICS |
| IEC 61178-2:1993 | Quartz crystal units - A specification in the IEC Quality Assessment System for Electronic Components (IECQ) - Part 2: Sectional specification - Capability approval |
| I.S. EN 60368-1:2000 | PIEZOELECTRIC FILTERS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION |
| BS EN 60368-4:2001 | Piezoelectric filters Sectional specification. Capability approval |
| 13/30278807 DC : 0 | BS EN 61837-3 - SURFACE MOUNTED PIEZOELECTRIC DEVICES FOR FREQUENCY CONTROL AND SELECTI0N - STANDARD OUTLINES AND TERMINAL LEAD CONNECTIONS - PART 3: METAL ENCLOSURE |
| BS EN 60368-1:2000 | Piezoelectric filters Generic specification |
| CEI EN 60368-1 : 2006 | PIEZOELECTRIC FILTERS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION |
| IEC 61178-3-1:1993 | Quartz crystal units - A specification in the IEC Quality Assessment System for Electronic Components (IECQ) - Part 3: Sectional specification - Qualification approval - Section 1: Blank detail specification |
| IEC 60368-1:2000+AMD1:2004 CSV | Piezoelectric filters of assessed quality - Part 1: Genericspecification |
| IEC 61178-3:1993 | Quartz crystal units - A specification in the IEC Quality Assessment System for Electronic Components (IECQ) - Part 3: Sectional specification - Qualification approval |
| HD 60027-2 : 200S1 | LETTER SYMBOLS TO BE USED IN ELECTRICAL TECHNOLOGY - PART 2: TELECOMMUNICATIONS AND ELECTRONICS |
| IEC 61178-2-1:1993 | Quartz crystal units - A specification in the IEC Quality Assessment System for Electronic Components (IECQ) - Part 2: Sectional specification - Capability approval - Section 1: Blank detail specification |
| IEC 60679-4:1997 | Quartz crystal controlled oscillators of assessed quality - Part 4: Sectional Specification - Capability approval |
| BS EN 60679-4:1998 | Quartz crystal controlled oscillators of assessed quality Sectional specification. Capability approval |
| NFC 03 002 : 2002 | LETTER SYMBOLS TO BE USED IN ELECTRICAL TECHNOLOGY - PART 2: TELECOMMUNICATIONS AND ELECTRONICS |
| IEC 60368-4:2000 | Piezoelectric filters of assessed quality - Part 4 : Sectional specification - Capability approval |
| EN 60679-4:1998 | Quartz crystal controlled oscillators of assessed quality - Part 4: Sectional specification - Capability approval |
| EN 60368-1:2000/A1:2004 | PIEZOELECTRIC FILTERS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION |
| EN 60368-4:2000 | Piezoelectric filters of assessed quality - Part 4: Sectional specification - Capability approval |
| IEC 60068-1:2013 | Environmental testing - Part 1: General and guidance |
| IEC 60068-2-27:2008 | Environmental testing - Part 2-27: Tests - Test Ea and guidance: Shock |
| IEC 60068-2-20:2008 | Environmental testing - Part 2-20: Tests - Test T: Test methods for solderability and resistance to soldering heat of devices with leads |
| IEC 60122-3:2010 | Quartz crystal units of assessed quality - Part 3: Standard outlines and lead connections |
| IEC 60068-2-21:2006 | Environmental testing - Part 2-21: Tests - Test U: Robustness of terminations and integral mounting devices |
| IEC 60444-2:1980 | Measurement of quartz crystal unit parameters by zero phase technique in a pi-network. Part 2: Phase offset method for measurement of motional capacitance of quartz crystal units |
| IEC 61178-3:1993 | Quartz crystal units - A specification in the IEC Quality Assessment System for Electronic Components (IECQ) - Part 3: Sectional specification - Qualification approval |
| IEC TR 60444-4:1988 | Measurement of quartz crystal unit parameters by zero phase technique in a pi-network. Part 4: Method for the measurement of the load resonance frequency fL, load resonance resistance RL and the calculation of other derived values of quartz crystal units, up to 30 MHz |
| IEC 60410:1973 | Sampling plans and procedures for inspection by attributes |
| IEC 60068-2-3:1969 | Basic environmental testing procedures - Part 2-3: Tests - Test Ca: Damp heat, steady state |
| IEC GUIDE 102:1996 | Electronic components - Specification structures for quality assessment (Qualification approval and capability approval) |
| IEC 60068-2-17:1994 | Basic environmental testing procedures - Part 2-17: Tests - Test Q: Sealing |
| IEC 60068-2-2:2007 | Environmental testing - Part 2-2: Tests - Test B: Dry heat |
| IEC 60068-2-29:1987 | Environmental testing. Part 2: Tests. Test Eb and guidance: Bump |
| IEC 61178-2:1993 | Quartz crystal units - A specification in the IEC Quality Assessment System for Electronic Components (IECQ) - Part 2: Sectional specification - Capability approval |
| IEC 60302:1969 | Standard definitions and methods of measurement for piezoelectric vibrators operating over the frequency range up to 30 MHz |
| IEC 60068-2-1:2007 | Environmental testing - Part 2-1: Tests - Test A: Cold |
| IEC 60068-2-14:2009 | Environmental testing - Part 2-14: Tests - Test N: Change of temperature |
| IEC 60068-2-30:2005 | Environmental testing - Part 2-30: Tests - Test Db: Damp heat, cyclic (12 h + 12 h cycle) |
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