IEC 62215-3:2013
Current
The latest, up-to-date edition.
Integrated circuits - Measurement of impulse immunity - Part 3: Non-synchronous transient injection method
Hardcopy , PDF , PDF 3 Users , PDF 5 Users , PDF 9 Users
English - French
17-07-2013
IEC 62215-3:2013 specifies a method for measuring the immunity of an integrated circuit (IC) to standardized conducted electrical transient disturbances. The disturbances, not necessarily synchronized to the operation of the device under test (DUT), are applied to the IC pins via coupling networks. This method enables understanding and classification of interaction between conducted transient disturbances and performance degradation induced in ICs regardless of transients within or beyond the specified operating voltage range.
Access your standards online with a subscription
Features
-
Simple online access to standards, technical information and regulations.
-
Critical updates of standards and customisable alerts and notifications.
-
Multi-user online standards collection: secure, flexible and cost effective.