IEC 62276:2016
Current
The latest, up-to-date edition.
Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods
Hardcopy , PDF , PDF 3 Users , PDF 5 Users , PDF 9 Users
English, English - French
24-10-2016
FOREWORD
INTRODUCTION
1 Scope
2 Normative references
3 Terms and definitions
4 Requirements
5 Sampling plan
6 Test methods
7 Identification, labelling, packaging, delivery condition
8 Measurement of Curie temperature
9 Measurement of lattice constant (Bond method)
10 Measurement of face angle by X-ray
11 Measurement of bulk resistivity
12 Visual inspections - Front surface inspection method
Annex A (normative) - Expression using Euler angle description
for piezoelectric single crystals
Annex B (informative) - Manufacturing process for SAW wafers
Bibliography
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