BS CECC 90000:1991
Superseded
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
View Superseded by
Harmonized system of quality assessment for electronic components. Generic specification: monolithic integrated circuits
Available format(s)
Hardcopy , PDF
Superseded date
15-03-1996
Superseded by
Language(s)
English
Published date
29-03-1991
Publisher
Important note : Users cannot be edited or removed once added to your Multi user PDF.Specifies the terms, definitions, symbols, test methods and other material for monolithic integrated circuits necessary to prepare appropriate detail specifications in the CECC system.
| Committee |
EPL/47
|
| DevelopmentNote |
Inactive for the new design. Superseded by BS EN 190000 but remains current due to existing approvals. Supersedes BS CECC90000(1985) & BS CECC90000:ADD1(1983) which remain current due to existing approvals. Supersedes 89/28880 DC, 89/28883 DC, 89/30237 DC, 90/20593 DC, 90/20594 DC, 90/24712 DC & 90/33496 DC (05/2005)
|
| DocumentType |
Standard
|
| Pages |
134
|
| PublisherName |
British Standards Institution
|
| Status |
Superseded
|
| SupersededBy | |
| Supersedes |
| Standards | Relationship |
| CECC 90000 : 90 AMD 1 | Identical |
| BS CECC 90103:1983 | Specification for harmonized system of quality assessment for electronic components. Family specification: digital integrated TTL low power SCHOTTKY circuits, series 54LS, 64LS, 74LS, 84LS |
| BS CECC 90101:1980 | Specification for harmonized system of quality assessment for electronic components. Family specification: digital integrated TTL circuits, series 54, 64, 74, 84 |
| BS CECC 90200:1988 | Harmonized system of quality assessment for electronic components: sectional specification: analogue monolithic integrated circuits |
| BS CECC 90114:1990 | Specification for harmonized system of quality assessment for electronic components. Blank detail specification: programmable logic arrays (PLA) |
| BS CECC 90201:1984 | Specification for harmonized system of quality assessment for electronic components. Blank detail specification: integrated voltage regulators |
| BS CECC 90115:1994 | Specification for harmonized system of quality assessment for electronic components. Blank detail specification: digital gate array integrated circuits |
| BS EN 190103:1994 | Specification for harmonized system of quality assessment for electronic components. Family specification: digital integrated TTL low power SCHOTTKY, circuits, series 54LS, 64LS, 74LS, 84LS |
| BS CECC 90300:1988 | Harmonized system of quality assessment for electronic components. Sectional specification: interface monolithic integrated circuits |
| BS CECC 90302:1986 | Specification for harmonized system of quality assessment for electronic components. Blank detail specification: integrated voltage comparators |
| BS CECC 90104:1981 | Specification for harmonized system of quality assessment for electronic components. Family specification: C. Mos digital integrated circuits, series 4000B and 4000UB |
| BS CECC 90104:1990 | Specification for harmonized system of quality assessment for electronic components. Family specification: C. MOS digital integrated circuits series 4000 B and 4000 UB |
| BS EN 190101:1994 | Specification for harmonized system of quality assessment for electronic components. Family specification: digital integrated TTL circuits series 54, 64, 74, 84 |
| BS CECC 90201:1990 | Specification for harmonized system of quality assessment for electronic components. Blank detail specification: integrated voltage regulators |
| BS CECC 90103:1980 | Specification for harmonized system of quality assessment for electronic components. Family specification: digital integrated TTL low power SCHOTTKY circuits, series 54LS, 64LS, 74LS, 84LS |
| BS CECC 90111:1987 | Specification for harmonized system of quality assessment for electronic components. Blank detail specification. MOS read/write static memories silicon monolithic circuits |
| BS CECC 90112:1987 | Specification for harmonized system of quality assessment for electronic components. Blank detail specification. MOS read/write dynamic memories silicon monolithic circuits |
| BS CECC 90203:1985 | Specification for harmonized system of quality assessment for electronic components. Blank detail specification: integrated analogue switching circuits |
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| BS CECC 90202:1990 | Specification for harmonized system of quality assessment for electronic components. Blank detail specification: integrated operational amplifiers |
| BS CECC 90301:1985 | Specification for harmonized system of quality assessment for electronic components. Blank detail specification: integrated line transmitters and receivers |
| BS CECC 90113:1987 | Specification for harmonized system of quality assessment for electronic components. Blank detail specification. MOS ultra-violet light erasable electrically programmable read only memories silicon monolithic circuits |
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| BS 6493-2.1:1985 | Semiconductor devices. Integrated circuits General |
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| BS 6493-3:1985 | Semiconductor devices Mechanical and climatic test methods |
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| BS CECC 00012:1985 | Harmonized system of quality assessment for electronic components: basic specification: radiographic inspection of electronic components |
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| ISO 2015:1976 | Numbering of weeks |
| CECC 00200 : 2002 | REGISTER OF FIRMS, PRODUCTS AND SERVICES APPROVED UNDER CECC CERTIFICATION SYSTEM FOR ELECTRONIC COMPONENTS |
| BS 3934:1965 | Specification for dimensions of semiconductor devices and integrated electronic circuits |
| BS 2011(1967) : LATEST | |
| BS 6493-2.3:1987 | Semiconductor devices. Integrated circuits Recommendations for analogue integrated circuits |
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