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BS EN 61643-341:2001

Superseded

Superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

View Superseded by

Low voltage surge protective devices Specification for thyristor surge suppressors (TSS)

Available format(s)

Hardcopy , PDF

Superseded date

10-07-2020

Superseded by

BS EN IEC 61643-341:2020

Language(s)

English

Published date

15-03-2002

€322.53
Excluding VAT

Committee
PEL/37
DevelopmentNote
Supersedes 01/203912 DC (05/2002)
DocumentType
Standard
Pages
68
PublisherName
British Standards Institution
Status
Superseded
SupersededBy
Supersedes

Is a test specification standard for thyristor surge suppressor (TSS) components designed to limit overvoltages and divert surge currents by clipping and crowbarring actions. Such components are used in the construction of surge protective devices, particularly as they apply to telecommunications. This standard contains information on -terms, letter symbols, and definitions -basic functions, configurations and component structure -service conditions and fault modes -rating verification and characteristic measurement.

Standards Relationship
NF EN 61643-341 : 2002 Identical
IEC 61643-341:2001 Identical
NBN EN 61643-341 : 2003 Identical
I.S. EN 61643-341:2002 Identical
DIN EN 61643-341 : 2002 Identical
UNE-EN 61643-341:2003 Identical
EN 61643-341:2001 Identical

IEC 60050-702:1992 International Electrotechnical Vocabulary (IEV) - Part 702: Oscillations, signals and related devices
IEC 60721-3-9:1993 Classification of environmental conditions - Part 3: Classification of groups of environmental parameters and their severities - Section 9: Microclimates inside products
IEC 60099-4:2014 Surge arresters - Part 4: Metal-oxide surge arresters without gaps for a.c. systems
EN 60721-3-9:1993/A1:1995 CLASSIFICATION OF ENVIRONMENTAL CONDITIONS - PART 3: CLASSIFICATION OF GROUPS OF ENVIRONMENTAL PARAMETERS AND THEIR SEVERITIES - SECTION 9: MICROCLIMATES INSIDE PRODUCTS
EN 60749 : 99 AMD 2 2001 SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS
EN 60099-4:2014 Surge arresters - Part 4: Metal-oxide surge arresters without gaps for a.c. systems
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IEC 60747-1:2006+AMD1:2010 CSV Semiconductor devices - Part 1: General
IEC 60749:1996+AMD1:2000+AMD2:2001 CSV Semiconductor devices - Mechanical and climatic test methods
IEC 60721-3-3:1994+AMD1:1995+AMD2:1996 CSV Classification of environmental conditions - Part 3-3: Classification of groups of environmental parameters and their severities - Stationary use at weatherprotected locations
IEC 60747-6:2016 Semiconductor devices - Part 6: Discrete devices - Thyristors
IEC 61083-1:2001 Instruments and software used for measurement in high-voltage impulse tests - Part 1: Requirements for instruments
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EN 60721-3-3 : 95 AMD 2 97 CLASSIFICATION OF ENVIRONMENTAL CONDITIONS - CLASSIFICATION OF GROUPS OF ENVIRONMENTAL PARAMETERS AND THEIR SEVERITIES - STATIONARY USE AT WEATHER-PROTECTED LOCATIONS

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