BS EN 61747-10-1:2013
Current
The latest, up-to-date edition.
Liquid crystal display devices Environmental, endurance and mechanical test methods. Mechanical
Hardcopy , PDF
English
31-10-2013
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1 Scope
2 Normative references
3 Terms, definitions and letter symbols
4 Standard atmospheric conditions for
measurements and tests
5 Test methods
Bibliography
Annex ZA (normative) - Normative references to
international publications with their
corresponding European publications
Defines uniform preferred test methods with preferred values for stress levels for judging the mechanical properties of liquid crystal display devices.
| Committee |
EPL/100
|
| DevelopmentNote |
Partially supersedes BS EN 61747-5. Supersedes 11/30252972 DC. (10/2013)
|
| DocumentType |
Standard
|
| Pages |
16
|
| PublisherName |
British Standards Institution
|
| Status |
Current
|
| Supersedes |
This part of IEC 61747 lists test methods applicable to liquid crystal display devices. It takes into account, wherever possible, the mechanical robustness test methods as outlined in IEC 60068.
NOTE Devices include cells and modules.
The object of this standard is to establish uniform preferred test methods with preferred values for stress levels for judging the mechanical properties of liquid crystal display devices.
In case of contradiction between this standard and a relevant specification, it is the latter that should govern.
| Standards | Relationship |
| EN 61747-10-1:2013 | Identical |
| IEC 61747-10-1:2013 | Identical |
| IEC 61747-1:1998+AMD1:2003 CSV | Liquid crystal and solid-state display devices - Part 1: Generic specification |
| IEC 60068-1:2013 | Environmental testing - Part 1: General and guidance |
| IEC 60068-2-27:2008 | Environmental testing - Part 2-27: Tests - Test Ea and guidance: Shock |
| IEC 60068-2-20:2008 | Environmental testing - Part 2-20: Tests - Test T: Test methods for solderability and resistance to soldering heat of devices with leads |
| EN 60068-2-20:2008 | Environmental testing - Part 2-20: Tests - Test T: Test methods for solderability and resistance to soldering heat of devices with leads |
| IEC 60068-2-21:2006 | Environmental testing - Part 2-21: Tests - Test U: Robustness of terminations and integral mounting devices |
| EN 61747-1:1999/A1:2003 | LIQUID CRYSTAL AND SOLID-STATE DISPLAY DEVICES - PART 1: GENERIC SPECIFICATION |
| EN 60068-2-7:1993 | Environmental testing - Part 2: Tests - Test Ga: Acceleration, steady state |
| EN 60068-2-27:2009 | Environmental testing - Part 2-27: Tests - Test Ea and guidance: Shock |
| EN 60068-2-21:2006 | Environmental testing - Part 2-21: Tests - Test U: Robustness of terminations and integral mounting devices |
| EN 60068-2-6:2008 | Environmental testing - Part 2-6: Tests - Test Fc: Vibration (sinusoidal) |
| IEC 61747-5-3:2009 | Liquid crystal display devices - Part 5-3: Environmental, endurance and mechanical test methods - Glass strength and reliability |
| IEC 60749-14:2003 | Semiconductor devices - Mechanical and climatic test methods - Part 14: Robustness of terminations (lead integrity) |
| EN 60749-14:2003 | Semiconductor devices - Mechanical and climatic test methods - Part 14: Robustness of terminations (lead integrity) |
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