BS EN 62149-2:2014
Current
The latest, up-to-date edition.
Fibre optic active components and devices. Performance standards 850 nm discrete vertical cavity surface emitting laser devices
Hardcopy , PDF
English
31-08-2014
INTRODUCTION
1 Scope
2 Normative references
3 Terms, definitions, symbols
and abbreviations
4 Product parameters
5 Testing
6 Environmental specifications
Annex A (normative) - Specifications for multimode 850-nm
VCSEL device without a monitor photodiode (Case a)
Annex B (normative) - Specifications for multimode 850 nm
VCSEL device with a monitor photodiode (Case b)
Bibliography
Annex ZA (normative) - Normative references to
international publications with their
corresponding European publications
Defines the performance specification for 850-nm discrete vertical cavity surface emitting laser (VCSEL) devices of transverse multimode types used for the fibre optic telecommunication and optical data transmission applications.
Committee |
GEL/86/3
|
DevelopmentNote |
Supersedes 07/30167056 DC. (01/2010) Supersedes 13/30277888 DC. (08/2014)
|
DocumentType |
Standard
|
Pages |
26
|
PublisherName |
British Standards Institution
|
Status |
Current
|
Supersedes |
IEC 62149-2:2014 covers the performance specification for 850-nm discrete vertical cavity surface emitting laser (VCSEL) devices of transverse multimode types used for fibre optic telecommunication and optical data transmission applications. The performance standard contains a definition of the product performance requirements together with a series of sets of tests and measurements with clearly defined conditions, severities, and pass/fail criteria. The tests are intended to be run on a \'once-off\' basis to prove any product\'s ability to satisfy the performance standard\'s requirements. This second edition cancels and replaces the first edition published in 2009 and constitutes a technical revision. The significant technical changes with respect to the previous edition include the introduction of the performance standards for 10 Gbit/s 850-nm wavelength, vertical cavity surface emitting laser (VCSEL) devices and the deletion of the package diagrams and pin configurations in Clause A.4 and Clause B.4 by citing the VCSEL package standard IEC 62148-15 instead. Keywords: 850-nm discrete vertical cavity surface emitting laser (VCSEL) devices, transverse multimode types
Standards | Relationship |
IEC 62149-2:2014 | Identical |
EN 62149-2:2014 | Identical |
IEC 60950-1:2005+AMD1:2009+AMD2:2013 CSV | Information technology equipment - Safety - Part 1: General requirements |
IEC 62148-15:2014 | Fibre optic active components and devices - Package and interface standards - Part 15: Discrete vertical cavity surface emitting laser packages |
IEC GUIDE 107:2014 | Electromagnetic compatibility - Guide to the drafting of electromagnetic compatibility publications |
IEC 61280-1-3:2010 | Fibre optic communication subsystem test procedures - Part 1-3: General communication subsystems - Central wavelength and spectral width measurement |
EN 60825-1:2014/AC:2017-06 | SAFETY OF LASER PRODUCTS - PART 1: EQUIPMENT CLASSIFICATION AND REQUIREMENTS (IEC 60825-1:2014) |
IEC 62007-1:2015 | Semiconductor optoelectronic devices for fibre optic system applications - Part 1: Specification template for essential ratings and characteristics |
IEC 60749-25:2003 | Semiconductor devices - Mechanical and climatic test methods - Part 25: Temperature cycling |
IEC 61300-2-48:2009 | Fibre optic interconnecting devices and passive components - Basic test and measurement procedures - Part 2-48: Tests - Temperature-humidity cycling |
IEC 60749-11:2002 | Semiconductor devices - Mechanical and climatic test methods - Part 11: Rapid change of temperature - Two-fluid-bath method |
EN 60950-1:2006/A2:2013 | INFORMATION TECHNOLOGY EQUIPMENT - SAFETY - PART 1: GENERAL REQUIREMENTS (IEC 60950-1:2005/A2:2013, MODIFIED) |
EN 62148-15:2014 | Fibre optic active components and devices - Package and interface standards - Part 15: Discrete vertical cavity surface emitting laser packages |
IEC 60825-1:2014 | Safety of laser products - Part 1: Equipment classification and requirements |
IEC 62007-2:2009 | Semiconductor optoelectronic devices for fibre optic system applications - Part 2: Measuring methods |
EN 60749-11:2002 | Semiconductor devices - Mechanical and climatic test methods - Part 11: Rapid change of temperature - Two-fluid-bath method |
IEC 60749-26:2013 | Semiconductor devices - Mechanical and climatic test methods - Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM) |
EN 60749-10:2002 | Semiconductor devices - Mechanical and climatic test methods - Part 10: Mechanical shock |
IEC 60749-7:2011 | Semiconductor devices - Mechanical and climatic test methods - Part 7: Internal moisture content measurement and the analysis of other residual gases |
EN 61300-2-4:1997 | Fibre optic interconnecting devices and passive components - Basic test and measurement procedures - Part 2-4: Tests - Fibre/cable retention |
IEC 60749-6:2017 | Semiconductor devices - Mechanical and climatic test methods - Part 6: Storage at high temperature |
IEC 62148-1:2017 | Fibre optic active components and devices - Package and interface standards - Part 1: General and guidance |
EN 60749-7:2011 | Semiconductor devices - Mechanical and climatic test methods - Part 7: Internal moisture content measurement and the analysis of other residual gases |
EN 60749-6:2017 | Semiconductor devices - Mechanical and climatic test methods - Part 6: Storage at high temperature |
EN 60749-26:2014 | Semiconductor devices - Mechanical and climatic test methods - Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM) |
IEC 60747-5-1:1997+AMD1:2001+AMD2:2002 CSV | Discrete semiconductor devices and integrated circuits - Part 5-1: Optoelectronic devices - General |
IEC 61300-2-4:1995 | Fibre optic interconnecting devices and passive components - Basic test and measurement procedures - Part 2-4: Tests - Fibre/cable retention |
IEC 60749-10:2002 | Semiconductor devices - Mechanical and climatic test methods - Part 10: Mechanical shock |
EN 60749-25:2003 | Semiconductor devices - Mechanical and climatic test methods - Part 25: Temperature cycling |
IEC 62149-1:2011 | Fibre optic active components and devices - Performance standards - Part 1: General and guidance |
IEC 61300-2-19:2012 | Fibre optic interconnecting devices and passive components - Basic test and measurement procedures - Part 2-19: Tests - Damp heat (steady state) |
EN 61300-2-19:2013 | Fibre optic interconnecting devices and passive components - Basic test and measurement procedures - Part 2-19: Tests - Damp heat (steady state) |
IEC 60749-12:2002 | Semiconductor devices - Mechanical and climatic test methods - Part 12: Vibration, variable frequency |
EN 61300-2-48:2009 | Fibre optic interconnecting devices and passive components - Basic test and measurement procedures - Part 2-48: Tests - Temperature-humidity cycling |
EN 60749-12:2002 | Semiconductor devices - Mechanical and climatic test methods - Part 12: Vibration, variable frequency |
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