BS IEC 60747-14-4:2011
Current
The latest, up-to-date edition.
Semiconductor devices. Discrete devices Semiconductor accelerometers
Hardcopy , PDF
English
28-02-2011
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INTRODUCTION
1 Scope
2 Normative references
3 Terminology and letter symbols
4 Essential ratings and characteristics
5 Measuring methods
6 Acceptance and reliability
Annex A (informative) - Definition of sensitivity matrix
of an accelerometer
Annex B (informative) - Dynamic linearity measurement
using an impact acceleration generator
Annex C (informative) - Measurement of peak sensitivity
Bibliography
Applicable to semiconductor accelerometers for all types of products.
| Committee |
EPL/47
|
| DevelopmentNote |
Supersedes 05/30137514 DC. (02/2011)
|
| DocumentType |
Standard
|
| Pages |
102
|
| PublisherName |
British Standards Institution
|
| Status |
Current
|
| Supersedes |
IEC 60747-14-4:2011 applies to semiconductor accelerometers for all types of products. This standard applies not only to typical semiconductor accelerometers with built-in electric circuits, but also to semiconductor accelerometers accompanied by external circuits. This standard does not (or should not) violate (or interfere with) the agreement between customers and suppliers in terms of a new model or parameters for business.
NOTE 1: This standard, although directed toward semiconductor accelerometers, may be applied in whole or in part to any mass produced type of accelerometer.
NOTE 2: The purpose of this standard is to allow for a systematic description, which covers the subjects initiated by the advent of semiconductor accelerometers. The tasks imposed on the semiconductor accelerometers are not only common to all accelerometers but also inherent to them and not yet totally solved. The descriptions are based on latest research results. One typical example is the multi-axis accelerometer. This standard states the method of measuring acceleration as a vector quantity using multi-axis accelerometers.
NOTE 3: This standard does not conflict in any way with any existing parts of either ISO 16063 or ISO 5347. This standard intends to provide the concepts and the procedures of calibration of the semiconductor multi-axis accelerometers which are used not only for the measurement of acceleration but also for the control of motion in the wide frequencies ranging from DC.
This publication is to be read in conjunction with IEC 60747-1:2006.
| Standards | Relationship |
| IEC 60747-14-4:2011 | Identical |
| ISO/IEC 17025:2005 | General requirements for the competence of testing and calibration laboratories |
| IEC 60749-25:2003 | Semiconductor devices - Mechanical and climatic test methods - Part 25: Temperature cycling |
| IEC 60749-5:2017 | Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test |
| IEC 60749-1:2002 | Semiconductor devices - Mechanical and climatic test methods - Part 1: General |
| IEC 60749-11:2002 | Semiconductor devices - Mechanical and climatic test methods - Part 11: Rapid change of temperature - Two-fluid-bath method |
| IEC 61000-4-4:2012 RLV | Electromagnetic compatibility (EMC) - Part 4-4: Testing and measurement techniques - Electrical fast transient/burst immunity test |
| ISO/IEC Guide 99:2007 | International vocabulary of metrology Basic and general concepts and associated terms (VIM) |
| ISO 2041:2009 | Mechanical vibration, shock and condition monitoring Vocabulary |
| IEC 61000-4-2:2008 | Electromagnetic compatibility (EMC) - Part 4-2: Testing and measurement techniques - Electrostatic discharge immunity test |
| IEC 61000-4-3:2006+AMD1:2007+AMD2:2010 CSV | Electromagnetic compatibility (EMC) - Part 4-3: Testing and measurement techniques - Radiated, radio-frequency, electromagnetic field immunity test |
| IEC 60747-1:2006+AMD1:2010 CSV | Semiconductor devices - Part 1: General |
| ISO 8041:2005 | Human response to vibration Measuring instrumentation |
| IEC 60749-13:2002 | Semiconductor devices - Mechanical and climatic test methods - Part 13: Salt atmosphere |
| IEC 60749-6:2017 | Semiconductor devices - Mechanical and climatic test methods - Part 6: Storage at high temperature |
| IEC 60749-10:2002 | Semiconductor devices - Mechanical and climatic test methods - Part 10: Mechanical shock |
| ISO 5347-11:1993 | Methods for the calibration of vibration and shock pick-ups Part 11: Testing of transverse vibration sensitivity |
| IEC 60749-12:2002 | Semiconductor devices - Mechanical and climatic test methods - Part 12: Vibration, variable frequency |
| ISO/IEC Guide 98-3:2008 | Uncertainty of measurement — Part 3: Guide to the expression of uncertainty in measurement (GUM:1995) |
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