• CEI CLC/TS 50466 : 2006

    Current The latest, up-to-date edition.

    LONG DURATION STORAGE OF ELECTRONIC COMPONENTS - SPECIFICATION FOR IMPLEMENTATION

    Available format(s):  Hardcopy, PDF

    Language(s):  English

    Published date:  01-01-2006

    Publisher:  Comitato Elettrotecnico Italiano

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    Table of Contents - (Show below) - (Hide below)

    1 General
    2 Normative references
    3 Storage decision criteria
    4 Purchasing procurement
    5 Technical validation of the components
    6 Conditioning and storage
    7 Periodic check of the components
    8 De-stocking
    9 Feedfback
    Annex A - Example related to components
    Annex B - Examples of periodic and/or destocking tests
    Annex C - Parameters influencing the final price of the
              component storage
    Annex D - Parameters influencing the quantity of the
              components to be stored
    Annex E - Failure mechanisms - Hermetically encapsulated
              and non-encapsulated active components
    Annex F - Failure mechanisms: GaAs components
    Bibliography

    Abstract - (Show below) - (Hide below)

    Specifies implementation of long duration storage of electronic components.

    General Product Information - (Show below) - (Hide below)

    Committee CT 309
    Document Type Standard
    Publisher Comitato Elettrotecnico Italiano
    Status Current

    Standards Referencing This Book - (Show below) - (Hide below)

    HD 323.2.20 : 200S3 BASIC ENVIRONMENTAL TESTING PROCEDURES - TESTS - TEST T - SOLDERING
    IEC 60068-2-20:2008 Environmental testing - Part 2-20: Tests - Test T: Test methods for solderability and resistance to soldering heat of devices with leads
    IEC TS 61340-5-2:1999 Electrostatics - Part 5-2: Protection of electronic devices from electrostatic phenomena - User guide
    IEC TR 62380:2004 Reliability data handbook - Universal model for reliability prediction of electronics components, PCBs and equipment
    IEC 60410:1973 Sampling plans and procedures for inspection by attributes
    IEC TS 61945:2000 Interated circuits - Manufacturing line approval - Methodology for technology and failure analysis
    EN 60068-2-17 : 1994 BASIC ENVIRONMENTAL TESTING - TEST Q: SEALING
    IEC 60068-2-17:1994 Basic environmental testing procedures - Part 2-17: Tests - Test Q: Sealing
    IEC TR 62258-3:2010 Semiconductor die products - Part 3: Recommendations for good practice in handling, packing and storage
    EN 190000 : 1995 GENERIC SPECIFICATION: MONOLITHIC INTEGRATED CIRCUITS
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