• IEC PAS 62435:2005

    Superseded A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

    Electronic components - Long-duration storage of electronic components - Guidance for implementation

    Available format(s):  Hardcopy, PDF

    Superseded date:  20-01-2017

    Language(s):  English

    Published date:  26-09-2005

    Publisher:  International Electrotechnical Committee

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    Table of Contents - (Show below) - (Hide below)

    FOREWORD
    INTRODUCTION
    1 Scope
    2 Normative references
    3 Storage decision criteria
      3.1 Advantages
          3.1.1 Technical simplicity - Rapidity
          3.1.2 Solution durability
          3.1.3 Preventive storage
      3.2 Hazards - Drawbacks
          3.2.1 Generic aging hazard
          3.2.2 Poor stock dimensioning
          3.2.3 Incorrect control of reliability during storage
          3.2.4 Freezing equipment functionalities
      3.3 Storage cost
      3.4 Decision criteria
    4 Purchasing - Procurement
      4.1 List of components
      4.2 Quantity of components to be stored
          4.2.1 Production stock
          4.2.2 Field service stock
      4.3 When is it worth keeping in stock?
      4.4 Procurement recommendations
    5 Technical validation of the components
      5.1 Purpose
      5.2 Relevant field
      5.3 Test selection criteria
      5.4 Measurements and tests
          5.4.1 Sampling
          5.4.2 Visual examination, sealing, solderability
          5.4.3 Compliance with the electrical specifications
          5.4.4 Assessment of the supplied batch reliability
          5.4.5 Manufacturing control check (technological analysis)
      5.5 Sanction
    6 Conditioning and storage
      6.1 Type of environment
      6.2 Elementary storage unit
      6.3 Stock management
      6.4 Redundancy
      6.5 Identification - Traceability
      6.6 Initial packaging
      6.7 Stabilization bake
      6.8 Storage conditions
          6.8.1 Storage area
          6.8.2 Temperature
          6.8.3 Temperature variations
          6.8.4 Relative humidity - Chemical attacks - Contamination
          6.8.5 Pressure
          6.8.6 Electrostatic discharges
          6.8.7 Vibration - Mechanical impacts
          6.8.8 Electromagnetic field - Radiation
          6.8.9 Light
      6.9 Maintaining storage conditions
    7 Periodic check of the components
      7.1 Objectives
      7.2 Periodicity
      7.3 Tests during periodic check
    8 Destocking
      8.1 Precautions
          8.1.1 Electrostatic discharges
          8.1.2 Mechanical impacts
      8.2 Inspection
    9 Feedback
    Annex A (informative) Example of a component list
    Annex B (informative) Examples of periodic and/or destocking
                          tests (1/3)
    Annex C (informative) Parameters influencing the final price
                          of the component storage
    Annex D (informative) Parameters influencing the quantity of
                          components to be stored
    Annex E (normative) Failure mechanisms: Encapsulated and
                        non-encapsulated active components
    Annex F (normative) Failure mechanisms: GaAs components

    Abstract - (Show below) - (Hide below)

    This PAS applies to the long-duration storage of electronic components.Although it has always existed to some extent, obsolescence of electronic components, and particularly integrated circuits, has become increasingly intense over the last few years. Indeed, with the existing technological boom, the commercial life of a component has become very short compared with the life of industrial equipment such as those encountered in the aeronautical field, the railway industry or the energy sector.The many solutions enabling obsolescence to be resolved are now identified. However, selecting one of these solutions must be preceded by a case-by-case technical and economic feasibility study, depending on whether storage is envisaged for field service or production, for example: - remedial storage as soon as components are no longer marketed- preventive storage anticipating declaration of obsolescenceTaking into account the expected life of some installations, sometimes covering several decades, the qualification times, and the unavailability costs, which can also be very high, the solution to be adopted to resolve obsolescence must often be rapidly implemented. This is why the solution retained in most cases consists in systematically storing components which are in the process of becoming obsolescent.The technical risks of this solution are, a priori, fairly low. However, it requires the perfect mastery of the implemented process, and especially of the storage environment, although this mastery becomes critical when it comes to long-term storage. All handling, protection, storage and test operations must be performed according to the state of the art.

    General Product Information - (Show below) - (Hide below)

    Development Note Stability Date: 2015. (10/2012)
    Document Type Miscellaneous Product
    Publisher International Electrotechnical Committee
    Status Superseded

    Standards Referenced By This Book - (Show below) - (Hide below)

    IEC TS 62668-1:2016 Process management for avionics - Counterfeit prevention - Part 1: Avoiding the use of counterfeit, fraudulent and recycled electronic components
    IEC 61709:2017 RLV Electric components - Reliability - Reference conditions for failure rates and stress models for conversion
    EN 62550:2017 Spare parts provisioning
    CLC/TS 50466:2006 Long duration storage of electronic components - Specification for implementation
    PD IEC/TS 62668-1:2016 Process management for avionics. Counterfeit prevention Avoiding the use of counterfeit, fraudulent and recycled electronic components
    BS EN 62550:2017 Spare parts provisioning
    PD IEC/TS 62668-2:2016 Process management for avionics. Counterfeit prevention Managing electronic components from non-franchised sources
    I.S. EN 61709:2017 ELECTRIC COMPONENTS - RELIABILITY - REFERENCE CONDITIONS FOR FAILURE RATES AND STRESS MODELS FOR CONVERSION
    DD CLC/TS 50466:2006 Long duration storage of electronic components. Specification for implementation
    EN 61709:2017 Electric components - Reliability - Reference conditions for failure rates and stress models for conversion
    BS EN 61709:2017 Electric components. Reliability. Reference conditions for failure rates and stress models for conversion
    IEC TS 62668-2:2016 Process management for avionics - Counterfeit prevention - Part 2: Managing electronic components from non-franchised sources
    IEC 61709:2017 Electric components - Reliability - Reference conditions for failure rates and stress models for conversion
    IEC 62550:2017 Spare parts provisioning

    Standards Referencing This Book - (Show below) - (Hide below)

    IEC 60068-2-20:2008 Environmental testing - Part 2-20: Tests - Test T: Test methods for solderability and resistance to soldering heat of devices with leads
    IEC TS 61340-5-2:1999 Electrostatics - Part 5-2: Protection of electronic devices from electrostatic phenomena - User guide
    IEC TR 62380:2004 Reliability data handbook - Universal model for reliability prediction of electronics components, PCBs and equipment
    IEC 60410:1973 Sampling plans and procedures for inspection by attributes
    IEC TS 61945:2000 Interated circuits - Manufacturing line approval - Methodology for technology and failure analysis
    IEC 60068-2-17:1994 Basic environmental testing procedures - Part 2-17: Tests - Test Q: Sealing
    AS/NZS IEC 62550:2019 Spare Parts Provisioning
    EN 190000:1995 Generic Specification: Monolithic integrated circuits
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