• CLC/TS 50466:2006

    Current The latest, up-to-date edition.

    Long duration storage of electronic components - Specification for implementation

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    Published date:  12-05-2006

    Publisher:  European Committee for Standards - Electrical

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    Table of Contents - (Show below) - (Hide below)

    1 General
    2 Normative references
    3 Storage decision criteria
      3.1 Advantages of storage
           3.1.1 Technical simplicity - Rapidity
           3.1.2 Solution durability
           3.1.3 Preventive storage
      3.2 Hazards - Drawbacks
           3.2.1 Generic aging hazard
           3.2.2 Poor stock dimensioning
           3.2.3 Incorrect control of reliability during storage
           3.2.4 Freezing equipment functionalities
      3.3 Storage cost (Annex C)
      3.4 Decision criteria
    4 Purchasing procurement
      4.1 List of components
      4.2 Quantity of components to be stored
           4.2.1 Production stock
           4.2.2 Field service stock
      4.3 When is it worth keeping in stock?
      4.4 Procurement recommendations
    5 Technical validation of the components
      5.1 Purpose
      5.2 Relevant field
      5.3 Test selection criteria
      5.4 Measurements and tests
           5.4.1 Sampling
           5.4.2 Visual examination, sealing, solderability
           5.4.3 Compliance with the electrical specifications
                 5.4.3.1 Measurement of electrical parameters
                 5.4.3.2 Temperature impact
           5.4.4 Assessment of the supplied batch reliability
           5.4.5 Manufacturing control check (technological analysis)
      5.5 Sanction
    6 Conditioning and storage
      6.1 Type of environment
      6.2 Elementary storage unit
      6.3 Stock management
      6.4 Redundancy
      6.5 Identification - Traceability
      6.6 Initial packaging
      6.7 Solderability
      6.8 Stabilization bake
      6.9 Storage conditions
           6.9.1 Storage area
           6.9.2 Temperature
           6.9.3 Temperature variations
           6.9.4 Relative humidity - Chemical attacks - Contamination
           6.9.5 Pressure
           6.9.6 Electrostatic discharges
           6.9.7 Vibrations - Mechanical impacts
           6.9.8 Electromagnetic field - Radiation
           6.9.9 Light
      6.10 Maintaining storage conditions
    7 Periodic check of the components
      7.1 Objectives
      7.2 Periodicity
      7.3 Tests during periodic check
    8 De-stocking
      8.1 Precautions
           8.1.1 Electrostatic discharges
           8.1.2 Mechanical impacts
      8.2 Inspection
    9 Feedback
    Annex A - Example related to components
      A.1 Example of a component list
      A.2 Data description
    Annex B - Examples of periodic and/or destocking tests
    Annex C - Parameters influencing the final price of the
              component storage
    Annex D - Parameters influencing the quantity of the
              components to be stored
    Annex E - Failure mechanisms - Hermetically encapsulated and
              non-encapsulated active components
    Annex F - Failure mechanisms: GaAs components
    Bibliography

    Abstract - (Show below) - (Hide below)

    This document, which is in line with IEC/PAS 62435 relating to the management of obsolescence of electronic components, is first of all a practical guide to methods of long duration storage (more than 5 years) which summarizes the existing practices in the industry.

    General Product Information - (Show below) - (Hide below)

    Committee CLC/SR 107
    Document Type Technical Specification
    Publisher European Committee for Standards - Electrical
    Status Current

    Standards Referencing This Book - (Show below) - (Hide below)

    HD 323.2.20 : 200S3 BASIC ENVIRONMENTAL TESTING PROCEDURES - TESTS - TEST T - SOLDERING
    IEC 60068-2-20:2008 Environmental testing - Part 2-20: Tests - Test T: Test methods for solderability and resistance to soldering heat of devices with leads
    IEC PAS 62435:2005 Electronic components - Long-duration storage of electronic components - Guidance for implementation
    IEC TS 61340-5-2:1999 Electrostatics - Part 5-2: Protection of electronic devices from electrostatic phenomena - User guide
    IEC TR 62380:2004 Reliability data handbook - Universal model for reliability prediction of electronics components, PCBs and equipment
    IEC 60410:1973 Sampling plans and procedures for inspection by attributes
    IEC TS 61945:2000 Interated circuits - Manufacturing line approval - Methodology for technology and failure analysis
    EN 60068-2-17 : 1994 BASIC ENVIRONMENTAL TESTING - TEST Q: SEALING
    IEC 60068-2-17:1994 Basic environmental testing procedures - Part 2-17: Tests - Test Q: Sealing
    IEC TR 62258-3:2010 Semiconductor die products - Part 3: Recommendations for good practice in handling, packing and storage
    EN 190000 : 1995 GENERIC SPECIFICATION: MONOLITHIC INTEGRATED CIRCUITS
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