CEI EN 61747-1 : 2004
Current
The latest, up-to-date edition.
LIQUID CRYSTAL AND SOLID-STATE DISPLAY DEVICES - PART 1: GENERIC SPECIFICATION
Hardcopy , PDF
English - Italian
01-01-2004
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1 Scope
2 Normative references
3 Terminology
4 Technical aspects
5 Quality assessment procedures
6 Test and measurement procedures
Annex A (informative) - Cross
references index
Annex B (informative) - Example
of outline drawings
of liquid crystal display
cells
Annex C (normative) - Orientation
of LCD modules
Annex D (normative) - Lot tolerance
percentage defective
(LTPD) sampling plans
Bibliography
Annex ZA (normative) - Normative
references to international
publications with their
corresponding European
publications
Describes liquid crystal and solid-state display devices. It defines general procedures for quality assessment to be used in the IECQ system and gives general rules for measuring methods of electrical and optical characteristics, rules for climatic and mechanical tests, and rules for endurance tests.
| Committee |
CT 309
|
| DevelopmentNote |
Classificazione CEI 47-30 (11/2004)
|
| DocumentType |
Standard
|
| Pages |
86
|
| PublisherName |
Comitato Elettrotecnico Italiano
|
| Status |
Current
|
| Standards | Relationship |
| IEC 61747-1:1998+AMD1:2003 CSV | Identical |
| EN 61747-1:1999/A1:2003 | Identical |
| IEC 60068-1:2013 | Environmental testing - Part 1: General and guidance |
| IEC 60191-1:2007 | Mechanical standardization of semiconductor devices - Part 1: General rules for the preparation of outline drawings of discrete devices |
| ISO 1101:2017 | Geometrical product specifications (GPS) — Geometrical tolerancing — Tolerances of form, orientation, location and run-out |
| EN 60068-1:2014 | Environmental testing - Part 1: General and guidance |
| EN 60749 : 99 AMD 2 2001 | SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS |
| IEC 60747-10:1991 | Semiconductor devices - Part 10: Generic specification for discrete devices and integrated circuits |
| IEC 60191-2:2012 DB | Mechanical standardization of semiconductor devices - Part 2: Dimensions |
| IEC 61747-5:1998 | Liquid crystal and solid-state display devices - Part 5: Environmental, endurance and mechanical test methods |
| IEC 60410:1973 | Sampling plans and procedures for inspection by attributes |
| IEC 60747-1:2006+AMD1:2010 CSV | Semiconductor devices - Part 1: General |
| IEC 60749:1996+AMD1:2000+AMD2:2001 CSV | Semiconductor devices - Mechanical and climatic test methods |
| EN 61747-5:1998 | Liquid crystal and solid-state display devices - Part 5: Environmental, endurance and mechanical test methods |
| IEC 60191-3:1999 | Mechanical standardization of semiconductor devices - Part 3: General rules for the preparation of outline drawings of integrated circuits |
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