I.S. EN 168000:1994
Withdrawn
A Withdrawn Standard is one, which is removed from sale, and its unique number can no longer be used. The Standard can be withdrawn and not replaced, or it can be withdrawn and replaced by a Standard with a different number.
QUARTZ CRYSTAL UNITS (GENERIC SPECIFICATION)
Hardcopy , PDF
02-02-2006
English
18-11-1994
For Harmonized Standards, check the EU site to confirm that the Standard is cited in the Official Journal.
Only cited Standards give presumption of conformance to New Approach Directives/Regulations.
Dates of withdrawal of national standards are available from NSAI.
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FOREWORD
PREFACE
SECTION 1 - SCOPE
SECTION 2 - GENERAL
2.1 Order of precedence
2.2 Related documents
2.3 Units, symbols and terminology
2.4 Preferred ratings and characteristics
2.5 Marking
SECTION 3 - QUALITY ASSESSMENT PROCEDURES
3.1 Primary stage of manufacture
3.2 Structurally similar components
3.3 Subcontracting
3.4 Manufacturer's approval
3.5 Approval procedures
3.6 Procedures for capability approval
3.7 Procedures for qualification approval
3.8 Test procedures
3.9 Screening requirements
3.10 Rework and repair work
3.11 Certified test records
3.12 Delayed delivery
3.13 Release for delivery
3.14 Unchecked parameters
SECTION 4 - TEST AND MEASUREMENT PROCEDURES
4.1 General
4.2 Alternative methods
4.3 Precision of measurement
4.4 Standard conditions for testing
4.5 Visual inspection
4.6 Dimensioning and gauging procedures
4.7 Electrical test procedures
4.7.1 Frequency and resonance resistance
4.7.2 Drive level dependency
4.7.3 Frequency and resonance resistance as a function
of temperature
4.7.4 Unwanted responses
4.7.5 Shunt capacitance
4.7.6 Load resonance frequency and resistance
4.7.7 Frequency pulling range
4.7.8 Motional parameters
4.7.9 Insulation resistance
4.8 Mechanical and environmental test procedures
4.8.1 Robustness of terminations
4.8.2 Sealing tests
4.8.3 Soldering (Solderability and resistance to solder
heat)
4.8.4 Rapid change of temperature, two-fluid-bath method
4.8.5 Rapid change of temperature with prescribed time
of transition
4.8.6 Bump
4.8.7 Vibration
4.8.8 Shock
4.8.9 Free fall
4.8.10 Acceleration, steady state
4.8.11 Dry heat
4.8.12 Damp heat, cyclic
4.8.13 Cold
4.8.14 Climatic sequence
4.8.15 Damp heat steady state
4.8.16 Immersion in cleaning solvents
4.9 Endurance test procedure
4.9.1 Ageing
4.9.2 Extended ageing
4.9.3 Shelf life
Annex A Drive level dependency
Specifies quality assessment and test and measurement procedures for quartz crystal units intended for use in the CECC System of harmonized specifications.
| DocumentType |
Standard
|
| Pages |
51
|
| PublisherName |
National Standards Authority of Ireland
|
| Status |
Withdrawn
|
| Standards | Relationship |
| SN EN 168000 : AMD 2 1998 | Identical |
| DIN EN 168000 : 1993 AMD 2 1998 | Identical |
| EN 168000 : 1993 AMD 2 1998 | Identical |
| NEN EN 168000 : 97 AMD 2 98 | Identical |
| BS EN 168000:1996 | Identical |
| EN 168000 : 1993 AMD 2 1998 | Identical |
| CECC 00109 : 1974 | CECC RULES OF PROCEDURE: RP 9: CERTIFIED TESTS RECORDS |
| CECC 00107(PT3) : 80 AMD 1 | CECC RULES OF PROCEDURE: RP7: QUALITY ASSESSMENT PROCEDURES - PROCEDURE FOR CAPABILITY APPROVAL |
| IEC 60068-1:2013 | Environmental testing - Part 1: General and guidance |
| IEC 60068-2-27:2008 | Environmental testing - Part 2-27: Tests - Test Ea and guidance: Shock |
| IEC 60068-2-20:2008 | Environmental testing - Part 2-20: Tests - Test T: Test methods for solderability and resistance to soldering heat of devices with leads |
| IEC 60122-3:2010 | Quartz crystal units of assessed quality - Part 3: Standard outlines and lead connections |
| IEC 60444-2:1980 | Measurement of quartz crystal unit parameters by zero phase technique in a pi-network. Part 2: Phase offset method for measurement of motional capacitance of quartz crystal units |
| IEC 60068-2-11:1981 | Basic environmental testing procedures - Part 2-11: Tests - Test Ka: Salt mist |
| IEC 60027-1:1992 | Letters symbols to be used in electrical technology - Part 1: General |
| IEC TR 60444-4:1988 | Measurement of quartz crystal unit parameters by zero phase technique in a pi-network. Part 4: Method for the measurement of the load resonance frequency fL, load resonance resistance RL and the calculation of other derived values of quartz crystal units, up to 30 MHz |
| IEC 60410:1973 | Sampling plans and procedures for inspection by attributes |
| IEC 60068-2-3:1969 | Basic environmental testing procedures - Part 2-3: Tests - Test Ca: Damp heat, steady state |
| IEC 60068-2-17:1994 | Basic environmental testing procedures - Part 2-17: Tests - Test Q: Sealing |
| CECC 00107(PT1) : 1982 | CECC RULES OF PROCEDURE: RP7: QUALITY ASSESSMENT PROCEDURES - QUALITY ASSESSMENT PROCEDURE FOR GENERAL USAGE |
| IEC 60068-2-2:2007 | Environmental testing - Part 2-2: Tests - Test B: Dry heat |
| CECC 00111 : 80 AMD 3 | CECC RULES OF PROCEDURE: RP 11: SPECIFICATIONS AND THEIR HARMONIZATION - COMPONENTS FOR GENERAL AND PROFESSIONAL USAGE - COMPONENTS OF ENHANCED ASSESSMENT OF QUALITY |
| IEC 60122-1:2002 | Quartz crystal units of assessed quality - Part 1: Generic specification |
| IEC 60027-2:2005 | Letter symbols to be used in electrical technology - Part 2: Telecommunications and electronics |
| IEC 60068-2-29:1987 | Environmental testing. Part 2: Tests. Test Eb and guidance: Bump |
| IEC 60302:1969 | Standard definitions and methods of measurement for piezoelectric vibrators operating over the frequency range up to 30 MHz |
| IEC 60068-2-1:2007 | Environmental testing - Part 2-1: Tests - Test A: Cold |
| IEC 60068-2-14:2009 | Environmental testing - Part 2-14: Tests - Test N: Change of temperature |
| IEC 60068-2-30:2005 | Environmental testing - Part 2-30: Tests - Test Db: Damp heat, cyclic (12 h + 12 h cycle) |
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