I.S. EN 61967-5:2003
Current
The latest, up-to-date edition.
INTEGRATED CIRCUITS - MEASUREMENT OF ELECTROMAGNETIC EMISSIONS, 150 KHZ TO 1 GHZ - PART 5: MEASUREMENT OF CONDUCTED EMISSIONS - WORKBENCH FARADAY CAGE METHOD
Hardcopy , PDF
English
01-01-2003
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FOREWORD
INTRODUCTION
1 Scope
2 Normative references
3 Definitions
4 General
4.1 Measurement philosophy
4.2 Principle set-up
4.3 Workbench concept
5 Test conditions
6 Test equipment
7 Test set-up
7.1 Shielding and ambient fields
7.2 Workbench set-up
7.3 Connections to the PCB
7.4 Common-mode points
7.4.1 Comparison testing
7.4.2 Definitive application
7.5 Emission limits
7.6 Workbench - Practical implementation
7.7 Test PCB
8 Test procedure
9 Test report
9.1 Emission criteria
9.2 Emission levels
Annex A (normative) - Detail specification of Workbench
Faraday Cage (WBFC)
Annex B (informative) - Common-mode impedances
Annex C (informative) - Derivation of limits
Annex D (informative) - Use of the Workbench
Bibliography
Figures
Tables
Specifies a method to measure the conducted electromagnetic emission of integrated circuits either applied on a standardised test-board or on a final printed circuit board (PCB).
| DevelopmentNote |
For CENELEC adoptions of IEC publications, please check www.iec.ch to be sure that you have any corrigenda that may apply. (01/2017)
|
| DocumentType |
Standard
|
| Pages |
61
|
| PublisherName |
National Standards Authority of Ireland
|
| Status |
Current
|
| Standards | Relationship |
| SN EN 61967-5 : 2003 | Identical |
| DIN EN 61967-5:2003-10 | Identical |
| NF EN 61967-5 : 2003 | Identical |
| NBN EN 61967-5 : 2004 | Identical |
| IEC 61967-5:2003 | Identical |
| EN 61967-5:2003 | Identical |
| BS EN 61967-5:2003 | Identical |
| IEC 61967-2:2005 | Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 2: Measurement of radiated emissions - TEM cell and wideband TEM cell method |
| IEC 60050-131:2002 | International Electrotechnical Vocabulary (IEV) - Part 131: Circuit theory |
| MIL-STD-285 Base Document:1956 | ATTENUATION MEASUREMENTS FOR ENCLOSURES, ELECTROMAGNETIC SHIELDING, FOR ELECTRONIC TEST PURPOSES, METHOD OF |
| IEC 61967-1:2002 | Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 1: General conditions and definitions |
| IEC TS 61967-3:2014 | Integrated circuits - Measurement of electromagnetic emissions - Part 3: Measurement of radiated emissions - Surface scan method |
| EN 61967-1:2002 | Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 1: General conditions and definitions |
| IEC 61967-4:2002+AMD1:2006 CSV | Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 4: Measurement of conducted emissions - 1 Ω/150 Ω direct coupling method |
| CISPR 16-2:2003 | Specification for radio disturbance and immunity measuring apparatus and methods - Part 2: Methods of measurement of disturbances and immunity |
| IEC 61967-6:2002+AMD1:2008 CSV | Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method |
| EN 61000-4-6:2014/AC:2015 | ELECTROMAGNETIC COMPATIBILITY (EMC) - PART 4-6: TESTING AND MEASUREMENT TECHNIQUES - IMMUNITY TO CONDUCTED DISTURBANCES, INDUCED BY RADIO-FREQUENCY FIELDS (IEC 61000-4-6:2013) |
| CISPR 16-1:1999+AMD1:2002 CSV | Specification for radio disturbance and immunity measuring apparatus and methods - Part 1: Radio disturbance and immunity measuring apparatus |
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