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NSAI
I.S. EN 61967-5:2003

I.S. EN 61967-5:2003

Current

Current

The latest, up-to-date edition.

INTEGRATED CIRCUITS - MEASUREMENT OF ELECTROMAGNETIC EMISSIONS, 150 KHZ TO 1 GHZ - PART 5: MEASUREMENT OF CONDUCTED EMISSIONS - WORKBENCH FARADAY CAGE METHOD

Available format(s)

Hardcopy , PDF

Language(s)

English

Published date

01-01-2003

Publisher

National Standards Authority of Ireland

Preview

For Harmonized Standards, check the EU site to confirm that the Standard is cited in the Official Journal.

Only cited Standards give presumption of conformance to New Approach Directives/Regulations.


Dates of withdrawal of national standards are available from NSAI.

FOREWORD
INTRODUCTION
1 Scope
2 Normative references
3 Definitions
4 General
  4.1 Measurement philosophy
  4.2 Principle set-up
  4.3 Workbench concept
5 Test conditions
6 Test equipment
7 Test set-up
  7.1 Shielding and ambient fields
  7.2 Workbench set-up
  7.3 Connections to the PCB
  7.4 Common-mode points
      7.4.1 Comparison testing
      7.4.2 Definitive application
  7.5 Emission limits
  7.6 Workbench - Practical implementation
  7.7 Test PCB
8 Test procedure
9 Test report
  9.1 Emission criteria
  9.2 Emission levels
Annex A (normative) - Detail specification of Workbench
                        Faraday Cage (WBFC)
Annex B (informative) - Common-mode impedances
Annex C (informative) - Derivation of limits
Annex D (informative) - Use of the Workbench
Bibliography
Figures
Tables

Specifies a method to measure the conducted electromagnetic emission of integrated circuits either applied on a standardised test-board or on a final printed circuit board (PCB).

DevelopmentNote
For CENELEC adoptions of IEC publications, please check www.iec.ch to be sure that you have any corrigenda that may apply. (01/2017)
DocumentType
Standard
Pages
61
PublisherName
National Standards Authority of Ireland
Status
Current

Standards Relationship
SN EN 61967-5 : 2003 Identical
DIN EN 61967-5:2003-10 Identical
NF EN 61967-5 : 2003 Identical
NBN EN 61967-5 : 2004 Identical
IEC 61967-5:2003 Identical
EN 61967-5:2003 Identical
BS EN 61967-5:2003 Identical

IEC 61967-2:2005 Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 2: Measurement of radiated emissions - TEM cell and wideband TEM cell method
IEC 60050-131:2002 International Electrotechnical Vocabulary (IEV) - Part 131: Circuit theory
MIL-STD-285 Base Document:1956 ATTENUATION MEASUREMENTS FOR ENCLOSURES, ELECTROMAGNETIC SHIELDING, FOR ELECTRONIC TEST PURPOSES, METHOD OF
IEC 61967-1:2002 Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 1: General conditions and definitions
IEC TS 61967-3:2014 Integrated circuits - Measurement of electromagnetic emissions - Part 3: Measurement of radiated emissions - Surface scan method
EN 61967-1:2002 Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 1: General conditions and definitions
IEC 61000-4-6 : 4.0 ELECTROMAGNETIC COMPATIBILITY (EMC) - PART 4-6: TESTING AND MEASUREMENT TECHNIQUES - IMMUNITY TO CONDUCTED DISTURBANCES, INDUCED BY RADIO-FREQUENCY FIELDS
IEC 61967-4:2002+AMD1:2006 CSV Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 4: Measurement of conducted emissions - 1 Ω/150 Ω direct coupling method
CISPR 16-2:2003 Specification for radio disturbance and immunity measuring apparatus and methods - Part 2: Methods of measurement of disturbances and immunity
IEC 61967-6:2002+AMD1:2008 CSV Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method
EN 61000-4-6:2014/AC:2015 ELECTROMAGNETIC COMPATIBILITY (EMC) - PART 4-6: TESTING AND MEASUREMENT TECHNIQUES - IMMUNITY TO CONDUCTED DISTURBANCES, INDUCED BY RADIO-FREQUENCY FIELDS (IEC 61000-4-6:2013)
CISPR 16-1:1999+AMD1:2002 CSV Specification for radio disturbance and immunity measuring apparatus and methods - Part 1: Radio disturbance and immunity measuring apparatus

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