I.S. EN 62149-2:2014
Current
The latest, up-to-date edition.
FIBRE OPTIC ACTIVE COMPONENTS AND DEVICES - PERFORMANCE STANDARDS - PART 2: 850 NM DISCRETE VERTICAL CAVITY SURFACE EMITTING LASER DEVICES
Hardcopy , PDF
English
01-01-2014
For Harmonized Standards, check the EU site to confirm that the Standard is cited in the Official Journal.
Only cited Standards give presumption of conformance to New Approach Directives/Regulations.
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FOREWORD
INTRODUCTION
1 Scope
2 Normative references
3 Terms, definitions, symbols
and abbreviations
4 Product parameters
5 Testing
6 Environmental specifications
Annex A (normative) - Specifications for multimode 850-nm
VCSEL device without a monitor photodiode (Case a)
Annex B (normative) - Specifications for multimode 850 nm
VCSEL device with a monitor photodiode (Case b)
Bibliography
Annex ZA (normative) - Normative references to international
publications with their corresponding European
publications
Defines the performance specification for 850-nm discrete vertical cavity surface emitting laser (VCSEL) devices of transverse multimode types used for the fibre optic telecommunication and optical data transmission application.
| DevelopmentNote |
For CENELEC adoptions of IEC publications, please check www.iec.ch to be sure that you have any corrigenda that may apply. (01/2017)
|
| DocumentType |
Standard
|
| Pages |
52
|
| PublisherName |
National Standards Authority of Ireland
|
| Status |
Current
|
| Standards | Relationship |
| EN 62149-2:2014 | Identical |
| IEC 60950-1:2005+AMD1:2009+AMD2:2013 CSV | Information technology equipment - Safety - Part 1: General requirements |
| IEC 62148-15:2014 | Fibre optic active components and devices - Package and interface standards - Part 15: Discrete vertical cavity surface emitting laser packages |
| IEC GUIDE 107:2014 | Electromagnetic compatibility - Guide to the drafting of electromagnetic compatibility publications |
| IEC 61280-1-3:2010 | Fibre optic communication subsystem test procedures - Part 1-3: General communication subsystems - Central wavelength and spectral width measurement |
| EN 60825-1:2014/AC:2017-06 | SAFETY OF LASER PRODUCTS - PART 1: EQUIPMENT CLASSIFICATION AND REQUIREMENTS (IEC 60825-1:2014) |
| IEC 62007-1:2015 | Semiconductor optoelectronic devices for fibre optic system applications - Part 1: Specification template for essential ratings and characteristics |
| IEC 60749-25:2003 | Semiconductor devices - Mechanical and climatic test methods - Part 25: Temperature cycling |
| IEC 61300-2-48:2009 | Fibre optic interconnecting devices and passive components - Basic test and measurement procedures - Part 2-48: Tests - Temperature-humidity cycling |
| IEC 60749-11:2002 | Semiconductor devices - Mechanical and climatic test methods - Part 11: Rapid change of temperature - Two-fluid-bath method |
| EN 60950-1:2006/A2:2013 | INFORMATION TECHNOLOGY EQUIPMENT - SAFETY - PART 1: GENERAL REQUIREMENTS (IEC 60950-1:2005/A2:2013, MODIFIED) |
| EN 62148-15:2014 | Fibre optic active components and devices - Package and interface standards - Part 15: Discrete vertical cavity surface emitting laser packages |
| IEC 60825-1:2014 | Safety of laser products - Part 1: Equipment classification and requirements |
| IEC 62007-2:2009 | Semiconductor optoelectronic devices for fibre optic system applications - Part 2: Measuring methods |
| EN 60749-11:2002 | Semiconductor devices - Mechanical and climatic test methods - Part 11: Rapid change of temperature - Two-fluid-bath method |
| IEC 60749-26:2013 | Semiconductor devices - Mechanical and climatic test methods - Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM) |
| EN 60749-10:2002 | Semiconductor devices - Mechanical and climatic test methods - Part 10: Mechanical shock |
| IEC 60749-7:2011 | Semiconductor devices - Mechanical and climatic test methods - Part 7: Internal moisture content measurement and the analysis of other residual gases |
| EN 61300-2-4:1997 | Fibre optic interconnecting devices and passive components - Basic test and measurement procedures - Part 2-4: Tests - Fibre/cable retention |
| IEC 60749-6:2017 | Semiconductor devices - Mechanical and climatic test methods - Part 6: Storage at high temperature |
| IEC 62148-1:2017 | Fibre optic active components and devices - Package and interface standards - Part 1: General and guidance |
| EN 60749-7:2011 | Semiconductor devices - Mechanical and climatic test methods - Part 7: Internal moisture content measurement and the analysis of other residual gases |
| EN 60749-6:2017 | Semiconductor devices - Mechanical and climatic test methods - Part 6: Storage at high temperature |
| EN 60749-26:2014 | Semiconductor devices - Mechanical and climatic test methods - Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM) |
| IEC 60747-5-1:1997+AMD1:2001+AMD2:2002 CSV | Discrete semiconductor devices and integrated circuits - Part 5-1: Optoelectronic devices - General |
| IEC 61300-2-4:1995 | Fibre optic interconnecting devices and passive components - Basic test and measurement procedures - Part 2-4: Tests - Fibre/cable retention |
| IEC 60749-10:2002 | Semiconductor devices - Mechanical and climatic test methods - Part 10: Mechanical shock |
| EN 60749-25:2003 | Semiconductor devices - Mechanical and climatic test methods - Part 25: Temperature cycling |
| IEC 62149-1:2011 | Fibre optic active components and devices - Performance standards - Part 1: General and guidance |
| IEC 61300-2-19:2012 | Fibre optic interconnecting devices and passive components - Basic test and measurement procedures - Part 2-19: Tests - Damp heat (steady state) |
| EN 61300-2-19:2013 | Fibre optic interconnecting devices and passive components - Basic test and measurement procedures - Part 2-19: Tests - Damp heat (steady state) |
| IEC 60749-12:2002 | Semiconductor devices - Mechanical and climatic test methods - Part 12: Vibration, variable frequency |
| EN 61300-2-48:2009 | Fibre optic interconnecting devices and passive components - Basic test and measurement procedures - Part 2-48: Tests - Temperature-humidity cycling |
| EN 60749-12:2002 | Semiconductor devices - Mechanical and climatic test methods - Part 12: Vibration, variable frequency |
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