IEC 60122-3:2010
Current
Current
The latest, up-to-date edition.
Quartz crystal units of assessed quality - Part 3: Standard outlines and lead connections
Available format(s)
Hardcopy , PDF , PDF 3 Users , PDF 5 Users , PDF 9 Users
Language(s)
English, English - French
Published date
11-10-2010
Publisher
Important note : Users cannot be edited or removed once added to your Multi user PDF.IEC 60122-3:2010 specifies the outline drawing for quartz crystal units with lead enclosures. The main changes with respect to the previous edition are as follows: 12 of the 48 enclosure types contained in the previous edition have been deleted.
| Committee |
TC 49
|
| DevelopmentNote |
Supersedes IEC 60122-3A, IEC 60122-3B, IEC 60122-3C and IEC 60122-3D. (07/2004) Stability Date: 2017. (09/2017)
|
| DocumentType |
Standard
|
| Pages |
52
|
| PublisherName |
International Electrotechnical Committee
|
| Status |
Current
|
| Supersedes |
| Standards | Relationship |
| DIN EN 60122-3:2011-08 | Identical |
| NBN EN 60122-3 : 2011 | Identical |
| NEN EN IEC 60122-3 : 2011 | Identical |
| I.S. EN 60122-3:2010 | Identical |
| PN EN 60122-3 : 2011 | Identical |
| CEI EN 60122-3 : 2016 | Identical |
| EN 60122-3:2010 | Identical |
| NF EN 60122-3 : 2011 | Identical |
| DIN 45110-20:1981-06 | Similar to |
| DIN 45110-13:1981-06 | Similar to |
| DIN 45110-22:1981-06 | Similar to |
| DIN IEC 60122-3:1993-09 | Identical |
| DIN 45110-11:1981-06 | Similar to |
| DIN 45110-1 : 1981 | Similar to |
| DIN 45110-17:1981-06 | Similar to |
| NEN 10122-3 : 1985 | Identical |
| DIN 45110-27 : 1981 | Similar to |
| DIN 45110-25 : 1981 | Similar to |
| DIN 45110-18:1981-06 | Similar to |
| DIN IEC 60122-2:1993-09 | Corresponds |
| DIN 45110-23:1981-06 | Similar to |
| PNE-FprEN 60122-3 | Identical |
| DIN 45110-24:1981-06 | Similar to |
| BS 5069-1:1980 | Identical |
| UNE-EN 60122-3:2010 | Identical |
| DIN 45110-28:1981-06 | Similar to |
| DIN 45110-16:1981-06 | Similar to |
| DIN 45110-21:1981-06 | Similar to |
| BS EN 60122-3:2010 | Identical |
| DIN 45110-15:1981-06 | Similar to |
| DIN 45110-26:1981-06 | Similar to |
| I.S. EN 61837-3:2015 | SURFACE MOUNTED PIEZOELECTRIC DEVICES FOR FREQUENCY CONTROL AND SELECTION - STANDARD OUTLINES AND TERMINAL LEAD CONNECTIONS - PART 3: METAL ENCLOSURES |
| BS CECC68000(1990) : AMD 9184 | HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS: GENERIC SPECIFICATION: QUARTZ CRYSTAL UNITS |
| I.S. EN 60689:2009 | MEASUREMENT AND TEST METHODS FOR TUNING FORK QUARTZ CRYSTAL UNITS IN THE RANGE FROM 10 KHZ TO 200 KHZ AND STANDARD VALUES |
| CEI EN 60689 : 2009 | MEASUREMENT AND TEST METHODS FOR TUNING FORK QUARTZ CRYSTAL UNITS IN THE RANGE FROM 10 KHZ TO 200 KHZ AND STANDARD VALUES |
| EN 61837-2:2011/A1:2014 | SURFACE MOUNTED PIEZOELECTRIC DEVICES FOR FREQUENCY CONTROL AND SELECTION - STANDARD OUTLINES AND TERMINAL LEAD CONNECTIONS - PART 2: CERAMIC ENCLOSURES (IEC 61837-2:2011/A1:2014) |
| NF EN 60122-1 : 2003 | QUARTZ CRYSTAL UNITS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION |
| EN 61837-3:2015 | Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 3: Metal enclosures |
| EN 60689:2009 | Measurement and test methods for tuning fork quartz crystal units in the range from 10 kHz to 200 kHz and standard values |
| EN 168000 : 1993 AMD 2 1998 | GENERIC SPECIFICATION - QUARTZ CRYSTAL UNITS |
| I.S. EN 168000:1994 | QUARTZ CRYSTAL UNITS (GENERIC SPECIFICATION) |
| IEC 61837-3:2015 | Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 3: Metal enclosures |
| 09/30200395 DC : 0 | BS EN 61837-2 ED. 2 - SURFACE MOUNTED PIEZOELECTRIC DEVICES FOR FREQUENCY CONTROL AND SELECTION - STANDARD OUTLINES AND TERMINAL LEAD CONNECTIONS - PART 2: CERAMIC ENCLOSURES |
| 13/30278807 DC : 0 | BS EN 61837-3 - SURFACE MOUNTED PIEZOELECTRIC DEVICES FOR FREQUENCY CONTROL AND SELECTI0N - STANDARD OUTLINES AND TERMINAL LEAD CONNECTIONS - PART 3: METAL ENCLOSURE |
| BS EN 168000:1996 | Harmonized system of quality assessment for electronic components. Generic specification: quartz crystal units |
| IEC 61178-3-1:1993 | Quartz crystal units - A specification in the IEC Quality Assessment System for Electronic Components (IECQ) - Part 3: Sectional specification - Qualification approval - Section 1: Blank detail specification |
| BS EN 60689:2009 | Measurement and test methods for tuning fork quartz crystal units in the range from 10 kHz to 200 kHz and standard values |
| I.S. EN 61837-2:2011 | SURFACE MOUNTED PIEZOELECTRIC DEVICES FOR FREQUENCY CONTROL AND SELECTION - STANDARD OUTLINES AND TERMINAL LEAD CONNECTIONS - PART 2: CERAMIC ENCLOSURES |
| BS EN 60122-1 : 2002 | QUARTZ CRYSTAL UNITS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION |
| IEC 61178-1:1993 | Quartz crystal units - A specification in the IEC Quality Assessment System for Electronic Components (IECQ) - Part 1: Generic specification |
| BS EN 61837-3:2015 | Surface mounted piezoelectric devices for frequency control and selection. Standard outlines and terminal lead connections Metal enclosures |
| IEC 61178-2-1:1993 | Quartz crystal units - A specification in the IEC Quality Assessment System for Electronic Components (IECQ) - Part 2: Sectional specification - Capability approval - Section 1: Blank detail specification |
| IEC 60689:2008 | Measurement and test methods for tuning fork quartz crystal units in the range from 10 kHz to 200 kHz and standard values |
| I.S. EN 60122-1:2002 AMD 1 2018 | QUARTZ CRYSTAL UNITS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION |
| CEI EN 60122-1 : 2004 | QUARTZ CRYSTAL UNITS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION |
| BS EN 61837-2 : 2011 | SURFACE MOUNTED PIEZOELECTRIC DEVICES FOR FREQUENCY CONTROL AND SELECTION - STANDARD OUTLINES AND TERMINAL LEAD CONNECTIONS - PART 2: CERAMIC ENCLOSURES |
| EN 60122-1:2002/A1:2018 | QUARTZ CRYSTAL UNITS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION (IEC 60122-1:2002/A1:2017) |
| ISO 1101:2017 | Geometrical product specifications (GPS) — Geometrical tolerancing — Tolerances of form, orientation, location and run-out |
| IEC 61178-3:1993 | Quartz crystal units - A specification in the IEC Quality Assessment System for Electronic Components (IECQ) - Part 3: Sectional specification - Qualification approval |
| IEC 61178-3-1:1993 | Quartz crystal units - A specification in the IEC Quality Assessment System for Electronic Components (IECQ) - Part 3: Sectional specification - Qualification approval - Section 1: Blank detail specification |
| IEC 60122-2:1983 | Quartz crystal units for frequency control and selection - Part 2: Guide to the use of quartz crystal units for frequency control and selection |
| IEC 60122-1:2002 | Quartz crystal units of assessed quality - Part 1: Generic specification |
| IEC 61178-2:1993 | Quartz crystal units - A specification in the IEC Quality Assessment System for Electronic Components (IECQ) - Part 2: Sectional specification - Capability approval |
| IEC 61178-2-1:1993 | Quartz crystal units - A specification in the IEC Quality Assessment System for Electronic Components (IECQ) - Part 2: Sectional specification - Capability approval - Section 1: Blank detail specification |
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