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IEC 60368-1:2000+AMD1:2004 CSV

Current

Current

The latest, up-to-date edition.

Piezoelectric filters of assessed quality - Part 1: Genericspecification

Available format(s)

Hardcopy , PDF , PDF 3 Users , PDF 5 Users , PDF 9 Users

Language(s)

English - French

Published date

28-05-2013

€348.28
Excluding VAT

IEC 60268-1:2000+A1:2004 Specifies the methods of test and general requirements for piezoelectric filters of assessed quality using either capability approval or qualification approval procedures. This consolidated version consists of the fourth edition (2000) and its amendment 1 (2004). Therefore, no need to order amendment in addition to this publication.

Committee
TC 49
DevelopmentNote
BS DRAFT 98/231211 REFERS TO DRAFT AND POSSIBLE NEW BS Also numbered as BS EN 60368-1. (10/2001) Stability Date: 2017. (09/2017)
DocumentType
Standard
Pages
73
PublisherName
International Electrotechnical Committee
Status
Current
Supersedes

02/206181 DC : DRAFT MAY 2002 IEC 61019-1. ED.1 - SURFACE ACOUSTIC WAVE RESONATORS (SAW) OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION
BS EN 60368-3:2010 Piezoelectric filters of assessed quality Standard outlines and lead connections
DD IEC/TS 61994-2:2011 Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection. Glossary Piezoelectric and dielectric filters
CEI EN 60368-4 : 2003 PIEZOELECTRIC FILTERS OF ASSESSED QUALITY - PART 4: SECTIONAL SPECIFICATION - CAPABILITY APPROVAL
I.S. EN 61837-3:2015 SURFACE MOUNTED PIEZOELECTRIC DEVICES FOR FREQUENCY CONTROL AND SELECTION - STANDARD OUTLINES AND TERMINAL LEAD CONNECTIONS - PART 3: METAL ENCLOSURES
CEI EN 60368-3 : 2011 PIEZOELECTRIC FILTERS OF ASSESSED QUALITY - PART 3: STANDARD OUTLINES AND LEAD CONNECTIONS
BS EN 60368-2-2:1999 Piezoelectric filters. Guide to the use of piezoelectric filters Piezoelectric ceramic filters
I.S. EN 60368-3:2010 PIEZOELECTRIC FILTERS OF ASSESSED QUALITY - PART 3: STANDARD OUTLINES AND LEAD CONNECTIONS
EN 61837-2:2011/A1:2014 SURFACE MOUNTED PIEZOELECTRIC DEVICES FOR FREQUENCY CONTROL AND SELECTION - STANDARD OUTLINES AND TERMINAL LEAD CONNECTIONS - PART 2: CERAMIC ENCLOSURES (IEC 61837-2:2011/A1:2014)
EN 61837-3:2015 Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 3: Metal enclosures
EN 60368-3:2010 Piezoelectric filters of assessed quality - Part 3: Standard outlines and lead connections
09/30198254 DC : 0 BS EN 60368-3 ED.4 - PIEZOELECTRIC FILTERS OF ASSESSED QUALITY - PART 3: STANDARD OUTLINES AND LEAD CONNECTIONS
BS EN 62047-7:2011 Semiconductor devices. Micro-electromechanical devices MEMS BAW filter and duplexer for radio frequency control and selection
IEC TS 61994-2:2011 Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection - Glossary - Part 2: Piezoelectric and dielectric filters
IEC 61837-3:2015 Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 3: Metal enclosures
IEC 61261-1:1994 Piezoelectric ceramic filters for use in electronic equipment - A specification in the IEC quality assessment system for electronic components (IECQ) - Part 1: Generic specification - Qualification approval
BS EN 60368-4:2001 Piezoelectric filters Sectional specification. Capability approval
13/30278807 DC : 0 BS EN 61837-3 - SURFACE MOUNTED PIEZOELECTRIC DEVICES FOR FREQUENCY CONTROL AND SELECTI0N - STANDARD OUTLINES AND TERMINAL LEAD CONNECTIONS - PART 3: METAL ENCLOSURE
IEC 61261-2:1994 Piezoelectric ceramic filters for use in electronic equipment - A specification in the IEC quality assessment system for electronic components (IECQ) - Part 2: Sectional specification - Qualification approval
BS EN 167000:1993 Harmonized system of quality assessment for electronic components. Generic specification: piezoelectric filters
I.S. EN 62047-7:2011 SEMICONDUCTOR DEVICES - MICRO-ELECTROMECHANICAL DEVICES - PART 7: MEMS BAW FILTER AND DUPLEXER FOR RADIO FREQUENCY CONTROL AND SELECTION
I.S. EN 61837-2:2011 SURFACE MOUNTED PIEZOELECTRIC DEVICES FOR FREQUENCY CONTROL AND SELECTION - STANDARD OUTLINES AND TERMINAL LEAD CONNECTIONS - PART 2: CERAMIC ENCLOSURES
09/30200793 DC : 0 BS EN 61994-2 ED.2 - PIEZOELECTRIC AND DIELECTRIC DEVICES FOR FREQUENCY CONTROL AND SELECTION - GLOSSARY - PART 2: PIEZOELECTRIC AND DIELECTRIC FILTERS
BS EN 61837-3:2015 Surface mounted piezoelectric devices for frequency control and selection. Standard outlines and terminal lead connections Metal enclosures
IEC 60368-4-1:2000 Piezoelectric filters of assessed quality - Part 4-1: Blank detail specification - Capability approval
IEC 62047-7:2011 Semiconductor devices - Micro-electromechanical devices - Part 7: MEMS BAW filter and duplexer for radio frequency control and selection
09/30200395 DC : 0 BS EN 61837-2 ED. 2 - SURFACE MOUNTED PIEZOELECTRIC DEVICES FOR FREQUENCY CONTROL AND SELECTION - STANDARD OUTLINES AND TERMINAL LEAD CONNECTIONS - PART 2: CERAMIC ENCLOSURES
08/30172394 DC : DRAFT APR 2008 BS EN 62047-7 - SEMICONDUCTOR DEVICES - MICRO-ELECTROMECHANICAL DEVICES - PART 7: MEMS FBAR FILTER & DUPLEXER
BS EN 60368-4-1:2001 Piezoelectric filters. Blank detail specification. Capability approval
CEI EN 62047-7 : 2012 SEMICONDUCTOR DEVICES - MICRO-ELECTROMECHANICAL DEVICES - PART 7: MEMS BAW FILTER AND DUPLEXER FOR RADIO FREQUENCY CONTROL AND SELECTION
I.S. EN 60368-2-2:1999 PIEZOELECTRIC FILTERS - PART 2: GUIDE TO THE USE OF PIEZOELECTRIC FILTERS - SECTION 2: PIEZOELECTRIC CERAMIC FILTERS
BS EN 61837-2 : 2011 SURFACE MOUNTED PIEZOELECTRIC DEVICES FOR FREQUENCY CONTROL AND SELECTION - STANDARD OUTLINES AND TERMINAL LEAD CONNECTIONS - PART 2: CERAMIC ENCLOSURES
IEC 61019-1-2:1993 Surface acoustic wave (SAW) resonators - Part 1: General information, standard values and test conditions - Section 2: Test conditions
IEC 60368-4:2000 Piezoelectric filters of assessed quality - Part 4 : Sectional specification - Capability approval
IEC 60368-3:2010 Piezoelectric filters of assessed quality - Part 3: Standard outlines and lead connections
EN 60368-2-2:1999 Piezoelectric filters - Part 2: Guide to the use of piezoelectric filters - Section 2: Piezoelectric ceramic filters
EN 62047-7 : 2011 SEMICONDUCTOR DEVICES - MICRO-ELECTROMECHANICAL DEVICES - PART 7: MEMS BAW FILTER AND DUPLEXER FOR RADIO FREQUENCY CONTROL AND SELECTION
EN 60368-4-1:2000 Piezoelectric filters of assessed quality - Part 4-1: Blank detail specification - Capability approval
EN 60368-4:2000 Piezoelectric filters of assessed quality - Part 4: Sectional specification - Capability approval

IEC 60368-4:2000 Piezoelectric filters of assessed quality - Part 4 : Sectional specification - Capability approval
IEC 60068-1:2013 Environmental testing - Part 1: General and guidance
IEC 60068-2-58:2015+AMD1:2017 CSV Environmental testing - Part 2-58: Tests - Test Td: Test methods for solderability, resistance to dissolution of metallization and to soldering heat of surface mounting devices (SMD)
IEC 60068-2-27:2008 Environmental testing - Part 2-27: Tests - Test Ea and guidance: Shock
IEC 60068-2-20:2008 Environmental testing - Part 2-20: Tests - Test T: Test methods for solderability and resistance to soldering heat of devices with leads
IECQ 001002-3:2005 IEC QUALITY ASSESSMENT SYSTEM FOR ELECTRONIC COMPONENTS (IECQ) - RULES OF PROCEDURE - PART 3: APPROVAL PROCEDURES
IEC 60068-2-21:2006 Environmental testing - Part 2-21: Tests - Test U: Robustness of terminations and integral mounting devices
IEC 60068-2-13:1983 Basic environmental testing procedures - Part 2-13: Tests - Test M: Low air pressure
IECQ 001002-2:1998 IEC QUALITY ASSESSMENT SYSTEM FOR ELECTRONIC COMPONENTS (IECQ) - RULES OF PROCEDURE - PART 2: DOCUMENTATION
IEC 60068-2-64:2008 Environmental testing - Part 2-64: Tests - Test Fh: Vibration, broadband random and guidance
IECQ 001004:2006
IEC 60410:1973 Sampling plans and procedures for inspection by attributes
IEC 60068-2-3:1969 Basic environmental testing procedures - Part 2-3: Tests - Test Ca: Damp heat, steady state
IEC GUIDE 102:1996 Electronic components - Specification structures for quality assessment (Qualification approval and capability approval)
IEC 60068-2-17:1994 Basic environmental testing procedures - Part 2-17: Tests - Test Q: Sealing
IEC 60068-2-10:2005 Environmental testing - Part 2-10: Tests - Test J and guidance: Mould growth
IEC 60068-2-2:2007 Environmental testing - Part 2-2: Tests - Test B: Dry heat
IEC 61000-4-2:2008 Electromagnetic compatibility (EMC) - Part 4-2: Testing and measurement techniques - Electrostatic discharge immunity test
IECQ 001002-1:1998 IEC QUALITY ASSESSMENT SYSTEM FOR ELECTRONIC COMPONENTS (IECQ) - RULES OF PROCEDURE - PART 1: ADMINISTRATION
IEC 60050-561:2014 International Electrotechnical Vocabulary (IEV) - Part 561: Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection
IEC 60068-2-29:1987 Environmental testing. Part 2: Tests. Test Eb and guidance: Bump
IEC 60068-2-1:2007 Environmental testing - Part 2-1: Tests - Test A: Cold
IEC 61178-1:1993 Quartz crystal units - A specification in the IEC Quality Assessment System for Electronic Components (IECQ) - Part 1: Generic specification
IEC 60068-2-14:2009 Environmental testing - Part 2-14: Tests - Test N: Change of temperature
IEC 60068-2-52:2017 Environmental testing - Part 2-52: Tests - Test Kb: Salt mist, cyclic (sodium chloride solution)
IEC 60068-2-30:2005 Environmental testing - Part 2-30: Tests - Test Db: Damp heat, cyclic (12 h + 12 h cycle)

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