08/30180398 DC : 0
|
BS EN 60747-16-5 - SEMICONDUCTOR DEVICES - PART 16-5: MICROWAVE INTEGRATED CIRCUITS - OSCILLATORS |
BS EN 190100:1993
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Harmonized system of quality assessment for electronic components: sectional specification: digital monolithic integrated circuits |
15/30325282 DC : 0
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BS EN 62884-1 - MEASUREMENT TECHNIQUES OF PIEZOELECTRIC, DIELETIRIC AND ELECTROSTATIC OSCILLATORS - PART 1: BASIC METHODS FOR THE MEASUREMENT |
BS EN 60747-16-3 : 2002
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SEMICONDUCTOR DEVICES - PART 16-3: MICROWAVE INTEGRATED CIRCUITS - FREQUENCY CONVERTERS |
I.S. EN 60679-1:2017
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PIEZOELECTRIC, DIELECTRIC AND ELECTROSTATIC OSCILLATORS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION |
BS IEC 60748-2.20 : 2008
|
SEMICONDUCTOR DEVICES - INTEGRATED CIRCUITS - PART 2-20: DIGITAL INTEGRATED CIRCUITS - FAMILY SPECIFICATION - LOW VOLTAGE INTEGRATED CIRCUITS |
06/30153491 DC : DRAFT JULY 2006
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EN 60748-2-20 - SEMICONDUCTOR DEVICES - INTEGRATED CIRCUITS - PART 2-20: DIGITAL INTEGRATED CIRCUITS - FAMILY SPECIFICATION - LOW VOLTAGE INTEGRATED CIRCUITS |
BS EN 62884-1:2017
|
Measurement techniques of piezoelectric, dielectric and electrostatic oscillators Basic methods for the measurement |
BS IEC 60748-5:1997
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Semiconductor devices. Integrated circuits Semicustom integrated circuits |
14/30282293 DC : 0
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BS EN 60679-1 - PIEZOELECTRIC AND ASSOCIATED MATERIAL OSCILLATORS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION |
EN 62884-1:2017
|
Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 1: Basic methods for the measurement |
CEI EN 60679-1 : 2009
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PIEZOELECTRIC, DIELECTRIC AND ELECTROSTATIC OSCILLATORS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION |
BS EN 60747-16-1 : 2002
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SEMICONDUCTOR DEVICES - PART 16-1: MICROWAVE INTEGRATED CIRCUITS - AMPLIFIERS |
IEC 60748-2-20:2008
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Semiconductor devices - Integrated circuits - Part 2-20: Digital integrated circuits - Family specification - Low voltage integrated circuits |
I.S. EN 60747-16-1:2002
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SEMICONDUCTOR DEVICES - PART 16-1: MICROWAVE INTEGRATED CIRCUITS - AMPLIFIERS |
IEC 60748-2-12:2001
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Semiconductor devices - Integrated circuits - part2-12: Digital integrated circuits - Blank detail specification for programmable logic devices (PLDs) |
BS QC 760200:1997
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Harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Sectional specification for film integrated circuits and hybrid film integrated circuits on the basis of the capability approval procedures |
BS QC 760100:1997
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Harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Sectional specification for film integrated circuits and hybrid film integrated circuits on the basis of the qualification approval procedures |
BS CECC 90300:1988
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Harmonized system of quality assessment for electronic components. Sectional specification: interface monolithic integrated circuits |
BS IEC 60747-16.2 : 2001
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SEMICONDUCTOR DEVICES - PART 16-2: MICROWAVE INTEGRATED CIRCUITS - FREQUENCY PRESCALERS |
BS QC 790109:1992
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Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits.Family specification for HCMOS digital integrated circuits series 54/74 HC, 54/74 HCT, 54/74 HCU |
BS EN 60679-1:2017
|
Piezoelectric, dielectric and electrostatic oscillators of assessed quality Generic specification |
BS IEC 60748-11:2000
|
Semiconductor devices. Integrated circuits Sectional specification for semiconductor integrated circuits excluding hybrid circuits |
BS IEC 60748-2.12 : 2001
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SEMICONDUCTOR DEVICES - INTEGRATED CIRCUITS - DIGITAL INTEGRATED CIRCUITS - BLANK DETAIL SPECIFICATION FOR PROGRAMMABLE LOGIC DEVICES (PLDS) |
BS QC790100(1991) : 1991 AMD 10586
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HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - SEMICONDUCTOR DEVICES - SECTIONAL SPECIFICATION FOR SEMICONDUCTOR INTEGRATED CIRCUITS EXCLUDING HYBRID CIRCUITS |
I.S. EN 60747-16-3:2002
|
SEMICONDUCTOR DEVICES - PART 16-3: MICROWAVE INTEGRATED CIRCUITS - FREQUENCY CONVERTERS |
I.S. EN 62884-1:2017
|
MEASUREMENT TECHNIQUES OF PIEZOELECTRIC, DIELECTRIC AND ELECTROSTATIC OSCILLATORS - PART 1: BASIC METHODS FOR THE MEASUREMENT |
IEC 60748-11:1990
|
Semiconductor devices - Integrated circuits - Part 11: Sectional specification for semiconductor integrated circuits excluding hybrid circuits |
IEC 62884-1:2017
|
Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 1: Basic methods for the measurement |
IEC 60747-10:1991
|
Semiconductor devices - Part 10: Generic specification for discrete devices and integrated circuits |
IEC 60679-1:2017
|
Piezoelectric, dielectric and electrostatic oscillators of assessed quality - Part 1: Generic specification |
IEC 60748-4:1997
|
Semiconductor devices - Integrated circuits - Part 4: Interface integrated circuits |
CEI EN 60747-16-1 : 2009
|
SEMICONDUCTOR DEVICES - PART 16-1: MICROWAVE INTEGRATED CIRCUITS - AMPLIFIERS |
EN 60679-1:2017
|
Piezoelectric, dielectric and electrostatic oscillators of assessed quality - Part 1: Generic specification |
IEC 60747-16-2:2001+AMD1:2007 CSV
|
Semiconductor devices - Part 16-2: Microwave integrated circuits - Frequency prescalers |
IEC 60747-16-3:2002+AMD1:2009+AMD2:2017 CSV
|
Semiconductor devices - Part 16-3: Microwave integrated circuits - Frequency converters |
IEC 61747-1:1998+AMD1:2003 CSV
|
Liquid crystal and solid-state display devices - Part 1: Generic specification |
IEC 60747-16-4:2004+AMD1:2009+AMD2:2017 CSV
|
Semiconductor devices - Part 16-4: Microwave integrated circuits - Switches |
IEC 60747-16-1:2001+AMD1:2007+AMD2:2017 CSV
|
Semiconductor devices - Part 16-1: Microwave integrated circuits - Amplifiers |
DIN EN 190000:1996-05
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GENERIC SPECIFICATION - MONOLITHIC INTEGRATED CIRCUITS |
EN 60747-16-3:2002/A2:2017
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SEMICONDUCTOR DEVICES - PART 16-3: MICROWAVE INTEGRATED CIRCUITS - FREQUENCY CONVERTERS (IEC 60747-16-3:2002/A2:2017) |
CEI EN 60747-16-3 : 2009
|
SEMICONDUCTOR DEVICES - PART 16-3: MICROWAVE INTEGRATED CIRCUITS - FREQUENCY CONVERTERS |
BS EN 60747-16-4 : 2004
|
SEMICONDUCTOR DEVICES - PART 16-4: MICROWAVE INTEGRATED CIRCUITS - SWITCHES |
EN 60747-16-1:2002/A2:2017
|
SEMICONDUCTOR DEVICES - PART 16-1: MICROWAVE INTEGRATED CIRCUITS - AMPLIFIERS (IEC 60747-16-1:2001/A2:2017) |
BS CECC90100(1987) : AMD 7845
|
HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS: SECTIONAL SPECIFICATION: DIGITAL MONOLITHIC INTEGRATED CIRCUITS |