IEC 61163-2:1998
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
View Superseded by
Reliability stress screening - Part 2: Electronic components
Hardcopy , PDF , PDF 3 Users , PDF 5 Users , PDF 9 Users
31-12-2021
English - French, Spanish, Castilian
27-11-1998
Contents
Foreword
Introduction
Clause
1. Scope
2. Normative references
3. Definitions
4. Procedure
4.1 General
4.2 Programme definition
4.3 Establish contact between the two parties
involved
4.4 Identify the possible flaws and failure modes
for each component
4.5 Select stress types, stress levels and stress
sequence to be used in order to precipitate failures
4.6 Determine the duration of the reliability stress
screening process
4.7 Mathematically analyze initial test results
4.8 Perform failure analysis
4.9 Perform stress sequence on the components
4.10 Determine approval or rejection criteria
4.11 Develop closed-loop corrective action process
4.12 Provide feedback to the component manufacturers
4.13 Discontinue the reliability stress screening process
Figure 1 - Component reliability screening process (general flow
chart)
Figure 2 - Corrective action process
Annex A (informative) Examples of tools for identifying failure
mechanisms in electronic components
Annex B (informative) Data analysis
Annex C (informative) Examples of applications of reliability
stress screening processes
Provides guidance on reliability stress screening techniques and procedures for electronic components. Is intended for use of a) component manufacturers as a guideline, b) component users as a guideline to negotiate with component manufacturers on stress screening requirements or plan a stress screening process in house due to reliability requirements, c) subcontractors who provide stress screening as a service.
DevelopmentNote |
Together with IEC 61163-1, supersedes IEC 60300-3-7. (07/2007) Stability Date: 2018. (09/2017)
|
DocumentType |
Standard
|
Pages |
69
|
PublisherName |
International Electrotechnical Committee
|
Status |
Superseded
|
SupersededBy | |
Supersedes |
Standards | Relationship |
BS IEC 61163-2:1998 | Identical |
CEI 56-36 : 2000 | Identical |
PN IEC 61163-2 : 2004 | Identical |
BIS IS 15444-2 : 2005(R2016) | Identical |
NEN IEC 61163-2 : 1998 | Identical |
UNE 200004-2:2003 | Identical |
I.S. EN 62506:2013 | METHODS FOR PRODUCT ACCELERATED TESTING (IEC 62506:2013 (EQV)) |
IEC 60300-3-7:1999 | Dependability management - Part 3-7: Application guide - Reliability stress screening of electronic hardware |
EN 62506 : 2013 | METHODS FOR PRODUCT ACCELERATED TESTING (IEC 62506:2013) |
EN 62429:2008 | Reliability growth - Stress testing for early failures in unique complex systems |
BS EN 61709:2017 | Electric components. Reliability. Reference conditions for failure rates and stress models for conversion |
BS EN 62506:2013 | Methods for product accelerated testing |
PD IEC/TR 62721:2012 | Reliability of devices used in fibre optic systems. General and guidance |
BS EN 60300-2:2004 | Dependability management Guidelines for dependability management |
NF EN 62429 : 2008 | RELIABILITY GROWTH - STRESS TESTING FOR EARLY FAILURES IN UNIQUE COMPLEX SYSTEMS |
09/30184127 DC : 0 | BS EN 61709 - ELECTRONIC COMPONENTS - RELIABILITY - REFERENCE CONDITIONS FOR FAILURE RATES AND STRESS MODELS FOR CONVERSION |
BS IEC 60300-3.7 : 1999 | DEPENDABILITY MANAGEMENT - APPLICATION GUIDE - RELIABILITY STRESS SCREENING OF ELECTRONIC HARDWARE |
15/30310531 DC : 0 | BS EN 61709 ED 3.0 - ELECTRIC COMPONENTS - RELIABILITY - REFERENCE CONDITIONS FOR FAILURE RATES AND STRESS MODELS FOR CONVERSION |
EN 61709:2017 | Electric components - Reliability - Reference conditions for failure rates and stress models for conversion |
IEC TR 62721:2012 | Reliability of devices used in fibre optic systems - General and guidance |
I.S. EN 60300-2:2004 | DEPENDABILITY MANAGEMENT - PART 2: GUIDELINES FOR DEPENDABILITY MANAGEMENT |
CEI EN 62429 : 2008 | RELIABILITY GROWTH - STRESS TESTING FOR EARLY FAILURES IN UNIQUE COMPLEX SYSTEMS |
BS EN 62429:2008 | Reliability growth. Stress testing for early failures in unique complex systems |
IEC 61709:2017 RLV | Electric components - Reliability - Reference conditions for failure rates and stress models for conversion |
IEC 62506:2013 | Methods for product accelerated testing |
CEI EN 62506 : 2014 | METHODS FOR PRODUCT ACCELERATED TESTING |
CEI EN 60300-3-4 : 2010 | DEPENDABILITY MANAGEMENT - PART 3-4: APPLICATION GUIDE - GUIDE TO THE SPECIFICATION OF DEPENDABILITY REQUIREMENTS |
CSA ISO/TR 10017 : 2003 : R2013 | GUIDANCE ON STATISTICAL TECHNIQUES FOR ISO 9001:2000 |
I.S. EN 61709:2017 | ELECTRIC COMPONENTS - RELIABILITY - REFERENCE CONDITIONS FOR FAILURE RATES AND STRESS MODELS FOR CONVERSION |
S.R. ISO/TR 10017:2003 | GUIDANCE ON STATISTICAL TECHNIQUES FOR ISO 9001:2000 |
UNE-EN 62429:2012 | Reliability growth - Stress testing for early failures in unique complex systems |
IEC 60300-2:2004 | Dependability management - Part 2: Guidelines for dependability management |
CSA ISO/TR 10017:2003 | GUIDANCE ON STATISTICAL TECHNIQUES FOR ISO 9001:2000 |
PD ISO/TR 10017:2003 | Guidance on statistical techniques for ISO 9001:2000 |
I.S. EN 62429:2008 | RELIABILITY GROWTH - STRESS TESTING FOR EARLY FAILURES IN UNIQUE COMPLEX SYSTEMS |
ISO/TR 10017:2003 | Guidance on statistical techniques for ISO 9001:2000 |
CEI 56-44 : 2000 | DEPENDABILITY MANAGEMENT - PART 3-7: APPLICATION GUIDE - RELIABILITY STRESS SCREENING OF ELECTRONIC HARDWARE |
IEC 62429:2007 | Reliability growth - Stress testing for early failures in unique complex systems |
EN 60300-2:2004 | Dependability management - Part 2: Guidelines for dependability management |
IEC 61709:2017 | Electric components - Reliability - Reference conditions for failure rates and stress models for conversion |
IEC 61163-1:2006 | Reliability stress screening - Part 1: Repairable assemblies manufactured in lots |
IEC 61709:2017 | Electric components - Reliability - Reference conditions for failure rates and stress models for conversion |
IEC 60300-1:2014 | Dependability management - Part 1: Guidance for management and application |
IEC 60300-2:2004 | Dependability management - Part 2: Guidelines for dependability management |
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