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IEC 61751:1998

Superseded

Superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

View Superseded by

Laser modules used for telecommunication - Reliability assessment

Available format(s)

Hardcopy , PDF , PDF 3 Users , PDF 5 Users , PDF 9 Users

Superseded date

02-02-2012

Language(s)

English - French

Published date

26-02-1998

€244.32
Excluding VAT

FOREWORD
INTRODUCTION
1 Scope
2 Normative references
3 Terms and definitions
4 Laser reliability and quality assurance procedure
    4.1 Demonstration of product quality
    4.2 Testing responsibilities
    4.3 Quality Improvement Programmes (QIPs)
5 Tests
    5.1 Structural similarity
    5.2 Burn-in and screening (when applicable in the DS)
6 Activities
    6.1 Analysis of reliability results
    6.2 Technical visits to LMMs
    6.3 Design/process changes
    6.4 Deliveries
    6.5 Supplier documentation
Annex A (normative) Laser diode and laser module failure
mechanisms
Annex B (informative) Guide
Figures
    A.1 Non-linearities in laser-current characteristics
    A.2 'Bathtub' failure rate curve
    A.3 Example of cumulative failure plot showing log-normal
          distribution of laser failure rate
    A.4 Calculated failure rates for components having a
          log-normal lifetime distribution, with a median
          life of 10(6)h and dispersion in the range of
          0.5 to 2.0
    A.5 Cross-section through a typical laser module showing
          key components
    A.6 Cross-section through a typical buried heterostructure
          laser (bonded junction side up)

The aim of this standard is:- to establish a standard method of assessing the reliability of laser modules in order to minimize risks and to promote product development and reliability;- to establish means by which the distribution of failures with time can be determined. This should enable the determination of equipment failure rates for specified end of life criteria.

DevelopmentNote
Also numbered as BS EN 61751. (09/2005)
DocumentType
Standard
Pages
69
PublisherName
International Electrotechnical Committee
Status
Superseded
SupersededBy

Standards Relationship
NF EN 61751 : 1998 Identical
NEN EN IEC 61751 : 1998 Identical
I.S. EN 61751:1999 Identical
PN EN 61751 : 2002 Identical
SN EN 61751 : 1998 Identical
UNE-EN 61751:1998 Identical
CEI EN 61751 : 1999 Identical
EN 61751:1998 Identical
DIN EN 61751:1998-11 Identical

IEC 60747-5-4:2006 Semiconductor devices - Discrete devices - Part 5-4: Optoelectronic devices - Semiconductor lasers
02/211632 DC : DRAFT DEC 2002 IEC 69747-5-4 ED.1 - SEMICONDUCTOR DEVICES - DISCRETE DEVICES - PART 5-4: OPTOELECTRONIC DEVICES - SEMICONDUCTOR LASERS
I.S. EN 62149-1:2012 FIBRE OPTIC ACTIVE COMPONENTS AND DEVICES - PERFORMANCE STANDARDS - PART 1: GENERAL AND GUIDANCE (IEC 61753-059-2:201X (86B/3338/CDV) (EQV) + IEC 62149-1:2011 (EQV))
EN 62149-1:2012 Fibre optic active components and devices - Performance standards - Part 1: General and guidance
EN 62496-3:2011 Optical circuit boards - Part 3: Performance standards - General and guidance
EN 62308 : 2006 EQUIPMENT RELIABILITY - RELIABILITY ASSESSMENT METHODS
07/30170374 DC : DRAFT AUG 2007 BS EN 61751-2 - LASER MODULES USED FOR TELECOMMUNICATIONS - RELIABILITY ASSESSMENT - PART 2: TECHNICAL REPORT ON LASER MODULE DEGRADATION
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I.S. EN 62496-3:2011 OPTICAL CIRCUIT BOARDS - PART 3: PERFORMANCE STANDARDS - GENERAL AND GUIDANCE
CEI EN 62496-3 : 2012 OPTICAL CIRCUIT BOARDS - PART 3: PERFORMANCE STANDARDS - GENERAL AND GUIDANCE
04/30101075 DC : DRAFT JUN 2004
BS EN 62496-3:2011 Optical circuit boards Performance standards. General and guidance
NF EN 61291 5-2 : 2003 OPTICAL AMPLIFIERS - PART 5-2: QUALIFICATION SPECIFICATIONS - RELIABILITY QUALIFICATION FOR OPTICAL FIBRE AMPLIFIERS
I.S. EN 62308:2006 EQUIPMENT RELIABILITY - RELIABILITY ASSESSMENT METHODS
IEC 62149-1:2011 Fibre optic active components and devices - Performance standards - Part 1: General and guidance
BS EN ISO 17526:2003 Optics and optical instruments. Lasers and laser-related equipment. Lifetime of lasers
IEC 62496-3:2011 Optical circuit boards - Part 3: Performance standards - General and guidance
EN ISO 17526:2003 Optics and optical instruments - Lasers and laser-related equipment - Lifetime of lasers (ISO 17526:2003)
11/30249625 DC : 0 BS EN 62149-1 - FIBRE OPTIC ACTIVE COMPONENTS AND DEVICES - PERFORMANCE STANDARDS - PART 1: GENERAL AND GUIDANCE
BS EN 62149-1:2012 Fibre optic active components and devices. Performance standards General and guidance
BS IEC 60747-5-4:2006 Semiconductor devices. Discrete devices Optoelectronic devices. Semiconductor lasers
CEI EN 62149-1 : 2012 FIBRE OPTIC ACTIVE COMPONENTS AND DEVICES - PERFORMANCE STANDARDS - PART 1: GENERAL AND GUIDANCE
09/30206094 DC : 0 BS EN 62496-3 - OPTICAL CIRCUIT BOARDS - PART 3: PERFORMANCE STANDARDS - GENERAL AND GUIDANCE
IEC 62308:2006 Equipment reliability - Reliability assessment methods

MIL-STD-883 Revision K:2016 TEST METHOD STANDARD - MICROCIRCUITS
IEC 60747-12-2:1995 Semiconductor devices - Part 12: Optoelectronic devices - Section 2: Blank detail specification for laser diode modules with pigtail for fibre optic systems and sub-systems
IEC 60747-1:2006+AMD1:2010 CSV Semiconductor devices - Part 1: General
IEC 60749:1996+AMD1:2000+AMD2:2001 CSV Semiconductor devices - Mechanical and climatic test methods
ISO 9000:2015 Quality management systems — Fundamentals and vocabulary
IEC 60068-2-1:2007 Environmental testing - Part 2-1: Tests - Test A: Cold
IEC 60068-2-14:2009 Environmental testing - Part 2-14: Tests - Test N: Change of temperature

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