IEC 61751:1998
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
View Superseded by
Laser modules used for telecommunication - Reliability assessment
Hardcopy , PDF , PDF 3 Users , PDF 5 Users , PDF 9 Users
02-02-2012
English - French
26-02-1998
FOREWORD
INTRODUCTION
1 Scope
2 Normative references
3 Terms and definitions
4 Laser reliability and quality assurance procedure
4.1 Demonstration of product quality
4.2 Testing responsibilities
4.3 Quality Improvement Programmes (QIPs)
5 Tests
5.1 Structural similarity
5.2 Burn-in and screening (when applicable in the DS)
6 Activities
6.1 Analysis of reliability results
6.2 Technical visits to LMMs
6.3 Design/process changes
6.4 Deliveries
6.5 Supplier documentation
Annex A (normative) Laser diode and laser module failure
mechanisms
Annex B (informative) Guide
Figures
A.1 Non-linearities in laser-current characteristics
A.2 'Bathtub' failure rate curve
A.3 Example of cumulative failure plot showing log-normal
distribution of laser failure rate
A.4 Calculated failure rates for components having a
log-normal lifetime distribution, with a median
life of 10(6)h and dispersion in the range of
0.5 to 2.0
A.5 Cross-section through a typical laser module showing
key components
A.6 Cross-section through a typical buried heterostructure
laser (bonded junction side up)
The aim of this standard is:- to establish a standard method of assessing the reliability of laser modules in order to minimize risks and to promote product development and reliability;- to establish means by which the distribution of failures with time can be determined. This should enable the determination of equipment failure rates for specified end of life criteria.
DevelopmentNote |
Also numbered as BS EN 61751. (09/2005)
|
DocumentType |
Standard
|
Pages |
69
|
PublisherName |
International Electrotechnical Committee
|
Status |
Superseded
|
SupersededBy |
Standards | Relationship |
NF EN 61751 : 1998 | Identical |
NEN EN IEC 61751 : 1998 | Identical |
I.S. EN 61751:1999 | Identical |
PN EN 61751 : 2002 | Identical |
SN EN 61751 : 1998 | Identical |
UNE-EN 61751:1998 | Identical |
CEI EN 61751 : 1999 | Identical |
EN 61751:1998 | Identical |
DIN EN 61751:1998-11 | Identical |
IEC 60747-5-4:2006 | Semiconductor devices - Discrete devices - Part 5-4: Optoelectronic devices - Semiconductor lasers |
02/211632 DC : DRAFT DEC 2002 | IEC 69747-5-4 ED.1 - SEMICONDUCTOR DEVICES - DISCRETE DEVICES - PART 5-4: OPTOELECTRONIC DEVICES - SEMICONDUCTOR LASERS |
I.S. EN 62149-1:2012 | FIBRE OPTIC ACTIVE COMPONENTS AND DEVICES - PERFORMANCE STANDARDS - PART 1: GENERAL AND GUIDANCE (IEC 61753-059-2:201X (86B/3338/CDV) (EQV) + IEC 62149-1:2011 (EQV)) |
EN 62149-1:2012 | Fibre optic active components and devices - Performance standards - Part 1: General and guidance |
EN 62496-3:2011 | Optical circuit boards - Part 3: Performance standards - General and guidance |
EN 62308 : 2006 | EQUIPMENT RELIABILITY - RELIABILITY ASSESSMENT METHODS |
07/30170374 DC : DRAFT AUG 2007 | BS EN 61751-2 - LASER MODULES USED FOR TELECOMMUNICATIONS - RELIABILITY ASSESSMENT - PART 2: TECHNICAL REPORT ON LASER MODULE DEGRADATION |
BS EN 62308:2006 | Equipment reliability. Reliability assessment methods |
DIN EN ISO 17526:2003-10 | OPTIC AND OPTICAL INSTRUMENTS - LASERS AND LASER-RELATED EQUIPMENT - LIFETIME OF LASERS |
ISO 17526:2003 | Optics and optical instruments Lasers and laser-related equipment Lifetime of lasers |
I.S. EN 62496-3:2011 | OPTICAL CIRCUIT BOARDS - PART 3: PERFORMANCE STANDARDS - GENERAL AND GUIDANCE |
CEI EN 62496-3 : 2012 | OPTICAL CIRCUIT BOARDS - PART 3: PERFORMANCE STANDARDS - GENERAL AND GUIDANCE |
04/30101075 DC : DRAFT JUN 2004 | |
BS EN 62496-3:2011 | Optical circuit boards Performance standards. General and guidance |
NF EN 61291 5-2 : 2003 | OPTICAL AMPLIFIERS - PART 5-2: QUALIFICATION SPECIFICATIONS - RELIABILITY QUALIFICATION FOR OPTICAL FIBRE AMPLIFIERS |
I.S. EN 62308:2006 | EQUIPMENT RELIABILITY - RELIABILITY ASSESSMENT METHODS |
IEC 62149-1:2011 | Fibre optic active components and devices - Performance standards - Part 1: General and guidance |
BS EN ISO 17526:2003 | Optics and optical instruments. Lasers and laser-related equipment. Lifetime of lasers |
IEC 62496-3:2011 | Optical circuit boards - Part 3: Performance standards - General and guidance |
EN ISO 17526:2003 | Optics and optical instruments - Lasers and laser-related equipment - Lifetime of lasers (ISO 17526:2003) |
11/30249625 DC : 0 | BS EN 62149-1 - FIBRE OPTIC ACTIVE COMPONENTS AND DEVICES - PERFORMANCE STANDARDS - PART 1: GENERAL AND GUIDANCE |
BS EN 62149-1:2012 | Fibre optic active components and devices. Performance standards General and guidance |
BS IEC 60747-5-4:2006 | Semiconductor devices. Discrete devices Optoelectronic devices. Semiconductor lasers |
CEI EN 62149-1 : 2012 | FIBRE OPTIC ACTIVE COMPONENTS AND DEVICES - PERFORMANCE STANDARDS - PART 1: GENERAL AND GUIDANCE |
09/30206094 DC : 0 | BS EN 62496-3 - OPTICAL CIRCUIT BOARDS - PART 3: PERFORMANCE STANDARDS - GENERAL AND GUIDANCE |
IEC 62308:2006 | Equipment reliability - Reliability assessment methods |
MIL-STD-883 Revision K:2016 | TEST METHOD STANDARD - MICROCIRCUITS |
IEC 60747-12-2:1995 | Semiconductor devices - Part 12: Optoelectronic devices - Section 2: Blank detail specification for laser diode modules with pigtail for fibre optic systems and sub-systems |
IEC 60747-1:2006+AMD1:2010 CSV | Semiconductor devices - Part 1: General |
IEC 60749:1996+AMD1:2000+AMD2:2001 CSV | Semiconductor devices - Mechanical and climatic test methods |
ISO 9000:2015 | Quality management systems — Fundamentals and vocabulary |
IEC 60068-2-1:2007 | Environmental testing - Part 2-1: Tests - Test A: Cold |
IEC 60068-2-14:2009 | Environmental testing - Part 2-14: Tests - Test N: Change of temperature |
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