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IEC 61967-5:2003

Withdrawn

Withdrawn

A Withdrawn Standard is one, which is removed from sale, and its unique number can no longer be used. The Standard can be withdrawn and not replaced, or it can be withdrawn and replaced by a Standard with a different number.

Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 5: Measurement of conducted emissions - Workbench Faraday Cage method

Available format(s)

Hardcopy , PDF , PDF 3 Users , PDF 5 Users , PDF 9 Users

Withdrawn date

21-10-2024

Language(s)

English - French

Published date

13-02-2003

€155.95
Excluding VAT

FOREWORD
INTRODUCTION
1 Scope
2 Normative references
3 Definitions
4 General
  4.1 Measurement philosophy
  4.2 Principle set-up
  4.3 Workbench concept
5 Test conditions
6 Test equipment
7 Test set-up
  7.1 Shielding and ambient fields
  7.2 Workbench set-up
  7.3 Connections to the PCB
  7.4 Common-mode points
      7.4.1 Comparison testing
      7.4.2 Definitive application
  7.5 Emission limits
  7.6 Workbench - Practical implementation
  7.7 Test PCB
8 Test procedure
9 Test report
  9.1 Emission criteria
  9.2 Emission levels
Annex A (normative) - Detail specification of Workbench
                        Faraday Cage (WBFC)
Annex B (informative) - Common-mode impedances
Annex C (informative) - Derivation of limits
Annex D (informative) - Use of the Workbench
Bibliography
Figures
Tables

Describes a method to measure the conducted electromagnetic emission of integrated circuits either applied on a standardised test-board or on a final printed circuit board (PCB). Has a high repeatability and a good relationship to the measured RF emission of final applications with the integrated circuits used.

Committee
TC 47/SC 47A
DevelopmentNote
To be read in conjunction with IEC 61967-1. (02/2003) Stability Date: 2019. (09/2017)
DocumentType
Standard
Pages
47
PublisherName
International Electrotechnical Committee
Status
Withdrawn

Standards Relationship
SN EN 61967-5 : 2003 Identical
CEI EN 61967-5 : 2004 Identical
DIN EN 61967-5:2003-10 Identical
NF EN 61967-5 : 2003 Identical
PN EN 61967-5 : 2004 Identical
EN 61967-5:2003 Identical
NEN EN IEC 61967-5 : 2003 Identical
BS EN 61967-5:2003 Identical
I.S. EN 61967-5:2003 Identical
UNE-EN 61967-5:2003 Identical

PD IEC/TR 61967-4-1:2005 Integrated circuits. Measurement of electromagnetic emissions, 150 kHz to 1 GHz Measurement of conducted emissions. 1 Ohm/150 Ohm direct coupling method. Application guidance to IEC 61967-4
06/30152634 DC : DRAFT JULY 2006
CEI EN 61967-1 : 2002 INTEGRATED CIRCUITS - MEASUREMENT OF ELECTROMAGNETIC EMISSIONS, 150 KHZ TO 1 GHZ - PART 1: GENERAL CONDITIONS AND DEFINITIONS
I.S. EN 62132-5:2006 INTEGRATED CIRCUITS - MEASUREMENT OF ELECTROMAGNETIC IMMUNITY, 150 KHZ TO 1 GHZ - PART 5: WORKBENCH FARADAY CAGE METHOD
EN IEC 62969-1:2018 Semiconductor devices - Semiconductor interface for automotive vehicles - Part 1: General requirements of power interface for automotive vehicle sensors
IEC 62969-1:2017 Semiconductor devices - Semiconductor interface for automotive vehicles - Part 1: General requirements of power interface for automotive vehicle sensors
IEC 62132-5:2005 Integrated circuits - Measurement of electromagnetic immunity, 150 kHz to 1 GHz - Part 5: Workbench Faraday cage method
BS EN 62132-5:2006 Integrated circuits. Measurement of electromagnetic immunity, 150 kHz to 1 GHz Workbench Faraday cage method
07/30163156 DC : 0 BS EN 62433-2 - MODELS OF INTEGRATED CIRCUITS FOR EMI BEHAVIOURAL SIMULATION - ICEM-CE, ICEM CONDUCTED EMISSION MODEL
IEC 61967-1:2002 Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 1: General conditions and definitions
16/30336986 DC : 0 BS EN 62969-1 - SEMICONDUCTOR DEVICES - SEMICONDUCTOR INTERFACE FOR AUTOMOTIVE VEHICLES - PART 1: GENERAL REQUIREMENTS OF POWER INTERFACE FOR AUTOMOTIVE VEHICLE SENSORS
01/209170 DC : DRAFT DEC 2001 IEC 62132-5 ED.1 - INTEGRATED CIRCUITS, MEASUREMENT OF ELECTROMAGNETIC IMMUNITY - PART 5: MEASUREMENT OF CONDUCTED IMMUNITY - WORKBENCH FARADAY CAGE METHOD
IEC TR 61967-4-1:2005 Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 4-1: Measurement of conducted emissions - 1 Ω/150 Ω direct coupling method - Application guidance to IEC 61967-4
EN 62132-5:2006 Integrated circuits - Measurement of electromagnetic immunity, 150 kHz to 1 GHz - Part 5: Workbench Faraday cage method

IEC 60050-131:2002 International Electrotechnical Vocabulary (IEV) - Part 131: Circuit theory
MIL-STD-285 Base Document:1956 ATTENUATION MEASUREMENTS FOR ENCLOSURES, ELECTROMAGNETIC SHIELDING, FOR ELECTRONIC TEST PURPOSES, METHOD OF
IEC 61967-1:2002 Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 1: General conditions and definitions
IEC 61000-4-6:2013 Electromagnetic compatibility (EMC) - Part 4-6: Testing and measurement techniques - Immunity to conducted disturbances, induced by radio-frequency fields
IEC 61967-4:2002+AMD1:2006 CSV Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 4: Measurement of conducted emissions - 1 Ω/150 Ω direct coupling method
CISPR 16-2:2003 Specification for radio disturbance and immunity measuring apparatus and methods - Part 2: Methods of measurement of disturbances and immunity
IEC 61967-6:2002+AMD1:2008 CSV Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method
CISPR 16-1:1999+AMD1:2002 CSV Specification for radio disturbance and immunity measuring apparatus and methods - Part 1: Radio disturbance and immunity measuring apparatus

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