• BS EN 60122-1 : 2002

    Current The latest, up-to-date edition.

    QUARTZ CRYSTAL UNITS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION

    Available format(s):  Hardcopy, PDF

    Language(s):  English

    Published date:  01-01-2002

    Publisher:  British Standards Institution

    Add To Cart

    Table of Contents - (Show below) - (Hide below)

    1 General
      1.1 Scope
      1.2 Normative reference
      1.3 Order of precedence
    2 Terminology and general requirements
      2.1 General
      2.2 Terms, definitions and classification of
           phenomena
      2.3 Preferred ratings and characteristics
           2.3.1 Temperature ranges in degrees Celsius
                  (degree C) suitable for ambient operation
           2.3.2 Elevated temperature ranges in degrees
                  Celsius (degree C) suitable for oven
                  control
           2.3.3 Frequency tolerance (1x10[-6])
           2.3.4 Circuit conditions
           2.3.5 Levels of drive
           2.3.6 Drive level dependency
           2.3.7 Climatic category
           2.3.8 Bump severity
           2.3.9 Vibration severity
           2.3.10 Shock severity
           2.3.11 Leak rate
      2.4 Marking
    3 Quality assessment procedures
      3.1 Primary stage of manufacture
      3.2 Structurally similar components
      3.3 Subcontracting
      3.4 Manufacturer's approval
      3.5 Approval procedures
           3.5.1 General
           3.5.2 Capability approval
           3.5.3 Qualification approval
      3.6 Procedures for capability approval
           3.6.1 General
           3.6.2 Eligibility for capability approval
           3.6.3 Application for capability approval
           3.6.4 Granting of capability approval
           3.6.5 Capability manual
      3.7 Procedures for qualification approval
           3.7.1 General
           3.7.2 Eligibility for qualification approval
           3.7.3 Application for qualification approval
           3.7.4 Granting of qualification approval
           3.7.5 Quality conformance inspection
      3.8 Test procedures
      3.9 Screening requirements
      3.10 Rework and repair work
           3.10.1 Rework
           3.10.2 Repair work
      3.11 Certified records of related lots
      3.12 Validity of release
      3.13 Release for delivery
      3.14 Unchecked parameters
    4 Test and measurement procedures
      4.1 General
      4.2 Alternative test methods
      4.3 Precision of measurement
      4.4 Standard conditions for testing
      4.5 Visual inspection
           4.5.1 Visual test A
           4.5.2 Visual test B
           4.5.3 Visual test C
      4.6 Dimensioning and gauging procedures
           4.6.1 Dimensions, test A
           4.6.2 Dimensions, test B
      4.7 Electrical test procedures
           4.7.1 Frequency and resonance resistance
           4.7.2 Drive level dependency
           4.7.3 Frequency and resonance resistance as a
                  function of temperature
           4.7.4 Unwanted responses
           4.7.5 Shunt capacitance
           4.7.6 Load resonance frequency and resistance
           4.7.7 Frequency pulling range (f[L1], f[L2])
           4.7.8 Motional parameters
           4.7.9 Insulation resistance
      4.8 Mechanical and environmental test procedures
           4.8.1 Robustness of terminations (destructive)
           4.8.2 Sealing tests (non-destructive)
           4.8.3 Soldering (solderability and resistance to
                  soldering heat) (destructive)
           4.8.4 Rapid change of temperature, two-fluid bath
                  method (non-destructive)
           4.8.5 Rapid change of temperature with prescribed
                  time of transition (non-destructive)
           4.8.6 Bump (destructive)
           4.8.7 Vibration (destructive)
           4.8.8 Shock (destructive)
           4.8.9 Free fall (destructive)
           4.8.10 Acceleration, steady state (non-destructive)
           4.8.11 Dry heat (non-destructive)
           4.8.12 Damp heat, cyclic (destructive)
           4.8.13 Cold (non-destructive)
           4.8.14 Climatic sequence (destructive)
           4.8.15 Damp heat, steady state (destructive)
           4.8.16 Immersion in cleaning solvents (non-destructive)
      4.9 Endurance test procedures
    Annex ZA (normative) Normative references to international
             publications with their corresponding European
             publications
    Bibliography
    Figures
    Tables

    Abstract - (Show below) - (Hide below)

    Gives the methods of test and general requirements for quartz crystal units of assessed quality using either capability approval or qualification approval procedures.

    General Product Information - (Show below) - (Hide below)

    Committee EPL/49
    Development Note Supersedes BS EN 168000 (02/2003)
    Document Type Standard
    Publisher British Standards Institution
    Status Current
    Supersedes

    Standards Referencing This Book - (Show below) - (Hide below)

    HD 323.2.20 : 200S3 BASIC ENVIRONMENTAL TESTING PROCEDURES - TESTS - TEST T - SOLDERING
    EN 60444-4:1997 Measurement of quartz crystal unit parameters by zero phase technique in a pi-network - Part 4: Method for the measurement of the load resonance frequency fL, load resonance resistance RL and the calculation of other derived values of quartz crystal units, up to 30 MHz
    IEC 60068-1:2013 Environmental testing - Part 1: General and guidance
    IEC 60068-2-58:2015+AMD1:2017 CSV Environmental testing - Part 2-58: Tests - Test Td: Test methods for solderability, resistance to dissolution of metallization and to soldering heat of surface mounting devices (SMD)
    IEC 60068-2-27:2008 Environmental testing - Part 2-27: Tests - Test Ea and guidance: Shock
    IEC 60068-2-20:2008 Environmental testing - Part 2-20: Tests - Test T: Test methods for solderability and resistance to soldering heat of devices with leads
    IEC 60122-3:2010 Quartz crystal units of assessed quality - Part 3: Standard outlines and lead connections
    EN 60068-2-1:2007 Environmental testing - Part 2-1: Tests - Test A: Cold
    IECQ 001002-3:2005 IEC QUALITY ASSESSMENT SYSTEM FOR ELECTRONIC COMPONENTS (IECQ) - RULES OF PROCEDURE - PART 3: APPROVAL PROCEDURES
    EN 60068-2-2:2007 Environmental testing - Part 2-2: Tests - Test B: Dry heat
    IEC 60068-2-21:2006 Environmental testing - Part 2-21: Tests - Test U: Robustness of terminations and integral mounting devices
    IEC 60068-2-13:1983 Basic environmental testing procedures - Part 2-13: Tests - Test M: Low air pressure
    EN 60068-1:2014 Environmental testing - Part 1: General and guidance
    EN 60444-2:1997 Measurement of quartz crystal unit parameters by zero phase technique in a pi-network - Part 2: Phase offset method for measurement of motional capacitance of quartz crystal units
    IEC 60444-5:1995 Measurement of quartz crystal units parameters - Part 5: Methods for the determination of equivalent electrical parameters using automatic network analyzer techniques and error correction
    IEC 60444-2:1980 Measurement of quartz crystal unit parameters by zero phase technique in a pi-network. Part 2: Phase offset method for measurement of motional capacitance of quartz crystal units
    IEC 61178-3:1993 Quartz crystal units - A specification in the IEC Quality Assessment System for Electronic Components (IECQ) - Part 3: Sectional specification - Qualification approval
    IECQ 001002-2:1998 IEC QUALITY ASSESSMENT SYSTEM FOR ELECTRONIC COMPONENTS (IECQ) - RULES OF PROCEDURE - PART 2: DOCUMENTATION
    IEC 60444-6:2013 Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level dependence (DLD)
    EN 60068-2-7:1993 Environmental testing - Part 2: Tests - Test Ga: Acceleration, steady state
    IEC 60068-2-64:2008 Environmental testing - Part 2-64: Tests - Test Fh: Vibration, broadband random and guidance
    EN 60444-1:1997/A1:1999 MEASUREMENT OF QUARTZ CRYSTAL UNIT PARAMETERS BY ZERO PHASE TECHNIQUE IN A PI-NETWORK - PART 1: BASIC METHOD FOR THE MEASUREMENT OF RESONANCE FREQUENCY AND RESONANCE RESISTANCE OF QUARTZ CRYSTAL UNITS BY ZERO PHASE TECHNIQUE IN A PI-NETWORK
    IEC TR 60444-4:1988 Measurement of quartz crystal unit parameters by zero phase technique in a pi-network. Part 4: Method for the measurement of the load resonance frequency fL, load resonance resistance RL and the calculation of other derived values of quartz crystal units, up to 30 MHz
    IEC 60410:1973 Sampling plans and procedures for inspection by attributes
    EN 60068-2-27:2009 Environmental testing - Part 2-27: Tests - Test Ea and guidance: Shock
    HD 323.2.3 : 200S2 BASIC ENVIRONMENTAL TESTING PROCEDURES - TESTS - TEST CA - DAMP HEAT, STEADY STATE
    EN 60444-6:2013 Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level dependence (DLD)
    IEC 60068-2-3:1969 Basic environmental testing procedures - Part 2-3: Tests - Test Ca: Damp heat, steady state
    IEC GUIDE 102:1996 Electronic components - Specification structures for qualityassessment (Qualification approval and capability approval)
    EN 60068-2-17:1994 Environmental testing - Part 2: Tests - Test Q: Sealing
    IEC 60068-2-17:1994 Basic environmental testing procedures - Part 2-17: Tests - Test Q: Sealing
    EN 60068-2-21:2006 Environmental testing - Part 2-21: Tests - Test U: Robustness of terminations and integral mounting devices
    IEC 60068-2-2:2007 Environmental testing - Part 2-2: Tests - Test B: Dry heat
    IECQ 001002-1:1998 IEC QUALITY ASSESSMENT SYSTEM FOR ELECTRONIC COMPONENTS (IECQ) - RULES OF PROCEDURE - PART 1: ADMINISTRATION
    EN 60068-2-29:1993 Environmental testing - Part 2: Tests - Test Eb and guidance: Bump
    EN 60068-2-13:1999 Environmental testing - Part 2: Tests - Test M: Low air pressure
    EN 60068-2-6:2008 Environmental testing - Part 2-6: Tests - Test Fc: Vibration (sinusoidal)
    IEC 60050-561:2014 International Electrotechnical Vocabulary (IEV) - Part 561: Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection
    IEC 60068-2-29:1987 Environmental testing. Part 2: Tests. Test Eb and guidance: Bump
    IEC 61178-2:1993 Quartz crystal units - A specification in the IEC Quality Assessment System for Electronic Components (IECQ) - Part 2: Sectional specification - Capability approval
    EN 60444-5:1997 Measurement of quartz crystal unit parameters - Part 5: Methods for the determination of equivalent electrical parameters using automatic network analyzer techniques and error correction
    IEC 60068-2-1:2007 Environmental testing - Part 2-1: Tests - Test A: Cold
    EN 60068-2-30:2005 Environmental testing - Part 2-30: Tests - Test Db: Damp heat, cyclic (12 h + 12 h cycle)
    EN 60068-2-32:1993 Basic environmental testing procedures - Part 2: Tests - Test Ed: Free fall
    IEC 60068-2-14:2009 Environmental testing - Part 2-14: Tests - Test N: Change of temperature
    EN 60068-2-45:1992/A1:1993 Environmental testing - Part 2: Tests - Test Xa and guidance: Immersion in cleaning solvents
    EN 60122-3:2010 Quartz crystal units of assessed quality - Part 3: Standard outlines and lead connections
    EN 60068-2-14:2009 Environmental testing - Part 2-14: Tests - Test N: Change of temperature
    IEC 60068-2-30:2005 Environmental testing - Part 2-30: Tests - Test Db: Damp heat, cyclic (12 h + 12 h cycle)
    • Access your standards online with a subscription

      Features

      • Simple online access to standards, technical information and regulations
      • Critical updates of standards and customisable alerts and notifications
      • Multi - user online standards collection: secure, flexibile and cost effective