03/100395 DC : DRAFT APR 2003
Withdrawn
Withdrawn
A Withdrawn Standard is one, which is removed from sale, and its unique number can no longer be used. The Standard can be withdrawn and not replaced, or it can be withdrawn and replaced by a Standard with a different number.
EN 175101-809 - DETAIL SPECIFICATION - TWO-PART CONNECTORS FOR PRINTED BOARDS HAVING A GRID OF 2,54 MM, SHORT VERSION IN COMPLIANCE WITH CECC 75 101-801, WITH ASSESSED QUALITY
Withdrawn date
23-07-2013
Published date
23-11-2012
Publisher
EN 175101-809
Committee |
EPL/48/2
|
DocumentType |
Draft
|
PublisherName |
British Standards Institution
|
Status |
Withdrawn
|
ISO 272:1982 | Fasteners — Hexagon products — Widths across flats |
IEC 61076-1:2006 | Connectors for electronic equipment - Product requirements - Part 1: Generic specification |
IEC 60512-11-4:2002 | Connectors for electronic equipment - Tests and measurements - Part 11-4: Climatic tests - Test 11d: Rapid change of temperature |
IEC 60512-8:1993 | Electromechanical components for electronic equipment; basic testing procedures and measuring methods - Part 8: Connector tests (mechanical) and mechanical tests on contacts and terminations |
IEC 60512-11-9:2002 | Connectors for electronic equipment - Tests and measurements - Part 11-9: Climatic tests - Test 11i: Dry heat |
IEC 60512-11-10:2002 | Connectors for electronic equipment - Tests and measurements - Part 11-10: Climatic tests - Test 11j: Cold |
IEC 60512-4-2:2002 | Connectors for electronic equipment - Tests and measurements - Part 4-2: Voltage stress tests - Test 4b: Partial discharge |
IEC 60512-3-1:2002 | Connectors for electronic equipment - Tests and measurements - Part 3-1: Insulation tests - Test 3a: Insulation resistance |
IEC 60068-1:2013 | Environmental testing - Part 1: General and guidance |
IEC 60512-6:1984 | Electromechanical components for electronic equipment; basic testing procedures and measuring methods. Part 6: Climatic tests and soldering tests |
IEC 60512-6-3:2002 | Connectors for electronic equipment - Tests and measurements - Part 6-3: Dynamic stress tests - Test 6c: Shock |
IEC 60512-11-8:1995 | Electromechanical components for electronic equipment - Basic testing procedures and measuring methods - Part 11: Climatic tests - Section 8: Test 11h - Sand and dust |
IEC 60512-6-1:2002 | Connectors for electronic equipment - Tests and measurements - Part 6-1: Dynamic stress tests - Test 6a: Acceleration, steady state |
IEC 60512-7:1993 | Electromechanical components for electronic equipment; basic testing procedures and measuring methods - Part 7: Mechanical operating tests and sealing tests |
IEC 60512-11-14:2003 | Connectors for electronic equipment - Tests and measurements - Part 11-14: Climatic tests - Test 11p: Flowing single gas corrosion test |
IEC 60097:1991 | Grid systems for printed circuits |
IEC 60512-2-5:2003 | Connectors for electronic equipment - Tests and measurements - Part 2-5: Electrical continuity and contact resistance tests - Test 2e: Contact disturbance |
IEC 60352-1:1997 | Solderless connections - Part 1: Wrapped connections - General requirements, test methods and practical guidance |
IEC 60603-2:1995 | Connectors for frequencies below 3 MHz for use with printed boards - Part 2: Detail specification for two-part connectors with assessed quality, for printed boards, for basic grid of 2,54 mm (0,1 in) with common mounting features |
IEC 60410:1973 | Sampling plans and procedures for inspection by attributes |
IEC 60512-11-3:2002 | Connectors for electronic equipment - Tests and measurements - Part 11-3: Climatic tests - Test 11c: Damp heat, steady state |
ISO 468:1982 | Surface roughness — Parameters, their values and general rules for specifying requirements |
IEC 60512-1-1:2002 | Connectors for electronic equipment - Tests and measurements - Part 1-1: General examination - Test 1a: Visual examination |
IEC 60352-5:2012 | Solderless connections - Part 5: Press-in connections - General requirements, test methods and practical guidance |
IEC 61076-4:1995 | Connectors with assessed quality, for use in d.c., low-frequency analogue and in digital high-speed data applications - Part 4: Sectional specification - Printed board connectors |
IEC 60512-11-1:1995 | Electromechanical components for electronic equipment - Basic testing procedures and measuring methods - Part 11: Climatic tests - Section 1: Test 11a - Climatic sequence |
IEC 60512-2-1:2002 | Connectors for electronic equipment - Tests and measurements - Part 2-1: Electrical continuity and contact resistance tests - Test 2a: Contact resistance - Millivolt level method |
IEC 60194:2015 | Printed board design, manufacture and assembly - Terms and definitions |
IEC 60512-11-12:2002 | Connectors for electronic equipment - Tests and measurements - Part 11-12: Climatic tests - Test 11m: Damp heat, cyclic |
IEC 60512-4-1:2003 | Connectors for electronic equipment - Tests and measurements - Part 4-1: Voltage stress tests - Test 4a: Voltage proof |
IEC 60512-9:1992 | Electromechanical components for electronic equipment; basic testing procedures and measuring methods - Part 9: Miscellaneous tests |
IEC 60512-11-5:2002 | Connectors for electronic equipment - Tests and measurements - Part 11-5: Climatic tests - Test 11e: Mould growth |
IEC 60512-5:1992 | Electromechanical components for electronic equipment; basic testing procedures and measuring methods - Part 5: Impact tests (free components), static load tests (fixed components), endurance tests and overload tests |
IEC 60512-1:2001 | Connectors for electronic equipment - Tests and measurements - Part 1: General |
IEC 60512-6-4:2002 | Connectors for electronic equipment - Tests and measurements - Part 6-4: Dynamic stress tests - Test 6d: Vibration (sinusoidal) |
IEC 60326-3:1991 | Printed boards - Part 3: Design and use of printed boards |
IEC 60512-1-2:2002 | Connectors for electronic equipment - Tests and measurements - Part 1-2: General examination - Test 1b: Examination of dimension and mass |
IEC 60512-11-11:2002 | Connectors for electronic equipment - Tests and measurements - Part 11-11: Climatic tests - Test 11k: Low air pressure |
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