BS 6493-1.1:1984

Committees responsible
National foreword
Chapter I. Scope and presentation of IEC
              publications 747 and 748
1 Publications 747
    1.1 Scope
    1.2 Presentation
2 Publications 748
    2.1 Scope
    2.2 Presentation
Chapter II. Purpose and presentation of publication
              747-1
1 Purpose
2 Presentation
Chapter III. Purpose, presentation and requirements
              on the contents of publications 747-2,
              747-3, etc.
1 Purpose of each part
2 Presentation of each part
    2.1 Subdivision into chapters
    2.2 Subdivision into device sub-categories
3 Requirements on the different chapters of each part
    3.1 Requirements on Chapter I, General
          3.1.1 Purpose
    3.2 Requirements on Chapter II, Terminology and
          letter symbols
          3.2.1 Purpose
          3.2.2 Validity of terms, definitions and
                  letter symbols
          3.2.3 Letter symbols
    3.3 Requirements on Chapter III, Essential ratings
          and characteristics
          3.3.1 Purpose
    3.4 Requirements on Chapter IV, Measuring methods
          3.4.1 Purpose
    3.5 Requirements on Chapter V, Acceptance and
          reliability
          3.5.1 Purpose
Chapter IV. Terminology, general
1 Introduction
2 Physical terms
3 General terms
4 Types of devices
5 Terms related to ratings and characteristics
    5.1 Currents and voltages
    5.2 Temperatures
    5.3 Thermal characteristics
    5.4 Noise
    5.5 Various terms
    5.6 Terms characterizing the constant value or
          periodic waveforms of currents and voltages
6 Pulse terms and definitions
7 Input-to-output pulse switching times, general
    terms
Chapter V. Letter symbols, general
1 Introduction
2 Letter symbols for currents, voltages and powers
3 Letter symbols for electrical parameters
4 Letter symbols for other quantities
5 Letter symbols for logarithmic scale units for
    signal ratios expressed in dB
Chapter VI. Essential ratings and characteristics,
              general
1 Introduction
2 Standard format for the presentation of published
    data
3 Definitions
4 Definitions of cooling conditions
5 List of recommended temperatures
6 List of recommended voltages and currents
7 Mechanical ratings, characteristics and other data
8 Standardization of the position of terminals on
    bases of semiconductor devices
9 Colour coding of terminals for semiconductor
    devices
10 General information applicable to multiple devices
    having a common encapsulation
11 Production spread and compliance
12 Printed wiring and printed circuits
Chapter VII. General and reference measuring methods,
              general
Section 1. General measuring methods
1 Introduction
2 General precautions
    2.1 Protection of devices and measuring
          equipment
    2.2 Accuracy of measurement
    2.3 Definitions
Section 2. Reference measuring methods
1 Guide for reference measuring methods
2 Thermal conditions for electrical reference
    measuring methods
    2.1 Introduction
    2.2 Conditions in case of negligible power
          dissipation in the device
    2.3 Conditions in case of significant power
          dissipation in the device
Chapter VIII. Acceptance and reliability of
              discrete devices
Section 1. General
Section 2. General principles (Under consideration)
Section 3. Electrical endurance tests
1 Purpose and presentation
2 General requirements
    2.1 Conditions for endurance tests
    2.2 Duration of test
    2.3 Failure-defining characteristics and
          measurements
    2.4 Failure criteria
    2.5 Precautions
3 Specific requirements. General
    3.1 List of endurance tests
    3.2 Conditions for endurance tests
    3.3 Failure-defining characteristics and failure
          criteria for acceptance after endurance tests
    3.4 Failure-defining characteristics and failure
          criteria for reliability tests (under
          consideration)
    3.5 Procedure in case of a testing error
    3.6 Information to be given in Table I and Table II
Chapter IX. Electrostatic-sensitive devices
1 Handling precautions
2 Label and symbol
3 Test methods for electronic devices sensitive to
    voltage pulses of short duration

General recommendations for discrete semiconductor devices, including integrated circuits.