BS EN 60679-1:2017
Current
Current
The latest, up-to-date edition.
Piezoelectric, dielectric and electrostatic oscillators of assessed quality Generic specification
Available format(s)
Hardcopy , PDF
Language(s)
English
Published date
13-12-2017
Publisher
Important note : Users cannot be edited or removed once added to your Multi user PDF.| Committee |
W/-
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| DevelopmentNote |
Supersedes 00/203770 DC and 96/204889 DC Supersedes BS EN 169000 Supersedes 01/208129 DC. (05/2004) Supersedes 05/30132097 DC. (07/2007) Supersedes 14/30282293 DC. (12/2017)
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| DocumentType |
Standard
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| Pages |
42
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| PublisherName |
British Standards Institution
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| Status |
Current
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| Supersedes |
| Standards | Relationship |
| IEC 61291-2:2007 | Identical |
| EN 60679-1:2017 | Identical |
| IEC 60679-1:2017 | Identical |
| DIN EN 60679-1:2013-08 (Draft) | Identical |
| NBN EN 60679-1 : 2007 | Identical |
| I.S. EN 60679-1:2007 | Identical |
| SN EN 60679-1 : 1998 AMD 2 2003 | Identical |
| NF EN 60679-1 : 2013 | Identical |
| EN 61291-2:2007 | Identical |
| IEC 62884-1:2017 | Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 1: Basic methods for the measurement |
| EN 60469:2013 | Transitions, pulses and related waveforms - Terms, definitions and algorithms |
| EN ISO 80000-1:2013 | Quantities and units - Part 1: General (ISO 80000-1:2009 + Cor 1:2011) |
| ATIS 0900101 : 2013 | SYNCHRONIZATION INTERFACE STANDARD |
| IEC 60068-2-27:2008 | Environmental testing - Part 2-27: Tests - Test Ea and guidance: Shock |
| EN 61340-5-1:2016/AC:2017-05 | ELECTROSTATICS - PART 5-1: PROTECTION OF ELECTRONIC DEVICES FROM ELECTROSTATIC PHENOMENA - GENERAL REQUIREMENTS (IEC 61340-5-1:2016/COR1:2017) |
| EN 62884-1:2017 | Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 1: Basic methods for the measurement |
| IEC 61837-1:2012 | Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 1: Plastic moulded enclosure outlines |
| IEC 61340-5-1:2016 | Electrostatics - Part 5-1: Protection of electronic devices from electrostatic phenomena - General requirements |
| IEC 60679-4:1997 | Quartz crystal controlled oscillators of assessed quality - Part 4: Sectional Specification - Capability approval |
| IEC 60469:2013 | Transitions, pulses and related waveforms - Terms, definitions and algorithms |
| IEC TR 61000-4-1:2016 | Electromagnetic compatibility (EMC) - Part 4-1: Testing and measurement techniques - Overview of IEC 61000-4 series |
| IEC 61837-2:2011+AMD1:2014 CSV | Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part2: Ceramic enclosures |
| IEC 60679-5:1998 | Quartz crystal controlled oscillators of assessed quality - Part 5: Sectional specification - Qualification approval |
| IEC 61837-4:2015 | Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 4: Hybrid enclosure outlines |
| IEC 60749-27:2006+AMD1:2012 CSV | Semiconductor devices - Mechanical and climatic test methods - Part27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM) |
| IEC 61019-1:2004 | Surface acoustic wave (SAW) resonators - Part 1: Generic specification |
| IEC 60068-2-64:2008 | Environmental testing - Part 2-64: Tests - Test Fh: Vibration, broadband random and guidance |
| ATIS 0900105.03 : 2013 | SYNCHRONOUS OPTICAL NETWORK - (SONET) - JITTER NETWORK INTERFACES |
| GR 253 CORE : ISSUE 5 | SYNCHRONOUS OPTICAL NETWORK (SONET) TRANSPORT SYSTEMS: COMMON GENERIC CRITERIA |
| IEC 61837-3:2015 | Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 3: Metal enclosures |
| EN 60749-27:2006/A1:2012 | SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 27: ELECTROSTATIC DISCHARGE (ESD) SENSITIVITY TESTING - MACHINE MODEL (MM) |
| IEC 61019-2:2005 | Surface acoustic wave (SAW) resonators - Part 2: Guide to the use |
| IEC 60749-26:2013 | Semiconductor devices - Mechanical and climatic test methods - Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM) |
| IEC 60068-2-17:1994 | Basic environmental testing procedures - Part 2-17: Tests - Test Q: Sealing |
| ISO 80000-1:2009 | Quantities and units — Part 1: General |
| IEC 60050-561:2014 | International Electrotechnical Vocabulary (IEV) - Part 561: Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection |
| IEC 60122-1:2002 | Quartz crystal units of assessed quality - Part 1: Generic specification |
| EN 60749-26:2014 | Semiconductor devices - Mechanical and climatic test methods - Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM) |
| IEC 60748-2:1997 | Semiconductor devices - Integrated circuits - Part 2: Digital integrated circuits |
| IEC 60679-3:2012 | Quartz crystal controlled oscillators of assessed quality - Part 3: Standard outlines and lead connections |
| IEC 60679-2:1981 | Quartz crystal controlled oscillators - Part 2: Guide to the use of quartz crystal controlled oscillators |
| MIL-PRF-55310 Revision E:2006 | OSCILLATOR, CRYSTAL CONTROLLED, GENERAL SPECIFICATION FOR |
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