BS EN 61747-5:1998
Current
The latest, up-to-date edition.
Liquid crystal and solid-state display devices Environmental, endurance and mechanical test methods
Hardcopy , PDF
English
15-11-1998
1 General
1.1 Scope and object
1.2 Normative references
1.3 Terms, definitions and letter symbols
1.4 Standard atmospheric conditions
1.5 Visual examination and verification of dimensions
1.6 Electrical and optical measurement
1.7 Electrical operating conditions
2 Mechanical test methods
2.1 Robustness of terminations
2.2 Soldering
2.3 Vibration (sinusoidal)
2.4 Shock
2.5 Acceleration, steady state
2.6 Bond strength test
3 Environmental and endurance test methods
3.1 Change of temperature
3.2 Storage (at high temperature)
3.3 Storage (at low temperature)
3.4 Low air pressure
3.5 Damp heat, steady state
3.6 Damp heat, cyclic (12 + 12-hour cycle)
3.7 Composite temperature/humidity cyclic test
3.8 Light exposure
3.9 ESD Test
4 Miscellaneous test methods
4.1 Permanence of marking
4.2 Scratch test (of face plate)
4.3 Life test
5 Visual inspection of monochrome matrix liquid crystal
display modules (Excluding all active matrix liquid
crystal display modules)
5.1 General
5.2 Visual inspection of displays
6 Visual inspection of monochrome liquid crystal display
cells (excluding all active matrix liquid crystal
display modules)
6.1 General
6.2 Visual inspection of displays
6.3 Seal inspections (see figure 13)
6.4 Visual inspection of contact pad area (see figure
14)
6.5 Visual inspection for chipped material at the
borders and edges of the support plates of cells
Annex A Cross references index
Annex ZA Normative references to international publications
with their corresponding European publications
Establishes uniform preferred test methods, including visual, with preferred values for stress levels for judging the environmental properties of liquid crystal display devices.
Committee |
NFE/34
|
DevelopmentNote |
Supersedes 93/203879 DC. Also numbered as IEC 61747-5. (09/2005)
|
DocumentType |
Standard
|
Pages |
40
|
PublisherName |
British Standards Institution
|
Status |
Current
|
SupersededBy |
Standards | Relationship |
NF EN 61747-5 : 1999 | Identical |
SN EN 61747-5 : 1998 | Identical |
NBN EN 61747-5 : 1999 | Identical |
I.S. EN 61747-5:1999 | Identical |
DIN EN 61747-5:1999-02 | Identical |
EN 61747-5:1998 | Identical |
HD 323.2.5 : 200S1 | BASIC ENVIRONMENTAL TESTING PROCEDURES - TESTS - TEST SA - SIMULATED SOLAR RADIATION AT GROUND LEVEL |
IEC 60068-2-5:2010 | Environmental testing - Part 2-5: Tests - Test Sa: Simulated solar radiation at ground level and guidance for solar radiation testing |
HD 323.2.20 : 200S3 | BASIC ENVIRONMENTAL TESTING PROCEDURES - TESTS - TEST T - SOLDERING |
IEC 60068-1:2013 | Environmental testing - Part 1: General and guidance |
IEC 60068-2-27:2008 | Environmental testing - Part 2-27: Tests - Test Ea and guidance: Shock |
HD 323.2.13 : 200S1 | BASIC ENVIRONMENTAL TESTING PROCEDURES - TESTS - TEST M: LOW AIR PRESSURE |
IEC 60068-2-20:2008 | Environmental testing - Part 2-20: Tests - Test T: Test methods for solderability and resistance to soldering heat of devices with leads |
EN 60068-2-1:2007 | Environmental testing - Part 2-1: Tests - Test A: Cold |
EN 60068-2-2:2007 | Environmental testing - Part 2-2: Tests - Test B: Dry heat |
IEC 60068-2-21:2006 | Environmental testing - Part 2-21: Tests - Test U: Robustness of terminations and integral mounting devices |
IEC 60068-2-13:1983 | Basic environmental testing procedures - Part 2-13: Tests - Test M: Low air pressure |
EN 60068-1:2014 | Environmental testing - Part 1: General and guidance |
HD 323.2.14 : 200S2 | BASIC ENVIRONMENTAL TESTING PROCEDURES - TESTS - TEST N: OF TEMPERATURE |
EN 60068-2-7:1993 | Environmental testing - Part 2: Tests - Test Ga: Acceleration, steady state |
IEC 60747-5:1992 | Semiconductor devices - Discrete devices and integrated circuits -Part 5: Optoelectronic devices |
HD 323.2.30 : 200S3 | BASIC ENVIRONMENTAL TESTING PROCEDURES - PART 2: TESTS - TEST DB AND GUIDANCE: DAMP HEAT, CYCLIC (12 + 12-HOUR CYCLE) |
EN 60068-2-27:2009 | Environmental testing - Part 2-27: Tests - Test Ea and guidance: Shock |
HD 323.2.3 : 200S2 | BASIC ENVIRONMENTAL TESTING PROCEDURES - TESTS - TEST CA - DAMP HEAT, STEADY STATE |
IEC 60068-2-3:1969 | Basic environmental testing procedures - Part 2-3: Tests - Test Ca: Damp heat, steady state |
EN 60068-2-21:2006 | Environmental testing - Part 2-21: Tests - Test U: Robustness of terminations and integral mounting devices |
IEC 60068-2-2:2007 | Environmental testing - Part 2-2: Tests - Test B: Dry heat |
IEC 60747-1:2006+AMD1:2010 CSV | Semiconductor devices - Part 1: General |
IEC 60749:1996+AMD1:2000+AMD2:2001 CSV | Semiconductor devices - Mechanical and climatic test methods |
EN 60068-2-6:2008 | Environmental testing - Part 2-6: Tests - Test Fc: Vibration (sinusoidal) |
IEC 60748-1:2002 | Semiconductor devices - Integrated circuits - Part 1: General |
IEC 60068-2-1:2007 | Environmental testing - Part 2-1: Tests - Test A: Cold |
IEC 60068-2-14:2009 | Environmental testing - Part 2-14: Tests - Test N: Change of temperature |
EN 60068-2-45:1992/A1:1993 | Environmental testing - Part 2: Tests - Test Xa and guidance: Immersion in cleaning solvents |
HD 323.2.38 : 200S1 | BASIC ENVIRONMENTAL TESTING PROCEDURES - TESTS - TESTS Z/AD: COMPOSITE TEMPERATURE/HUMIDITY CYCLIC TEST |
IEC 60068-2-30:2005 | Environmental testing - Part 2-30: Tests - Test Db: Damp heat, cyclic (12 h + 12 h cycle) |
Access your standards online with a subscription
Features
-
Simple online access to standards, technical information and regulations.
-
Critical updates of standards and customisable alerts and notifications.
-
Multi-user online standards collection: secure, flexible and cost effective.