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BS EN 61747-5:1998

Current

Current

The latest, up-to-date edition.

Liquid crystal and solid-state display devices Environmental, endurance and mechanical test methods

Available format(s)

Hardcopy , PDF

Language(s)

English

Published date

15-11-1998

€271.12
Excluding VAT

1 General
    1.1 Scope and object
    1.2 Normative references
    1.3 Terms, definitions and letter symbols
    1.4 Standard atmospheric conditions
    1.5 Visual examination and verification of dimensions
    1.6 Electrical and optical measurement
    1.7 Electrical operating conditions
2 Mechanical test methods
    2.1 Robustness of terminations
    2.2 Soldering
    2.3 Vibration (sinusoidal)
    2.4 Shock
    2.5 Acceleration, steady state
    2.6 Bond strength test
3 Environmental and endurance test methods
    3.1 Change of temperature
    3.2 Storage (at high temperature)
    3.3 Storage (at low temperature)
    3.4 Low air pressure
    3.5 Damp heat, steady state
    3.6 Damp heat, cyclic (12 + 12-hour cycle)
    3.7 Composite temperature/humidity cyclic test
    3.8 Light exposure
    3.9 ESD Test
4 Miscellaneous test methods
    4.1 Permanence of marking
    4.2 Scratch test (of face plate)
    4.3 Life test
5 Visual inspection of monochrome matrix liquid crystal
    display modules (Excluding all active matrix liquid
    crystal display modules)
    5.1 General
    5.2 Visual inspection of displays
6 Visual inspection of monochrome liquid crystal display
    cells (excluding all active matrix liquid crystal
    display modules)
    6.1 General
    6.2 Visual inspection of displays
    6.3 Seal inspections (see figure 13)
    6.4 Visual inspection of contact pad area (see figure
          14)
    6.5 Visual inspection for chipped material at the
          borders and edges of the support plates of cells
Annex A Cross references index
Annex ZA Normative references to international publications
          with their corresponding European publications

Establishes uniform preferred test methods, including visual, with preferred values for stress levels for judging the environmental properties of liquid crystal display devices.

Committee
NFE/34
DevelopmentNote
Supersedes 93/203879 DC. Also numbered as IEC 61747-5. (09/2005)
DocumentType
Standard
Pages
40
PublisherName
British Standards Institution
Status
Current
SupersededBy

Standards Relationship
NF EN 61747-5 : 1999 Identical
SN EN 61747-5 : 1998 Identical
NBN EN 61747-5 : 1999 Identical
I.S. EN 61747-5:1999 Identical
DIN EN 61747-5:1999-02 Identical
EN 61747-5:1998 Identical

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HD 323.2.20 : 200S3 BASIC ENVIRONMENTAL TESTING PROCEDURES - TESTS - TEST T - SOLDERING
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IEC 60068-2-27:2008 Environmental testing - Part 2-27: Tests - Test Ea and guidance: Shock
HD 323.2.13 : 200S1 BASIC ENVIRONMENTAL TESTING PROCEDURES - TESTS - TEST M: LOW AIR PRESSURE
IEC 60068-2-20:2008 Environmental testing - Part 2-20: Tests - Test T: Test methods for solderability and resistance to soldering heat of devices with leads
EN 60068-2-1:2007 Environmental testing - Part 2-1: Tests - Test A: Cold
EN 60068-2-2:2007 Environmental testing - Part 2-2: Tests - Test B: Dry heat
IEC 60068-2-21:2006 Environmental testing - Part 2-21: Tests - Test U: Robustness of terminations and integral mounting devices
IEC 60068-2-13:1983 Basic environmental testing procedures - Part 2-13: Tests - Test M: Low air pressure
EN 60068-1:2014 Environmental testing - Part 1: General and guidance
HD 323.2.14 : 200S2 BASIC ENVIRONMENTAL TESTING PROCEDURES - TESTS - TEST N: OF TEMPERATURE
EN 60068-2-7:1993 Environmental testing - Part 2: Tests - Test Ga: Acceleration, steady state
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HD 323.2.30 : 200S3 BASIC ENVIRONMENTAL TESTING PROCEDURES - PART 2: TESTS - TEST DB AND GUIDANCE: DAMP HEAT, CYCLIC (12 + 12-HOUR CYCLE)
EN 60068-2-27:2009 Environmental testing - Part 2-27: Tests - Test Ea and guidance: Shock
HD 323.2.3 : 200S2 BASIC ENVIRONMENTAL TESTING PROCEDURES - TESTS - TEST CA - DAMP HEAT, STEADY STATE
IEC 60068-2-3:1969 Basic environmental testing procedures - Part 2-3: Tests - Test Ca: Damp heat, steady state
EN 60068-2-21:2006 Environmental testing - Part 2-21: Tests - Test U: Robustness of terminations and integral mounting devices
IEC 60068-2-2:2007 Environmental testing - Part 2-2: Tests - Test B: Dry heat
IEC 60747-1:2006+AMD1:2010 CSV Semiconductor devices - Part 1: General
IEC 60749:1996+AMD1:2000+AMD2:2001 CSV Semiconductor devices - Mechanical and climatic test methods
EN 60068-2-6:2008 Environmental testing - Part 2-6: Tests - Test Fc: Vibration (sinusoidal)
IEC 60748-1:2002 Semiconductor devices - Integrated circuits - Part 1: General
IEC 60068-2-1:2007 Environmental testing - Part 2-1: Tests - Test A: Cold
IEC 60068-2-14:2009 Environmental testing - Part 2-14: Tests - Test N: Change of temperature
EN 60068-2-45:1992/A1:1993 Environmental testing - Part 2: Tests - Test Xa and guidance: Immersion in cleaning solvents
HD 323.2.38 : 200S1 BASIC ENVIRONMENTAL TESTING PROCEDURES - TESTS - TESTS Z/AD: COMPOSITE TEMPERATURE/HUMIDITY CYCLIC TEST
IEC 60068-2-30:2005 Environmental testing - Part 2-30: Tests - Test Db: Damp heat, cyclic (12 h + 12 h cycle)

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