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EN 60679-1:2017

Current

Current

The latest, up-to-date edition.

Piezoelectric, dielectric and electrostatic oscillators of assessed quality - Part 1: Generic specification

Published date

17-11-2017

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FOREWORD
1 Scope
2 Normative references
3 Terms, definitions and general information
4 Quality assessment procedures
Annex A (normative) - Load circuit for logic drive
Annex B (normative) - Latch-up test
Annex C (normative) - Electrostatic discharge
        sensitivity classification
Annex D (normative) - Digital interfaced crystal
        Oscillator's function
Bibliography
Annex ZA (normative) - Normative references to
         international publications with their
         corresponding European publications

IEC60679-1:2017(E) specifies general requirements for piezoelectric, dielectric and electrostatic oscillators, including Dielectric Resonator Oscillators (DRO) and oscillators using FBAR (hereinafter referred to as "Oscillator"), of assessed quality using either capability approval or qualification approval procedures.

NOTE Dielectric Resonator Oscillators (DRO) and oscillators using FBAR are under consideration.

This edition includes the following significant technical changes with respect to the previous edition:

a) the title has been changed;

b) additional matters related to oscillator using SAW or MEMS resonator in "Terms, definitions and general information" have been included;

c) measurement methods of IEC60679-1:2007 have been removed (they will be moved to IEC62884 series);

d) the content of Annex A has been extended;

e) a new term and definition DIXO (Digital interfaced Crystal Oscillator) has been added;

f) a new term and definition SSXO (Spread Spectrum Crystal Oscillator) has been added;

g) Annex D has been added.




Committee
CLC/SR 49
DevelopmentNote
Supersedes EN 169000 (05/2001)
DocumentType
Standard
PublisherName
European Committee for Standards - Electrical
Status
Current
Supersedes

IEC 62884-1:2017 Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 1: Basic methods for the measurement
EN 60469:2013 Transitions, pulses and related waveforms - Terms, definitions and algorithms
EN ISO 80000-1:2013 Quantities and units - Part 1: General (ISO 80000-1:2009 + Cor 1:2011)
ATIS 0900101 : 2013 SYNCHRONIZATION INTERFACE STANDARD
IEC 60068-2-27:2008 Environmental testing - Part 2-27: Tests - Test Ea and guidance: Shock
EN 61340-5-1:2016/AC:2017-05 ELECTROSTATICS - PART 5-1: PROTECTION OF ELECTRONIC DEVICES FROM ELECTROSTATIC PHENOMENA - GENERAL REQUIREMENTS (IEC 61340-5-1:2016/COR1:2017)
EN 62884-1:2017 Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 1: Basic methods for the measurement
IEC 61837-1:2012 Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 1: Plastic moulded enclosure outlines
IEC 61340-5-1:2016 Electrostatics - Part 5-1: Protection of electronic devices from electrostatic phenomena - General requirements
IEC 60679-4:1997 Quartz crystal controlled oscillators of assessed quality - Part 4: Sectional Specification - Capability approval
IEC 60469:2013 Transitions, pulses and related waveforms - Terms, definitions and algorithms
IEC TR 61000-4-1:2016 Electromagnetic compatibility (EMC) - Part 4-1: Testing and measurement techniques - Overview of IEC 61000-4 series
IEC 61837-2:2011+AMD1:2014 CSV Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part2: Ceramic enclosures
IEC 60679-5:1998 Quartz crystal controlled oscillators of assessed quality - Part 5: Sectional specification - Qualification approval
IEC 61837-4:2015 Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 4: Hybrid enclosure outlines
IEC 60749-27:2006+AMD1:2012 CSV Semiconductor devices - Mechanical and climatic test methods - Part27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM)
IEC 61019-1:2004 Surface acoustic wave (SAW) resonators - Part 1: Generic specification
IEC 60068-2-64:2008 Environmental testing - Part 2-64: Tests - Test Fh: Vibration, broadband random and guidance
ATIS 0900105.03 : 2013 SYNCHRONOUS OPTICAL NETWORK - (SONET) - JITTER NETWORK INTERFACES
GR 253 CORE : ISSUE 5 SYNCHRONOUS OPTICAL NETWORK (SONET) TRANSPORT SYSTEMS: COMMON GENERIC CRITERIA
IEC 61837-3:2015 Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 3: Metal enclosures
EN 60749-27:2006/A1:2012 SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 27: ELECTROSTATIC DISCHARGE (ESD) SENSITIVITY TESTING - MACHINE MODEL (MM)
IEC 61019-2:2005 Surface acoustic wave (SAW) resonators - Part 2: Guide to the use
IEC 60749-26:2013 Semiconductor devices - Mechanical and climatic test methods - Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM)
IEC 60068-2-17:1994 Basic environmental testing procedures - Part 2-17: Tests - Test Q: Sealing
ISO 80000-1:2009 Quantities and units — Part 1: General
IEC 60050-561:2014 International Electrotechnical Vocabulary (IEV) - Part 561: Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection
IEC 60122-1:2002 Quartz crystal units of assessed quality - Part 1: Generic specification
EN 60749-26:2014 Semiconductor devices - Mechanical and climatic test methods - Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM)
IEC 60748-2:1997 Semiconductor devices - Integrated circuits - Part 2: Digital integrated circuits
IEC 60679-3:2012 Quartz crystal controlled oscillators of assessed quality - Part 3: Standard outlines and lead connections
IEC 60679-2:1981 Quartz crystal controlled oscillators - Part 2: Guide to the use of quartz crystal controlled oscillators
MIL-PRF-55310 Revision E:2006 OSCILLATOR, CRYSTAL CONTROLLED, GENERAL SPECIFICATION FOR

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