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CENELEC
EN 60747-5-2:2001/A1:2002

EN 60747-5-2:2001/A1:2002

Current

Current

The latest, up-to-date edition.

DISCRETE SEMICONDUCTOR DEVICES AND INTEGRATED CIRCUITS - PART 5-2: OPTOELECTRONIC DEVICES - ESSENTIAL RATINGS AND CHARACTERISTICS

Amendment of

EN 60747-5-2:2001

Published date

24-05-2002

Publisher

European Committee for Standards - Electrical

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FOREWORD
1 Scope
2 Normative references
3 Light-emitting diodes (excluding devices for fibre
   optic systems or subsystems)
   3.1 Type
   3.2 Semiconductor material
   3.3 Colour
   3.4 Details of outline and encapsulation
   3.5 Limiting values (absolute maximum system)
   3.6 Electrical characteristics
   3.7 Supplementary information
4 Infrared-emitting diodes (excluding devices for fibre
   optic systems or subsystems)
   4.1 Type
   4.2 Semiconductor material
   4.3 Details of outline and encapsulation
   4.4 Limiting values (absolute maximum system)
   4.5 Electrical characteristics
   4.6 Supplementary information
5 Photodiodes (excluding devices for fibre optic systems or
   subsystems)
   5.1 Type
   5.2 Semiconductor material
   5.3 Details of outline and encapsulation
   5.4 Limiting values (absolute maximum system)
   5.5 Electrical characteristics
   5.6 Supplementary information
6 Phototransistors (excluding devices for fibre optic
   systems or subsystems)
   6.1 Type
   6.2 Semiconductor material
   6.3 Polarity
   6.4 Details of outline and encapsulation
   6.5 Limiting values (absolute maximum system)
   6.6 Electrical characteristics
   6.7 Supplementary information
7 Photocouplers, optocouplers (with output transistor)
   7.1 Type
   7.2 Semiconductor material
   7.3 Polarity of the output resistor
   7.4 Details of outline and encapsulation
   7.5 Limiting values (absolute maximum system)
   7.6 Electrical characteristics
   7.7 Supplementary information
8 Photocouplers (optocouplers) providing protection
   against electrical shock
   8.1 Type
   8.2 Semiconductor material
   8.3 Details of outline and encapsulation
   8.4 Ratings
   8.5 Electrical characteristics
   8.6 Electrical, environmental and/or endurance
        information (supplementary information)
9 Laser diodes
   9.1 Type
   9.2 Semiconductor
   9.3 Details of outline and encapsulation
   9.4 Limiting values (absolute maximum system)
   9.5 Electrical and optical characteristics
   9.6 Supplementary information
Annexes
A (informative) Cross references index
B (normative) Input/output safety test
Figures
Tables

Provides essential ratings and characteristics of several categories or subcategories of optoelectronic devices not intended for use in the area of fibre optic systems or subsystems.

Committee
SR 47E
DevelopmentNote
To be read in conjunction with IEC 60747-1, EN 62007-1 and EN 62007-2 (02/2003)
DocumentType
Standard
PublisherName
European Committee for Standards - Electrical
Status
Current

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IEC 62007-1:2015 Semiconductor optoelectronic devices for fibre optic system applications - Part 1: Specification template for essential ratings and characteristics
HD 214 : 200S2 RECOMMENDED METHOD FOR DETERMINING THE COMPARATIVE TRACKING INDEX OF SOLID INSULATING MATERIALS UNDER MOIST CONDITIONS
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IEC 60216-2:2005 Electrical insulating materials - Thermal endurance properties - Part 2: Determination of thermal endurance properties of electrical insulating materials - Choice of test criteria
EN 60747-5-1:2001/A2:2002 DISCRETE SEMICONDUCTOR DEVICES AND INTEGRATED CIRCUITS - PART 5-1: OPTOELECTRONIC DEVICES - GENERAL
HD 611.1 : 200S1 GUIDE FOR THE DETERMINATION OF THERMAL ENDURANCE PROPERTIES OF ELECTRICAL INSULATING MATERIALS - GENERAL GUIDELINES FOR AGEING PROCEDURES AND EVALUATION OF TEST RESULTS
IEC 60747-5-3:1997+AMD1:2002 CSV Discrete semiconductor devices and integrated circuits - Part 5-3: Optoelectronic devices - Measuring methods
IEC 60306-1:1969 Measurement of photosensitive devices - Part 1: Basic recommendations
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HD 323.2.3 : 200S2 BASIC ENVIRONMENTAL TESTING PROCEDURES - TESTS - TEST CA - DAMP HEAT, STEADY STATE
IEC 60068-2-3:1969 Basic environmental testing procedures - Part 2-3: Tests - Test Ca: Damp heat, steady state
EN 60068-2-17:1994 Environmental testing - Part 2: Tests - Test Q: Sealing
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IEC 60068-2-2:2007 Environmental testing - Part 2-2: Tests - Test B: Dry heat
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IEC 60672-2:1999 Ceramic and glass insulating materials - Part 2: Methods of test
EN 60068-2-6:2008 Environmental testing - Part 2-6: Tests - Test Fc: Vibration (sinusoidal)
IEC 60747-5-1:1997+AMD1:2001+AMD2:2002 CSV Discrete semiconductor devices and integrated circuits - Part 5-1: Optoelectronic devices - General
IEC 60068-2-1:2007 Environmental testing - Part 2-1: Tests - Test A: Cold
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EN 60068-2-30:2005 Environmental testing - Part 2-30: Tests - Test Db: Damp heat, cyclic (12 h + 12 h cycle)
HD 323.2.2 : 200S1 BASIC ENVIRONMENTAL TESTING PROCEDURES - TESTS - TEST B: DRY HEAT
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IEC 60664-1:2007 Insulation coordination for equipment within low-voltage systems - Part 1: Principles, requirements and tests
EN 60068-2-14:2009 Environmental testing - Part 2-14: Tests - Test N: Change of temperature
IEC 60216-1:2013 Electrical insulating materials - Thermal endurance properties - Part 1: Ageing procedures and evaluation of test results
EN 60695-2-2:1994/A1:1995 FIRE HAZARD TESTING - TEST METHODS - NEEDLE-FLAME TEST
IEC 60068-2-30:2005 Environmental testing - Part 2-30: Tests - Test Db: Damp heat, cyclic (12 h + 12 h cycle)

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