EN 62572-3:2016
Current
The latest, up-to-date edition.
Fibre optic active components and devices - Reliability standards - Part 3: Laser modules used for telecommunication
03-06-2016
FOREWORD
INTRODUCTION
1 Scope
2 Normative references
3 Terms, definitions, symbols and
abbreviations
4 Laser reliability and quality assurance
procedure
5 Tests
6 Activities
Annex A (informative) - Guidance on testing
in Table 1 and Table 2
Bibliography
Annex ZA (normative) - Normative references to
international publications with their
corresponding European publications
IEC 62572-3:2014 deals with reliability assessment of laser modules used for telecommunication.The aim of this standard is to establish a standard method of assessing the reliability of laser modules in order to minimize risks and to promote product development and reliability; to establish means by which the distribution of failures with time can be determined. This should enable the determination of equipment failure rates for specified end of life criteria. In addition, guidance is given in IEC TR 62572-2. This second edition cancels and replaces the first edition published in 2011. This second edition constitutes a technical revision in which multiple errors in references have been corrected.Keywords: reliability assessment of laser modules, telecommunication
Committee |
CLC/SR 86C
|
DocumentType |
Standard
|
PublisherName |
European Committee for Standards - Electrical
|
Status |
Current
|
Supersedes |
Standards | Relationship |
I.S. EN 62572-3:2016 | Identical |
BS EN 62572-3:2016 | Identical |
IEC 62572-3:2016 | Identical |
UNE-EN 62572-3:2016 | Identical |
NBN EN 62572-3 : 2016 | Identical |
CEI EN 62572-3 : 2016 | Identical |
DIN EN 62572-3:2017-07 | Identical |
SS-EN 62572-3 : 2016 | Identical |
NEN EN IEC 62572-3 : 2016 | Identical |
SN EN 62572-3:2016 | Identical |
PN EN 62572-3 : 2016 | Identical |
NF EN 62572-3 : 2018 | Identical |
PNE-FprEN 62572-3 | Identical |
EN 61291-2:2016 | Optical amplifiers - Part 2: Single channel applications - Performance specification template |
BS EN 50152-3-2:2016 | Railway applications. Fixed installations. Particular requirements for a.c. switchgear Measurement, control and protection devices for specific use in a.c. traction systems. Current transformers |
BS EN 61291-2:2016 | Optical amplifiers Single channel applications. Performance specification template |
I.S. EN 61291-2:2016 | OPTICAL AMPLIFIERS - PART 2: SINGLE CHANNEL APPLICATIONS - PERFORMANCE SPECIFICATION TEMPLATE |
EN 62149-3:2014 | Fibre optic active components and devices - Performance standards - Part 3: Modulator-integrated laser diode transmitters for 2,5-Gbit/s to 40-Gbit/s fibre optic transmission systems |
BS EN 62149-3:2014 | Fibre optic active components and devices. Performance standards Modulator-integrated laser diode transmitters for 2,5-Gbit/s to 40-Gbit/s fibre optic transmission systems |
IEC 60749-8:2002 | Semiconductor devices - Mechanical and climatic test methods - Part 8: Sealing |
MIL-STD-883 Revision K:2016 | TEST METHOD STANDARD - MICROCIRCUITS |
IEC 60749-25:2003 | Semiconductor devices - Mechanical and climatic test methods - Part 25: Temperature cycling |
EN 60068-2-1:2007 | Environmental testing - Part 2-1: Tests - Test A: Cold |
IEC 60749-11:2002 | Semiconductor devices - Mechanical and climatic test methods - Part 11: Rapid change of temperature - Two-fluid-bath method |
EN 60749-11:2002 | Semiconductor devices - Mechanical and climatic test methods - Part 11: Rapid change of temperature - Two-fluid-bath method |
IEC 60749-26:2013 | Semiconductor devices - Mechanical and climatic test methods - Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM) |
EN 60749-10:2002 | Semiconductor devices - Mechanical and climatic test methods - Part 10: Mechanical shock |
IEC 60747-1:2006+AMD1:2010 CSV | Semiconductor devices - Part 1: General |
EN 60749-8:2003 | Semiconductor devices - Mechanical and climatic test methods - Part 8: Sealing |
IEC 60749-6:2017 | Semiconductor devices - Mechanical and climatic test methods - Part 6: Storage at high temperature |
EN 60749-6:2017 | Semiconductor devices - Mechanical and climatic test methods - Part 6: Storage at high temperature |
EN 60749-26:2014 | Semiconductor devices - Mechanical and climatic test methods - Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM) |
IEC 60068-2-1:2007 | Environmental testing - Part 2-1: Tests - Test A: Cold |
IEC 60749-10:2002 | Semiconductor devices - Mechanical and climatic test methods - Part 10: Mechanical shock |
IEC TR 62572-2:2008 | Fibre optic active components and devices - Reliability standards - Part 2: Laser module degradation |
EN 60749-25:2003 | Semiconductor devices - Mechanical and climatic test methods - Part 25: Temperature cycling |
IEC 60068-2-14:2009 | Environmental testing - Part 2-14: Tests - Test N: Change of temperature |
EN 60068-2-14:2009 | Environmental testing - Part 2-14: Tests - Test N: Change of temperature |
IEC 60749-12:2002 | Semiconductor devices - Mechanical and climatic test methods - Part 12: Vibration, variable frequency |
EN 60749-12:2002 | Semiconductor devices - Mechanical and climatic test methods - Part 12: Vibration, variable frequency |
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