BS EN 60122-1 : 2002
Current
The latest, up-to-date edition.
QUARTZ CRYSTAL UNITS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION
Hardcopy , PDF
English
01-01-2002
1 General
1.1 Scope
1.2 Normative reference
1.3 Order of precedence
2 Terminology and general requirements
2.1 General
2.2 Terms, definitions and classification of
phenomena
2.3 Preferred ratings and characteristics
2.3.1 Temperature ranges in degrees Celsius
(degree C) suitable for ambient operation
2.3.2 Elevated temperature ranges in degrees
Celsius (degree C) suitable for oven
control
2.3.3 Frequency tolerance (1x10[-6])
2.3.4 Circuit conditions
2.3.5 Levels of drive
2.3.6 Drive level dependency
2.3.7 Climatic category
2.3.8 Bump severity
2.3.9 Vibration severity
2.3.10 Shock severity
2.3.11 Leak rate
2.4 Marking
3 Quality assessment procedures
3.1 Primary stage of manufacture
3.2 Structurally similar components
3.3 Subcontracting
3.4 Manufacturer's approval
3.5 Approval procedures
3.5.1 General
3.5.2 Capability approval
3.5.3 Qualification approval
3.6 Procedures for capability approval
3.6.1 General
3.6.2 Eligibility for capability approval
3.6.3 Application for capability approval
3.6.4 Granting of capability approval
3.6.5 Capability manual
3.7 Procedures for qualification approval
3.7.1 General
3.7.2 Eligibility for qualification approval
3.7.3 Application for qualification approval
3.7.4 Granting of qualification approval
3.7.5 Quality conformance inspection
3.8 Test procedures
3.9 Screening requirements
3.10 Rework and repair work
3.10.1 Rework
3.10.2 Repair work
3.11 Certified records of related lots
3.12 Validity of release
3.13 Release for delivery
3.14 Unchecked parameters
4 Test and measurement procedures
4.1 General
4.2 Alternative test methods
4.3 Precision of measurement
4.4 Standard conditions for testing
4.5 Visual inspection
4.5.1 Visual test A
4.5.2 Visual test B
4.5.3 Visual test C
4.6 Dimensioning and gauging procedures
4.6.1 Dimensions, test A
4.6.2 Dimensions, test B
4.7 Electrical test procedures
4.7.1 Frequency and resonance resistance
4.7.2 Drive level dependency
4.7.3 Frequency and resonance resistance as a
function of temperature
4.7.4 Unwanted responses
4.7.5 Shunt capacitance
4.7.6 Load resonance frequency and resistance
4.7.7 Frequency pulling range (f[L1], f[L2])
4.7.8 Motional parameters
4.7.9 Insulation resistance
4.8 Mechanical and environmental test procedures
4.8.1 Robustness of terminations (destructive)
4.8.2 Sealing tests (non-destructive)
4.8.3 Soldering (solderability and resistance to
soldering heat) (destructive)
4.8.4 Rapid change of temperature, two-fluid bath
method (non-destructive)
4.8.5 Rapid change of temperature with prescribed
time of transition (non-destructive)
4.8.6 Bump (destructive)
4.8.7 Vibration (destructive)
4.8.8 Shock (destructive)
4.8.9 Free fall (destructive)
4.8.10 Acceleration, steady state (non-destructive)
4.8.11 Dry heat (non-destructive)
4.8.12 Damp heat, cyclic (destructive)
4.8.13 Cold (non-destructive)
4.8.14 Climatic sequence (destructive)
4.8.15 Damp heat, steady state (destructive)
4.8.16 Immersion in cleaning solvents (non-destructive)
4.9 Endurance test procedures
Annex ZA (normative) Normative references to international
publications with their corresponding European
publications
Bibliography
Figures
Tables
Gives the methods of test and general requirements for quartz crystal units of assessed quality using either capability approval or qualification approval procedures.
Committee |
EPL/49
|
DevelopmentNote |
Supersedes BS EN 168000 (02/2003)
|
DocumentType |
Standard
|
Pages |
46
|
PublisherName |
British Standards Institution
|
Status |
Current
|
Supersedes |
Standards | Relationship |
NF EN 60122-1 : 2003 | Identical |
IEC 60122-1:2002 | Identical |
DIN EN 60122-1:2003-06 | Identical |
SN EN 60122-1 : 2002 | Identical |
NBN EN 60122-1 : 2003 | Identical |
EN 60122-1:2002/A1:2018 | Identical |
HD 323.2.20 : 200S3 | BASIC ENVIRONMENTAL TESTING PROCEDURES - TESTS - TEST T - SOLDERING |
EN 60444-4:1997 | Measurement of quartz crystal unit parameters by zero phase technique in a pi-network - Part 4: Method for the measurement of the load resonance frequency fL, load resonance resistance RL and the calculation of other derived values of quartz crystal units, up to 30 MHz |
IEC 60068-1:2013 | Environmental testing - Part 1: General and guidance |
IEC 60068-2-58:2015+AMD1:2017 CSV | Environmental testing - Part 2-58: Tests - Test Td: Test methods for solderability, resistance to dissolution of metallization and to soldering heat of surface mounting devices (SMD) |
IEC 60068-2-27:2008 | Environmental testing - Part 2-27: Tests - Test Ea and guidance: Shock |
IEC 60068-2-20:2008 | Environmental testing - Part 2-20: Tests - Test T: Test methods for solderability and resistance to soldering heat of devices with leads |
IEC 60122-3:2010 | Quartz crystal units of assessed quality - Part 3: Standard outlines and lead connections |
EN 60068-2-1:2007 | Environmental testing - Part 2-1: Tests - Test A: Cold |
IECQ 001002-3:2005 | IEC QUALITY ASSESSMENT SYSTEM FOR ELECTRONIC COMPONENTS (IECQ) - RULES OF PROCEDURE - PART 3: APPROVAL PROCEDURES |
EN 60068-2-2:2007 | Environmental testing - Part 2-2: Tests - Test B: Dry heat |
IEC 60068-2-21:2006 | Environmental testing - Part 2-21: Tests - Test U: Robustness of terminations and integral mounting devices |
IEC 60068-2-13:1983 | Basic environmental testing procedures - Part 2-13: Tests - Test M: Low air pressure |
EN 60068-1:2014 | Environmental testing - Part 1: General and guidance |
EN 60444-2:1997 | Measurement of quartz crystal unit parameters by zero phase technique in a pi-network - Part 2: Phase offset method for measurement of motional capacitance of quartz crystal units |
IEC 60444-5:1995 | Measurement of quartz crystal units parameters - Part 5: Methods for the determination of equivalent electrical parameters using automatic network analyzer techniques and error correction |
IEC 60444-2:1980 | Measurement of quartz crystal unit parameters by zero phase technique in a pi-network. Part 2: Phase offset method for measurement of motional capacitance of quartz crystal units |
IEC 61178-3:1993 | Quartz crystal units - A specification in the IEC Quality Assessment System for Electronic Components (IECQ) - Part 3: Sectional specification - Qualification approval |
IECQ 001002-2:1998 | IEC QUALITY ASSESSMENT SYSTEM FOR ELECTRONIC COMPONENTS (IECQ) - RULES OF PROCEDURE - PART 2: DOCUMENTATION |
IEC 60444-6:2013 | Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level dependence (DLD) |
EN 60068-2-7:1993 | Environmental testing - Part 2: Tests - Test Ga: Acceleration, steady state |
IEC 60068-2-64:2008 | Environmental testing - Part 2-64: Tests - Test Fh: Vibration, broadband random and guidance |
EN 60444-1:1997/A1:1999 | MEASUREMENT OF QUARTZ CRYSTAL UNIT PARAMETERS BY ZERO PHASE TECHNIQUE IN A PI-NETWORK - PART 1: BASIC METHOD FOR THE MEASUREMENT OF RESONANCE FREQUENCY AND RESONANCE RESISTANCE OF QUARTZ CRYSTAL UNITS BY ZERO PHASE TECHNIQUE IN A PI-NETWORK |
IEC TR 60444-4:1988 | Measurement of quartz crystal unit parameters by zero phase technique in a pi-network. Part 4: Method for the measurement of the load resonance frequency fL, load resonance resistance RL and the calculation of other derived values of quartz crystal units, up to 30 MHz |
IEC 60410:1973 | Sampling plans and procedures for inspection by attributes |
EN 60068-2-27:2009 | Environmental testing - Part 2-27: Tests - Test Ea and guidance: Shock |
HD 323.2.3 : 200S2 | BASIC ENVIRONMENTAL TESTING PROCEDURES - TESTS - TEST CA - DAMP HEAT, STEADY STATE |
EN 60444-6:2013 | Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level dependence (DLD) |
IEC 60068-2-3:1969 | Basic environmental testing procedures - Part 2-3: Tests - Test Ca: Damp heat, steady state |
IEC GUIDE 102:1996 | Electronic components - Specification structures for quality assessment (Qualification approval and capability approval) |
EN 60068-2-17:1994 | Environmental testing - Part 2: Tests - Test Q: Sealing |
IEC 60068-2-17:1994 | Basic environmental testing procedures - Part 2-17: Tests - Test Q: Sealing |
EN 60068-2-21:2006 | Environmental testing - Part 2-21: Tests - Test U: Robustness of terminations and integral mounting devices |
IEC 60068-2-2:2007 | Environmental testing - Part 2-2: Tests - Test B: Dry heat |
IECQ 001002-1:1998 | IEC QUALITY ASSESSMENT SYSTEM FOR ELECTRONIC COMPONENTS (IECQ) - RULES OF PROCEDURE - PART 1: ADMINISTRATION |
EN 60068-2-29:1993 | Environmental testing - Part 2: Tests - Test Eb and guidance: Bump |
EN 60068-2-13:1999 | Environmental testing - Part 2: Tests - Test M: Low air pressure |
EN 60068-2-6:2008 | Environmental testing - Part 2-6: Tests - Test Fc: Vibration (sinusoidal) |
IEC 60050-561:2014 | International Electrotechnical Vocabulary (IEV) - Part 561: Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection |
IEC 60068-2-29:1987 | Environmental testing. Part 2: Tests. Test Eb and guidance: Bump |
IEC 61178-2:1993 | Quartz crystal units - A specification in the IEC Quality Assessment System for Electronic Components (IECQ) - Part 2: Sectional specification - Capability approval |
EN 60444-5:1997 | Measurement of quartz crystal unit parameters - Part 5: Methods for the determination of equivalent electrical parameters using automatic network analyzer techniques and error correction |
IEC 60068-2-1:2007 | Environmental testing - Part 2-1: Tests - Test A: Cold |
EN 60068-2-30:2005 | Environmental testing - Part 2-30: Tests - Test Db: Damp heat, cyclic (12 h + 12 h cycle) |
EN 60068-2-32:1993 | Basic environmental testing procedures - Part 2: Tests - Test Ed: Free fall |
IEC 60068-2-14:2009 | Environmental testing - Part 2-14: Tests - Test N: Change of temperature |
EN 60068-2-45:1992/A1:1993 | Environmental testing - Part 2: Tests - Test Xa and guidance: Immersion in cleaning solvents |
EN 60122-3:2010 | Quartz crystal units of assessed quality - Part 3: Standard outlines and lead connections |
EN 60068-2-14:2009 | Environmental testing - Part 2-14: Tests - Test N: Change of temperature |
IEC 60068-2-30:2005 | Environmental testing - Part 2-30: Tests - Test Db: Damp heat, cyclic (12 h + 12 h cycle) |
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